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    • 10. 发明授权
    • Method of cross-mapping integrated circuit design formats
    • 交叉映射集成电路设计格式的方法
    • US06941530B2
    • 2005-09-06
    • US10395476
    • 2003-03-24
    • Hemant JoshiDavid A. ThomasJohn BachRand B. Carawan
    • Hemant JoshiDavid A. ThomasJohn BachRand B. Carawan
    • G01R31/317G06F17/50
    • G01R31/31707G01R31/31718G06F17/5081
    • A method of cross-mapping integrated circuit (“IC”) elements nets in a IC and/or directing a probe to points on an IC to achieve minimal interference from adjacent structures is disclosed. The method of provides a more streamlined approach than referencing points from a physical layout representation of the IC to the actual IC being tested. The improved correlation between the actual packaged IC and the layout of the IC is accomplished using artificial locator cells. Preferably, the artificial locator cells are generated from mathematical operations of the extracted version of the layout, and they further provide coordinate information for where minimal interference from adjacent structures may be accomplished. Artificial locator cells may be generated from a layout representing a hierarchical representation or alternately each element that is instantiated from a reference library may already have artificial locator cells included.
    • 公开了一种将集成电路(“IC”)元件网络交叉映射到IC中和/或将探针引导到IC上的点以实现来自相邻结构的最小干扰的方法。 该方法提供了一种比从IC的物理布局表示到正在测试的实际IC的点的更简化的方法。 实际封装IC和IC布局之间的改善相关性是使用人工定位器单元完成的。 优选地,人造定位器单元是从所提取的布局版本的数学运算产生的,并且它们还提供了可以实现来自相邻结构的最小干扰的坐标信息。 可以从表示层次表示的布局生成人工定位单元,或者替代地,从参考库中实例化的每个元素可能已经包括人造定位单元。