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1. 发明授权

US4760995A Continuously treating line for steel bands having a heating furnace by directly flaming 失效
标题翻译：通过直接燃烧连续处理带有加热炉的钢带
公开(公告)号：US4760995A
公开(公告)日：1988-08-02
申请号：US27224
申请日：1987-03-02
申请人： Shuzo Fukuda , Masahiro Abe , Shiro Fukunaka , Michio Nakayama , Shuji Kaneto , Masayuki Yamazaki , Kouichiro Arima
发明人： Shuzo Fukuda , Masahiro Abe , Shiro Fukunaka , Michio Nakayama , Shuji Kaneto , Masayuki Yamazaki , Kouichiro Arima
IPC分类号： C21D9/56
CPC分类号： C21D9/56
摘要： This invention relates to a continuously treating line for a steel band, having a heating furnace by directly flaming. For heating the steel band with causing reduction, the heating furnace of directly flaming system is provided with a plurality of heating burners of reduction system which may form non-equilibrium range of the air and the fuel in a flame, that is, a reduction range, wherein the heating burners are positioned at predetermined arrangement with respect to the steel band and at a certain pitch predetermined in relation with an inner diameter of the burner in a line running direction.The treating line has said heating furnace constructed as mentioned above and a subsequent atmosphere furnace, and said atmosphere furnace may be provided with a sealing chamber having various means for avoiding invasion of the outer air.The line has, in order, a pre-heating furnace, said heating furnace and an indirectly heating furnace, and it may be furnished with intermediate chambers between respective furnaces for preventing the furnace gas from moving, and further may be furnished with an after-burning chamber for perfectly burning a combustion exhaust gas to be supplied to the pre-heating chamber.
摘要翻译： PCT No.PCT / JP86 / 00352 Sec。 371日期1987年3月2日 102（e）日期1987年3月2日PCT申请日1986年7月10日PCT公布。公开号WO87 / 00555 日本1987年1月29日。本发明涉及一种钢带的连续处理线，其具有通过直接燃烧的加热炉。为了减少钢带的加热，直接燃烧系统的加热炉具有多个可在火焰中形成空气和燃料的非平衡范围的还原系统的加热燃烧器，即减少范围其中，所述加热燃烧器相对于所述钢带以预定的布置定位，并且以相对于所述燃烧器的内径在线运行方向上预定的一定间距定位。处理管线具有如上所述构造的加热炉和随后的气氛炉，并且所述气氛炉可以设置有具有用于避免外部空气侵入的各种装置的密封室。该线依次具有预热炉，所述加热炉和间接加热炉，并且可以在相应的炉之间设置有用于防止炉气移动的中间室，并且还可以具有后加热炉，燃烧室，用于完全燃烧将被供应到预热室的燃烧废气。

2. 发明授权

US5081857A Cold rolling method using cleaning brushes for at least the back up rolls 失效
标题翻译：使用清洁刷的冷轧方法用于至少后备辊
公开(公告)号：US5081857A
公开(公告)日：1992-01-21
申请号：US488329
申请日：1990-03-05
申请人： Naoki Matsui , Shuichi Iwato , Shuji Kaneto , Takami Kubo , Masayuki Yamazaki , Shigeru Moriyama
发明人： Naoki Matsui , Shuichi Iwato , Shuji Kaneto , Takami Kubo , Masayuki Yamazaki , Shigeru Moriyama
IPC分类号： B21B28/04
CPC分类号： B21B28/04
摘要： A method for cold rolling a strip is wherein brushing roll are provided to both the work rolls and the back up rolls of the temper mill, to remove particles from the surface of the rolls of the mill and suction ducts adjacent to the brushing rolls transport the foreign objects out of the mill system. The sucking speed at the duct is at least 5 m/sec., and preferably 8 m/sec. The length of the bristle is from 15 to 60 mm, the diameter thereof being from 0.15 mm to 1.0 mm, and the material thereof is selected from a group of nylon, propyrene, or a the mixture thereof. The density of the bristle with respect to the peripheral surface area of the brushing rolls for the work roll is from 55 to 85% by area. Abrasive grains with a grain size of #300 to #1200 are incorporated in the brush of said brushing roll which enhance the brushing ability.The material of the abrasive grain includes at least one selected from a group of alumina, titania, and silicate, and the volume percentage of the grain with respect to the volume of the brush is from 5 to 30% in volume.

3. 发明申请

US20090086209A1 Method for marking defect and device therefor 有权
标题翻译：标记缺陷的方法及其设备
公开(公告)号：US20090086209A1
公开(公告)日：2009-04-02
申请号：US12228478
申请日：2008-08-13
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
IPC分类号： G01N21/89 , B05C1/06
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译：缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。

4. 发明授权

US07599052B2 Method for marking defect and device therefor 有权
公开(公告)号：US07599052B2
公开(公告)日：2009-10-06
申请号：US12228478
申请日：2008-08-13
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
IPC分类号： G01N21/00 , A47L1/08
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.

5. 发明授权

US07248366B2 Method for marking defect and device therefor 有权
标题翻译：标记缺陷的方法及其设备
公开(公告)号：US07248366B2
公开(公告)日：2007-07-24
申请号：US09956737
申请日：2001-09-17
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
IPC分类号： G01N21/00 , G01N21/84
CPC分类号： B21C51/005 , G01N21/89
摘要： The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
摘要翻译：缺陷标记方法包括以下步骤：在钢板的连续加工线中安装表面缺陷测试仪以检测表面缺陷和标记装置在缺陷位置施加标记; 使用表面缺陷测试仪检测钢板表面缺陷; 根据这样检测到的缺陷信息确定钢板宽度方向的缺陷名，缺陷等级，缺陷长度和缺陷位置，进一步确定有害缺陷，注意缺陷和无害缺陷方面的缺陷; 对每个有害缺陷和不合理缺陷的缺陷位置进行跟踪; 并将标记应用于缺陷位置。缺陷标记装置包括具有多个光接收部分和信号处理部分的缺陷检查装置和标记装置。

6. 发明授权

US07423744B2 Method for marking defect and device therefor 有权
标题翻译：标记缺陷的方法及其设备
公开(公告)号：US07423744B2
公开(公告)日：2008-09-09
申请号：US11586031
申请日：2006-10-24
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
IPC分类号： G01N21/84 , G01N21/00
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译：缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。

7. 发明申请

US20070052964A1 Method for marking defect and device therefor 有权
标题翻译：标记缺陷的方法及其设备
公开(公告)号：US20070052964A1
公开(公告)日：2007-03-08
申请号：US11586031
申请日：2006-10-24
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
IPC分类号： G01N21/84
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译：缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。

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