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    • 6. 发明授权
    • GaN crystal substrate
    • GaN晶体衬底
    • US07825409B2
    • 2010-11-02
    • US11730649
    • 2007-04-03
    • Shunsuke FujitaHitoshi Kasai
    • Shunsuke FujitaHitoshi Kasai
    • H01L23/58
    • C30B29/406C30B33/00Y10S117/902
    • A GaN crystal substrate has a crystal growth surface on which a crystal is grown, and a rear surface opposite to the crystal growth surface. The crystal growth surface has a roughness Ra(C)of at most 10 nm, and the rear surface has a roughness Ra(R) of at least 0.5 μm and at most 10 μm. A ratio Ra(R)/Ra(C) of the surface roughness Ra(R) to the surface roughness Ra(C) is at least 50. Thus, a GaN crystal substrate of which front and rear surfaces are distinguishable from each other is provided, without impairing the morphology of a semiconductor layer grown on the GaN crystal substrate.
    • GaN晶体衬底具有生长晶体的晶体生长表面和与晶体生长表面相对的后表面。 晶体生长面的粗糙度Ra(℃)为10nm以下,后表面的粗糙度Ra(R)为0.5μm以上且10μm以下。 表面粗糙度Ra(R)与表面粗糙度Ra(C)的比Ra(R)/ Ra(C)至少为50.因此,表面和背面彼此区分的GaN晶体基板是 而不损害在GaN晶体衬底上生长的半导体层的形态。