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1. 发明授权

US07394922B2 Data processing method and data processing apparatus 失效
标题翻译：数据处理方法和数据处理装置
公开(公告)号：US07394922B2
公开(公告)日：2008-07-01
申请号：US11714200
申请日：2007-03-06
申请人： Shouhei Numata , Tarou Takagi
发明人： Shouhei Numata , Tarou Takagi
IPC分类号： G06K9/00
CPC分类号： G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
摘要： A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.
摘要翻译：一种数据处理装置，包括用于显示数据的显示装置; 用于记录大容量位图数据的第一记录装置; 所述第二记录装置记录形成为通过渲染大容量位图数据而获得的二维图像的索引数据; 所述第一数据处理装置用于从所述第一记录装置读取大容量位图数据，并将所述图像处理应用于所述大容量位图数据; 第二数据处理装置，用于从第一记录装置读取大容量位图数据，通过渲染大容量位图数据并将图像数据传送到显示装置，形成二维图像数据; 所述第三数据处理装置用于将所述索引数据发送到所述显示装置; 以及用于将指令发送到第一，第二和第三数据处理设备的输入设备。

2. 发明授权

US07228254B2 Shape model generation method and shape model generation system 有权
公开(公告)号：US07228254B2
公开(公告)日：2007-06-05
申请号：US11206929
申请日：2005-08-19
申请人： Shouhei Numata , Noriyuki Sadaoka , Tarou Takagi
发明人： Shouhei Numata , Noriyuki Sadaoka , Tarou Takagi
IPC分类号： G06F15/00
CPC分类号： G06T7/55 , G06T17/10 , G06T2207/10081 , G06T2207/30164
摘要： A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

3. 发明授权

US06975700B2 X-ray sensor signal processor and X-ray computed tomography system using the same 有权
标题翻译： X射线传感器信号处理器和X射线计算机断层摄影系统使用相同
公开(公告)号：US06975700B2
公开(公告)日：2005-12-13
申请号：US10864641
申请日：2004-06-10
申请人： Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
发明人： Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
IPC分类号： G01N23/04 , A61B6/03
CPC分类号： H04N5/32 , G01N23/046 , G01N2223/419 , G06F19/00 , G06Q50/22 , G06Q50/24 , H04N5/361 , Y10S378/901
摘要： An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.
摘要翻译：一种X射线CT装置，具有用于将X射线照射到待检查对象的X射线照射器，用于检测通过被检查物体的X射线的X射线传感器，X射线传感器信号处理用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据通过X射线传感器信号处理处理的X射线传感器的输出信号重建被检查物体的图像电路。 X射线传感器信号处理电路包括用于从X射线传感器的输出信号中去除DC分量的滤波器，以及积分电路，用于对从其中除去DC分量的X射线传感器的输出信号进行积分，过滤器。

4. 发明授权

US07933441B2 Method of inspection for inner defects of an object and apparatus for same 有权
标题翻译：物体内部缺陷检查方法及其装置
公开(公告)号：US07933441B2
公开(公告)日：2011-04-26
申请号：US11259251
申请日：2005-10-27
申请人： Shouhei Numata , Tarou Takagi , Noriyuki Sadaoka
发明人： Shouhei Numata , Tarou Takagi , Noriyuki Sadaoka
IPC分类号： G06K9/00
CPC分类号： G06T7/0004 , G01N23/046 , G01N2223/419 , G06T7/66 , G06T2207/30164
摘要： It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.
摘要翻译：可以使用诸如X射线CT数据的空间离散数据进行内部缺陷检查，具有更高的精度。一种用于通过使用空间元素来描述物体的空间形状和结构的空间离散数据来检查物体内部缺陷的内部缺陷检查方法包括以下步骤：通过使用内部空间从空间离散数据中提取内部缺陷缺陷提取单元，通过使用相关的元素收集单元收集包含在邻近范围内的元素，其作为相关元素以围绕由内部缺陷提取单元提取的内部缺陷的预定分布设置; 并且通过使用特征量测量单元，基于由相关元件收集单元收集的相关元素来测量诸如内部缺陷的重心的大小和位置的特征量。

5. 发明申请

US20050104904A1 Data processing method and data processing apparatus 失效
公开(公告)号：US20050104904A1
公开(公告)日：2005-05-19
申请号：US10998715
申请日：2004-11-30
申请人： Shouhei Numata , Tarou Takagi
发明人： Shouhei Numata , Tarou Takagi
IPC分类号： G01N23/04 , G06T15/00 , G09G5/00
CPC分类号： G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
摘要： A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.

6. 发明申请

US20070154076A1 Data processing method and data processing apparatus 失效
公开(公告)号：US20070154076A1
公开(公告)日：2007-07-05
申请号：US11714200
申请日：2007-03-06
申请人： Shouhei Numata , Tarou Takagi
发明人： Shouhei Numata , Tarou Takagi
IPC分类号： G06K9/00
CPC分类号： G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
摘要： A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.

7. 发明申请

US20070124107A1 Shape model generation method and shape model generation system 失效
标题翻译：形状模型生成方法和形状模型生成系统
公开(公告)号：US20070124107A1
公开(公告)日：2007-05-31
申请号：US11699355
申请日：2007-01-30
申请人： Shouhei Numata , Noriyuki Sadaoka , Tarou Takagi
发明人： Shouhei Numata , Noriyuki Sadaoka , Tarou Takagi
IPC分类号： G01B7/28
CPC分类号： G06T7/55 , G06T17/10 , G06T2207/10081 , G06T2207/30164
摘要： A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.
摘要翻译：一种形状模型生成方法或系统，用于从诸如X射线CT数据的形状描述数据生成形状模型，所述形状描述数据包括通过虚拟探针测量单元的过程，使得被定义为虚拟空间中具有有限扩展的区域的虚拟探针所述形状描述数据顺序地扫描由探测路径设置单元顺序设置的多个探测路径，测量形状描述数据，从而获取针对每个探测路径的虚拟探针的虚拟空间中的位置所特有的特征值，以及所述探测路径设定单元使用为所述探测路径获得的特征值来生成新的探测路径，由此顺序地设定所述多个探测路径。

8. 发明授权

US07203352B2 Data processing method and data processing apparatus 失效
标题翻译：数据处理方法和数据处理装置
公开(公告)号：US07203352B2
公开(公告)日：2007-04-10
申请号：US11525843
申请日：2006-09-25
申请人： Shouhei Numata , Tarou Takagi
发明人： Shouhei Numata , Tarou Takagi
IPC分类号： G06K9/00
CPC分类号： G06T3/00 , G01N23/04 , G06F3/1415 , G06T15/00 , G09G5/39 , G09G2340/0407 , Y10S378/901
摘要： A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.
摘要翻译：一种数据处理装置，包括用于显示数据的显示装置; 用于记录大容量位图数据的第一记录装置; 所述第二记录装置记录形成为通过渲染大容量位图数据而获得的二维图像的索引数据; 所述第一数据处理装置用于从所述第一记录装置读取大容量位图数据，并将所述图像处理应用于所述大容量位图数据; 第二数据处理装置，用于从第一记录装置读取大容量位图数据，通过渲染大容量位图数据并将图像数据传送到显示装置，形成二维图像数据; 所述第三数据处理装置用于将所述索引数据发送到所述显示装置; 以及用于将指令发送到第一，第二和第三数据处理设备的输入设备。

9. 发明授权

US07113563B2 X-ray sensor signal processor and X-ray computed tomography system using the same 有权
标题翻译： X射线传感器信号处理器和X射线计算机断层摄影系统使用相同
公开(公告)号：US07113563B2
公开(公告)日：2006-09-26
申请号：US11250484
申请日：2005-10-17
申请人： Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
发明人： Hiroshi Kamimura , Shigeru Izumi , Hiroshi Kitaguchi , Atsushi Yamagoshi , Katsutoshi Satoh , Noriyuki Sadaoka , Tarou Takagi , Kouji Kuwabara , Shouhei Numata
IPC分类号： A61B6/03
CPC分类号： H04N5/32 , G01N23/046 , G01N2223/419 , G06F19/00 , G06Q50/22 , G06Q50/24 , H04N5/361 , Y10S378/901
摘要： An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.
摘要翻译：一种X射线CT装置，其具有用于将X射线照射到待检查对象的X射线照射器，用于检测穿过被检查物体的X射线的X射线传感器，X射线传感器信号处理用于处理来自X射线传感器的输出信号的电路，以及CT控制装置，用于根据通过X射线传感器信号处理处理的X射线传感器的输出信号重建被检查物体的图像电路。 X射线传感器信号处理电路从X射线传感器的输出信号中除去DC分量，并对从其中除去直流分量的X射线传感器的输出信号进行积分。

10. 发明申请

US20060093082A1 Method of inspection for inner defects of an object and apparatus for same 有权
标题翻译：物体内部缺陷检查方法及其装置
公开(公告)号：US20060093082A1
公开(公告)日：2006-05-04
申请号：US11259251
申请日：2005-10-27
申请人： Shouhei Numata , Tarou Takagi , Noriyuki Sadaoka
发明人： Shouhei Numata , Tarou Takagi , Noriyuki Sadaoka
IPC分类号： G01N23/00 , G06K9/00
CPC分类号： G06T7/0004 , G01N23/046 , G01N2223/419 , G06T7/66 , G06T2207/30164
摘要： It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.
摘要翻译：可以使用诸如X射线CT数据的空间离散数据进行内部缺陷检查，具有更高的精度。一种用于通过使用空间元素来描述物体的空间形状和结构的空间离散数据来检查物体内部缺陷的内部缺陷检查方法包括以下步骤：通过使用内部空间从空间离散数据中提取内部缺陷缺陷提取单元，通过使用相关的元素收集单元收集包含在邻近范围内的元素，其作为相关元素以围绕由内部缺陷提取单元提取的内部缺陷的预定分布设置; 并且通过使用特征量测量单元，基于由相关元件收集单元收集的相关元素来测量诸如内部缺陷的重心的大小和位置的特征量。

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