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    • 1. 发明授权
    • Scanning exposure method
    • 扫描曝光方法
    • US06277533B1
    • 2001-08-21
    • US09599493
    • 2000-06-22
    • Shinji WakamotoYuji ImaiKazuaki Suzuki
    • Shinji WakamotoYuji ImaiKazuaki Suzuki
    • G03F900
    • G03F7/70691G03F7/70358G03F9/7003G03F9/7026G03F9/7088
    • In exposure by a scanning exposure system, when the pattern of a reticle is exposed onto shot areas on a wafer while reading ahead to detect the focus positions at read-ahead regions before an exposure region 16, 116 with respect to the scanning direction, (1) for each of shot areas S10, S1-S4, S5, S23, S28, S29-S32 on the peripheral region of the wafer 15, the exposure is performed by scanning the wafer 15 so that a slit-like exposure region 16 moves relatively from the inside to the outside of the wafer 15; or, (2) when the absolute value of the difference between the focus position at the read-ahead region 135 and the focus position of an imaging plane 139 in the exposure region exceeds an allowable value, the height of the wafer 15 is fixed at the height set until then while ignoring the read-ahead data.
    • 在通过扫描曝光系统进行曝光时,当在向前扫描的情况下将掩模版的图案暴露在晶片上的拍摄区域上以在曝光区域16,116之前的预读区域相对于扫描方向检测对焦位置时, 1),晶片15的周边区域的拍摄区域S10,S1-S4,S5,S23,S28,S29-S32中的每一个,通过扫描晶片15进行曝光,使得狭缝状曝光区域16移动 相对地从晶片15的内部到外部; 或者,(2)当曝光区域中的预读区域135的焦点位置和成像面139的焦点位置之间的差的绝对值超过允许值时,晶片15的高度被固定在 高度设置到此为止,同时忽略预读数据。
    • 2. 发明授权
    • Scanning exposure method
    • 扫描曝光方法
    • US6118515A
    • 2000-09-12
    • US647325
    • 1996-05-09
    • Shinji WakamotoYuji ImaiKazuaki Suzuki
    • Shinji WakamotoYuji ImaiKazuaki Suzuki
    • G03F7/20G03F7/207G03F9/00G03B27/42
    • G03F7/70691G03F7/70358G03F9/7003G03F9/7026G03F9/7088
    • In exposure by a scanning exposure system, when the pattern of a reticle is exposed onto shot areas on a wafer while reading ahead to detect the focus positions at read-ahead regions before an exposure region 16, 116 with respect to the scanning direction, (1) for each of shot areas S10, S1-S4, S5, S23, S28, S29-S32 on the peripheral region of the wafer 15, the exposure is performed by scanning the wafer 15 so that a slit-like exposure region 16 moves relatively from the inside to the outside of the wafer 15; or, (2) when the absolute value of the difference between the focus position at the read-ahead region 135 and the focus position of an imaging plane 139 in the exposure region exceeds an allowable value, the height of the wafer 15 is fixed at the height set until then while ignoring the read-ahead data.
    • 在通过扫描曝光系统进行曝光时,当在向前扫描的情况下将掩模版的图案暴露在晶片上的拍摄区域上以在曝光区域16,116之前的预读区域相对于扫描方向检测对焦位置时, 1),晶片15的周边区域的拍摄区域S10,S1-S4,S5,S23,S28,S29-S32中的每一个,通过扫描晶片15进行曝光,使得狭缝状曝光区域16移动 相对地从晶片15的内部到外部; 或者,(2)当曝光区域中的预读区域135的焦点位置和成像面139的焦点位置之间的差的绝对值超过允许值时,晶片15的高度被固定在 高度设置到此为止,同时忽略预读数据。
    • 9. 发明申请
    • Method and system for storing goods trace information
    • 货物追踪信息存储方法和系统
    • US20060080190A1
    • 2006-04-13
    • US11237861
    • 2005-09-29
    • Isao FurukawaShoichi NakagamiTakashi YanagitaHirohisa ShimonagaJunichi MatsudaKazuaki Suzuki
    • Isao FurukawaShoichi NakagamiTakashi YanagitaHirohisa ShimonagaJunichi MatsudaKazuaki Suzuki
    • G06Q99/00
    • G06Q10/08G06Q10/087
    • The present invention provides a goods trace information storing method comprising the steps of: acquiring identification information from an RFID (Radio Frequency Identifier) tag in each distribution level by an identification information read mechanism, and acquiring physical property information of goods, where the RFID tag is attached, by a physical quantity measurement mechanism; a comparison determination mechanism's comparing the physical property information with predetermined threshold information and outputting determination information comprising information for indicating whether or not the physical property information is out of a range of the threshold information; and a registration mechanism's making the acquired identification information, physical property information, and determination information correspond to information for identifying the information group, including information for specifying an acquisition time and an acquired distribution level, and storing them in a memory mechanism.
    • 本发明提供了一种货物追踪信息存储方法,其特征在于包括以下步骤:通过识别信息读取机构从每个分发级别的RFID(射频标识符)标签获取识别信息,并且获取货物的物理属性信息,其中RFID标签 通过物理量测量机制; 比较确定机构将物理属性信息与预定阈值信息进行比较,并输出包括用于指示物理属性信息是否在阈值信息的范围之外的信息的确定信息; 以及登记机构使获取的识别信息,物理属性信息和确定信息对应于用于识别信息组的信息,包括用于指定获取时间和获取的分配级别的信息,并将其存储在存储机构中。