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    • 1. 发明授权
    • Analysis method and apparatus
    • 分析方法和装置
    • US08560667B2
    • 2013-10-15
    • US11739946
    • 2007-04-25
    • Shinji KikuchiKen YokoyamaAkira TakeyamaKenichi ShimazakiTakamitsu MaedaKoji IshibashiSeiya ShindoKoutarou Tsuro
    • Shinji KikuchiKen YokoyamaAkira TakeyamaKenichi ShimazakiTakamitsu MaedaKoji IshibashiSeiya ShindoKoutarou Tsuro
    • G06F15/173
    • H04L43/0817G06F11/3419G06F11/3423G06F11/3447G06F2201/86H04L43/0852
    • An analysis method for carrying out an analysis for responses of a computer system including a plurality of servers, includes: obtaining data concerning a CPU utilization ratio of each of the plurality of servers from the computer system, and storing the data concerning the CPU utilization ratio into a CPU utilization ratio storage; obtaining processing history data generated in the computer system, generating data of a request frequency by users of the computer system, and storing the processing history data into a request frequency data storage; and estimating an average delay time in each server by using the CPU utilization ratio of each server, which is stored in the CPU utilization ratio storage, and the request frequency stored in the request frequency data storage, and storing the estimated average delay time into a server delay time storage. By carrying out such a processing, the analysis can be carried out without changing the computer system to be analyzed and any additional cost.
    • 一种用于对包括多个服务器的计算机系统的响应进行分析的分析方法包括:从计算机系统获取与多个服务器中的每一个的CPU利用率有关的数据,并存储与CPU利用率有关的数据 进入CPU利用率存储; 获取在所述计算机系统中生成的处理历史数据,生成所述计算机系统的用户的请求频率的数据,以及将所述处理历史数据存储到请求频率数据存储器中; 以及通过使用存储在CPU利用率存储器中的每个服务器的CPU利用率和存储在请求频率数据存储器中的请求频率来估计每个服务器中的平均延迟时间,并将估计的平均延迟时间存储到 服务器延迟时间存储。 通过进行这样的处理,可以在不改变要分析的计算机系统和任何附加成本的情况下进行分析。
    • 2. 发明申请
    • ANALYSIS METHOD AND APPARATUS
    • 分析方法和装置
    • US20070214261A1
    • 2007-09-13
    • US11739946
    • 2007-04-25
    • Shinji KikuchiKen YokoyamaAkira TakeyamaKenichi ShimazakiTakamitsu MaedaKoji IshibashiSeiya ShindoKoutarou Tsuro
    • Shinji KikuchiKen YokoyamaAkira TakeyamaKenichi ShimazakiTakamitsu MaedaKoji IshibashiSeiya ShindoKoutarou Tsuro
    • G06F15/173
    • H04L43/0817G06F11/3419G06F11/3423G06F11/3447G06F2201/86H04L43/0852
    • An analysis method for carrying out an analysis for responses of a computer system including a plurality of servers, includes: obtaining data concerning a CPU utilization ratio of each of the plurality of servers from the computer system, and storing the data concerning the CPU utilization ratio into a CPU utilization ratio storage; obtaining processing history data generated in the computer system, generating data of a request frequency by users of the computer system, and storing the processing history data into a request frequency data storage; and estimating an average delay time in each server by using the CPU utilization ratio of each server, which is stored in the CPU utilization ratio storage, and the request frequency stored in the request frequency data storage, and storing the estimated average delay time into a server delay time storage. By carrying out such a processing, the analysis can be carried out without changing the computer system to be analyzed and any additional cost.
    • 一种用于对包括多个服务器的计算机系统的响应进行分析的分析方法包括:从计算机系统获取与多个服务器中的每一个的CPU利用率有关的数据,并存储与CPU利用率有关的数据 进入CPU利用率存储; 获取在所述计算机系统中生成的处理历史数据,生成所述计算机系统的用户的请求频率的数据,以及将所述处理历史数据存储到请求频率数据存储器中; 以及通过使用存储在CPU利用率存储器中的每个服务器的CPU利用率和存储在请求频率数据存储器中的请求频率来估计每个服务器中的平均延迟时间,并将估计的平均延迟时间存储到 服务器延迟时间存储。 通过进行这样的处理,可以在不改变要分析的计算机系统和任何附加成本的情况下进行分析。
    • 5. 发明申请
    • Trace processing program, method and apparatus
    • 跟踪处理程序,方法和装置
    • US20060015612A1
    • 2006-01-19
    • US10955887
    • 2004-09-30
    • Kenichi ShimazakiKoji IshibashiSeiya ShindoShinji WatanabeKoutaro Tsuro
    • Kenichi ShimazakiKoji IshibashiSeiya ShindoShinji WatanabeKoutaro Tsuro
    • G06F15/173
    • H04L67/22
    • A distributed application system has a plurality of applications running on a plurality of servers arranged hierarchically and, when receiving a request telegraphic message from a client, executes processes while transferring a relay code between applications in order. A trace condition embedding unit embeds a trace collection condition into a relay code and transfers it to the next application. When the request telegraphic message is received, trace collection units decide whether trace collection is to be made or not based on the trace collection condition of the relay code, in other words, based on the switch information which indicates whether trace collection is to be made or not to perform a process. The trace collection condition includes a function ID which indicates a range of tracing for each application and a relay ID which records applications which has been passed through. The trace condition embedding unit further includes intermittent switch information which indicates a ratio of trace collection to reception times of the request telegraphic message when trace collection is indicated by the switch information and embeds the trace collection condition in which a switch will be turned on into the relay code in accordance with the ratio of the intermittent switch information.
    • 分布式应用系统具有多个应用层次运行的多个应用程序运行的应用程序,并且当从客户机接收到请求电报消息时,依次在应用程序之间传送中继代码的同时执行进程。 跟踪条件嵌入单元将跟踪收集条件嵌入到中继代码中,并将其传送到下一个应用程序。 当接收到请求电报消息时,跟踪收集单元根据中继代码的跟踪收集条件决定是否进行跟踪收集,换句话说,基于指示是否进行跟踪收集的交换机信息 或不执行进程。 跟踪收集条件包括指示每个应用的跟踪范围的功能ID和记录已经通过的应用的中继ID。 轨迹条件嵌入单元还包括间歇切换信息,其指示当通过切换信息指示跟踪收集时的跟踪收集与请求电报消息的接收时间的比率,并将将开关切换到的跟踪收集条件嵌入到 中继代码按照间歇切换信息的比例。
    • 6. 发明授权
    • Trace processing program, method and system
    • 跟踪处理程序,方法和系统
    • US08543988B2
    • 2013-09-24
    • US10955887
    • 2004-09-30
    • Kenichi ShimazakiKoji IshibashiSeiya ShindoShinji WatanabeKoutaro Tsuro
    • Kenichi ShimazakiKoji IshibashiSeiya ShindoShinji WatanabeKoutaro Tsuro
    • G06F9/44G06F15/16
    • H04L67/22
    • A distributed application system has a plurality of applications running on a plurality of servers arranged hierarchically and, when receiving a request telegraphic message from a client, executes processes while transferring a relay code between applications in order. A trace condition embedding unit embeds a trace collection condition into a relay code and transfers it to the next application. Trace collection units decide whether trace collection is to be made or not, and perform a process. The trace collection condition includes an indication of a range of tracing for each application and a record of applications which has passed through. The trace condition embedding unit further includes intermittent switch information which indicates a ratio of trace collection to reception times of the request telegraphic message.
    • 分布式应用系统具有多个应用层次运行的多个应用程序运行的应用程序,并且当从客户机接收到请求电报消息时,依次在应用程序之间传送中继代码的同时执行进程。 跟踪条件嵌入单元将跟踪收集条件嵌入到中继代码中,并将其传送到下一个应用程序。 跟踪收集单元决定是否进行跟踪收集,并执行一个过程。 跟踪收集条件包括每个应用程序的跟踪范围和已通过的应用程序记录的指示。 跟踪条件嵌入单元进一步包括间歇切换信息,其指示跟踪收集与请求电报消息的接收时间的比率。
    • 8. 发明申请
    • NEAR-FIELD TERAHERTZ WAVE DETECTOR
    • 近场TERAHERTZ波检测器
    • US20100006892A1
    • 2010-01-14
    • US12351208
    • 2009-01-09
    • Yukio KawanoKoji Ishibashi
    • Yukio KawanoKoji Ishibashi
    • H01L31/112
    • H01L31/0352H01L31/112Y10S977/742
    • A near-field terahertz wave detector comprises a semiconductor chip (12) whose longitudinal electrical resistance along its surface changes due to a near-field wave of a terahertz wave (1), an insulating film (18) which covers the surface of the semiconductor chip, and a conductive film (20) able to shield the terahertz wave by covering the surface of the insulating film. The conductive film (20) has an aperture (21) whose maximum size is one digit or more smaller than the wavelength of the terahertz wave. Further, a planar conductive probe (14) is provided between the conductive film (20) and the semiconductor chip (12). The conductive probe (14) is insulated from the conductive film (20) by the insulating film (18), and a tip (14a) of the conductive probe (14) is located inside the aperture (21). It is possible to increase a signal-to-noise ratio by significantly reducing the effect of a far-field wave, thereby enabling a near-field wave to be detected with high efficiency and increasing the resolution of an object by the near-field wave to one tenth or less of the wavelength.
    • 近场太赫兹波检测器包括半导体芯片(12),其半导体芯片(12)的纵向电阻由于太赫兹波(1)的近场波而变化,绝缘膜(18)覆盖半导体的表面 以及能够通过覆盖绝缘膜的表面来屏蔽太赫兹波的导电膜(20)。 导电膜(20)具有孔径(21),其孔径(21)的最大尺寸比太赫兹波的波长小一位数以上。 此外,在导电膜(20)和半导体芯片(12)之间设置有平面导电探针(14)。 导电探针(14)通过绝缘膜(18)与导电膜(20)绝缘,并且导电探针(14)的尖端(14a)位于孔(21)的内部。 可以通过显着降低远场波的影响来提高信噪比,从而能够以高效率检测近场波,并通过近场波提高物体的分辨率 到波长的十分之一或更少。
    • 9. 发明授权
    • Near-field terahertz wave detector
    • 近场太赫兹波检测器
    • US08148688B2
    • 2012-04-03
    • US12351208
    • 2009-01-09
    • Yukio KawanoKoji Ishibashi
    • Yukio KawanoKoji Ishibashi
    • G01J5/00G01J5/20H01L31/101
    • H01L31/0352H01L31/112Y10S977/742
    • A near-field terahertz wave detector comprises a semiconductor chip (12) whose longitudinal electrical resistance along its surface changes due to a near-field wave of a terahertz wave (1), an insulating film (18) which covers the surface of the semiconductor chip, and a conductive film (20) able to shield the terahertz wave by covering the surface of the insulating film. The conductive film (20) has an aperture (21) whose maximum size is one digit or more smaller than the wavelength of the terahertz wave. Further, a planar conductive probe (14) is provided between the conductive film (20) and the semiconductor chip (12). The conductive probe (14) is insulated from the conductive film (20) by the insulating film (18), and a tip (14a) of the conductive probe (14) is located inside the aperture (21). It is possible to increase a signal-to-noise ratio by significantly reducing the effect of a far-field wave, thereby enabling a near-field wave to be detected with high efficiency and increasing the resolution of an object by the near-field wave to one tenth or less of the wavelength.
    • 近场太赫兹波检测器包括半导体芯片(12),其半导体芯片(12)的纵向电阻由于太赫兹波(1)的近场波而变化,绝缘膜(18)覆盖半导体的表面 以及能够通过覆盖绝缘膜的表面来屏蔽太赫兹波的导电膜(20)。 导电膜(20)具有孔径(21),其孔径(21)的最大尺寸比太赫兹波的波长小一位数以上。 此外,在导电膜(20)和半导体芯片(12)之间设置平面导电探针(14)。 导电探针(14)通过绝缘膜(18)与导电膜(20)绝缘,并且导电探针(14)的尖端(14a)位于孔(21)的内部。 可以通过显着降低远场波的影响来提高信噪比,从而能够以高效率检测近场波,并通过近场波提高物体的分辨率 到波长的十分之一或更少。