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1. 外观设计

USD541331S1 Tape printing machine 有权
标题翻译：胶带印刷机
公开(公告)号：USD541331S1
公开(公告)日：2007-04-24
申请号：US29225262
申请日：2005-03-15
申请人： Shigeru Matsumoto , Masanori Oda
设计人： Shigeru Matsumoto , Masanori Oda

2. 发明授权

US08118432B2 Lens array element and projection type display device 有权
标题翻译：透镜阵列元件和投影型显示装置
公开(公告)号：US08118432B2
公开(公告)日：2012-02-21
申请号：US12624989
申请日：2009-11-24
申请人： Motoyuki Okuo , Shigeru Matsumoto
发明人： Motoyuki Okuo , Shigeru Matsumoto
IPC分类号： G03B21/14 , G02B27/12
CPC分类号： G02B3/0075 , B29C45/2602 , B29L2011/0016 , G02B3/0031 , G02B3/0056 , G03B21/208
摘要： A lens array element has a rectangular plate-like external shape, and includes plate surfaces that functions as light transmission surfaces; and a plurality of cellular lenses that are formed on at least one of the plate surfaces. Each of end faces 4 of the rectangular plate-like external shape forms an inclined surface that slants inward from a plate surface 6 on one side toward a plate surface 2 on the other side, and a reference surface 5 perpendicular to the plate surface is formed on a part of at least two adjoining end faces among the end faces. A front view shape of the reference surface region arranged side-by-side with the inclined surface of the end face is a trapezoid, an oblique side 7 of the trapezoid is disposed so as to extend from a plate surface on one side toward the plate surface 2 on the other side, and an upper side 9 of the trapezoid is disposed on a side of the other of the plate surfaces. Regarding the reference surface provided to the rectangular plate-like end face for optical alignment, the occurrence of inaccuracy due to the releasing properties at the time of molding the lends array element using a metal mold is suppressed.
摘要翻译：透镜阵列元件具有矩形板状外部形状，并且包括用作光透射表面的板表面; 以及形成在至少一个所述板表面上的多个蜂窝状透镜。矩形板状外形的端面4形成从另一侧的板面2的一侧的板面6向内倾斜的倾斜面，形成与板面垂直的基准面5 在端面中的至少两个邻接端面的一部分上。与端面的倾斜面并排配置的基准面区域的前视图形状为梯形，梯形斜面7配置成从板面向一侧朝向板另一侧的表面2，梯形的上侧9设置在另一个板表面的一侧。关于提供给用于光学取向的矩形板状端面的参考表面，抑制了使用金属模具成型使用阵列元件时的脱模性的不准确性的发生。

3. 外观设计

USD645512S1 Adhesive tape 有权
标题翻译：胶带
公开(公告)号：USD645512S1
公开(公告)日：2011-09-20
申请号：US29329053
申请日：2008-12-08
申请人： Shigeru Matsumoto , Kazue Torii
设计人： Shigeru Matsumoto , Kazue Torii

4. 外观设计

USD556255S1 PRINTER 有权
标题翻译：打印机
公开(公告)号：USD556255S1
公开(公告)日：2007-11-27
申请号：US29261334
申请日：2006-06-13
申请人： Shigeru Matsumoto
设计人： Shigeru Matsumoto

5. 发明申请

US20060241831A1 Method for investigating cause of decrease in frequency of abnormality detections, method for improving frequency of abnormality detections and electronic control apparatus 有权
标题翻译：调查异常检测频率降低原因的方法，异常检测频率提高方法及电子控制装置
公开(公告)号：US20060241831A1
公开(公告)日：2006-10-26
申请号：US11391302
申请日：2006-03-29
申请人： Masatoshi Watanabe , Shigeru Matsumoto , Koichi Ohgaki , Kazumasa Iwakawa
发明人： Masatoshi Watanabe , Shigeru Matsumoto , Koichi Ohgaki , Kazumasa Iwakawa
IPC分类号： G01M17/00
CPC分类号： B60W50/0205 , G01R31/007
摘要： A method for investigating a cause of decrease in frequency of abnormality detections for a certain device mounted on a vehicle, wherein when a plurality of abnormality detection conditions are satisfied, the abnormality detection for the certain device is performed to determine if the certain device is in failure, the method includes (i) when the frequency of the abnormality detections is below a predetermined value, disabling one of the abnormality detection conditions; (ii) when the abnormality detection conditions the one of which has been disabled are satisfied, performing an abnormality detection for the certain device; (iii) repeating the step (ii) a plurality of times; and (iv) determining if the disabled abnormality detection condition at that time is the cause of the decrease in the frequency of the abnormality detections, based on frequency of the abnormality detections in the step (iii).
摘要翻译：一种用于调查安装在车辆上的某些装置的异常检测频率降低的原因的方法，其中当满足多个异常检测条件时，执行该特定装置的异常检测以确定某个装置是否在该方法包括：（i）当异常检测的频率低于预定值时，禁用异常检测条件之一; （ii）当满足其中一个已被禁用的异常检测条件满足时，对该特定装置进行异常检测; （iii）重复步骤（ii）多次; 以及（iv）基于步骤（iii）中的异常检测的频率来确定此时的禁用异常检测条件是否是异常检测的频率降低的原因。

6. 外观设计

USD529083S1 Tape cartridge portion of a tape printing machine 失效
标题翻译：胶带印刷机的胶带盒部分
公开(公告)号：USD529083S1
公开(公告)日：2006-09-26
申请号：US29208181
申请日：2004-06-25
申请人： Kiyoshi Sugimoto , Shigeru Matsumoto
设计人： Kiyoshi Sugimoto , Shigeru Matsumoto

7. 发明授权

US07096156B2 Operation support system for power plant 有权
标题翻译：电厂运行支援系统
公开(公告)号：US07096156B2
公开(公告)日：2006-08-22
申请号：US10745478
申请日：2003-12-29
申请人： Shunji Hosaka , Shigeru Matsumoto , Toshihiro Yamada , Akinori Kamito
发明人： Shunji Hosaka , Shigeru Matsumoto , Toshihiro Yamada , Akinori Kamito
IPC分类号： G06F11/30
CPC分类号： F01K13/02 , Y02E20/14
摘要： An operation support system for a power plant includes an input unit for inputting measured data of the power plant over a communication network, a data evaluating unit for quantitatively evaluating performance deterioration of the power plant and component equipment thereof and creating operation support data base on the input measured data, and an output unit for outputting the operation support data to a computer for confirming operation support data connected thereto over the communication network.
摘要翻译：一种用于电厂的操作支持系统，包括用于通过通信网络输入发电厂的测量数据的输入单元，用于定量评估发电厂的性能劣化的数据评估单元及其组件设备，并基于输入测量数据，以及输出单元，用于向计算机输出操作支持数据，以确认通过通信网络连接到其上的操作支持数据。

8. 发明授权

US07078245B2 Method for determining a preceding wafer, method for determining a measuring wafer, and method for adjusting the number of wafers 失效
公开(公告)号：US07078245B2
公开(公告)日：2006-07-18
申请号：US10827414
申请日：2004-04-20
申请人： Hiroaki Ishizuka , Shigeru Matsumoto
发明人： Hiroaki Ishizuka , Shigeru Matsumoto
IPC分类号： H01L21/00
CPC分类号： H01L21/67276
摘要： In the method for determining a preceding wafer, at least one semiconductor wafer is determined as a preceding wafer among a plurality of semiconductor wafers constituting one lot. The preceding wafer is then subjected to a given process among a plurality of processes for fabrication of a semiconductor device. The determination of the preceding wafer is based on processing results of an upstream process among the plurality of processes performed for the plurality of semiconductor wafers prior to the given process. After examination of processing results of the given process on the preceding wafer, the given process is performed for the plurality of semiconductor wafers other than the preceding wafer.

9. 外观设计

USD496687S1 Tape printing machine 失效
标题翻译：胶带印刷机
公开(公告)号：USD496687S1
公开(公告)日：2004-09-28
申请号：US29195499
申请日：2003-12-15
申请人： Shigeru Matsumoto , Kazuyoshi Minaminaka , Susumu Murata , Shin Manabe
设计人： Shigeru Matsumoto , Kazuyoshi Minaminaka , Susumu Murata , Shin Manabe

10. 发明授权

US5737228A Manufacturing project forming method and device 失效
标题翻译：制造项目形成方法及装置
公开(公告)号：US5737228A
公开(公告)日：1998-04-07
申请号：US597257
申请日：1996-02-06
申请人： Hiroaki Ishizuka , Shigeru Matsumoto
发明人： Hiroaki Ishizuka , Shigeru Matsumoto
IPC分类号： G05B15/02 , G05B19/418 , G06F17/50 , G06F19/00 , G06Q50/00 , G06Q50/04 , G06Q90/00
CPC分类号： G06Q10/06 , G05B19/41865 , G05B2219/31407 , G05B2219/32304 , Y02P90/20
摘要： A variable F (a, n) defined by Equation (1) (wherein k (a, n) is a constant set on a step P (a, n) which is the nth step of a product a, Tave (a, n) is an average wait time for the same step as the step P (a, n) which is obtained from the past processing results, Tw1 (a, n) is a processing wait time which is a time difference between a processing end time for a step P (a, n--1) and a processing start time for the step P (a, n), N (a) is a final step for the product a, Te (a, N(a)) is a end time for a final step P (a, N(a)), Tout (a) is a target delivery date for The product a, and E (a) is the number of steps in which the product a is not yet processed) is set on all manufacturing steps of a product which is put in a manufacturing line. The processing start and end times for each step are determined in such a manner that the absolute value of the variable F (a, n) is smaller than a preset constant Fmax which is equal to or greater than 0 so that an initial manufacturing project is formed. The initial manufacturing project is corrected so as not to violate preset constraint conditions. Equation (1) equals: ##EQU1##
摘要翻译：由式（1）定义的变量F（a，n）（其中k（a，n）是在乘积a的第n步的步骤P（a，n）上设定的常数，Tave（a，n））是与从过去的处理结果获得的步骤P（a，n）相同的步骤的平均等待时间，Tw1（a，n）是作为处理等待时间的处理等待时间，该处理等待时间是步骤P（a，n-1）和步骤P（a，n）的处理开始时间N（a）是乘积a的最终步骤，Te（a，N（a））为终点最后一步P（a，N（a））的时间，Tout（a）是产品a的目标交货日期，E（a）是产品a尚未处理的步骤数）设置在生产线上的产品的所有制造步骤。确定每个步骤的处理开始和结束时间，使得变量F（a，n）的绝对值小于等于或大于0的预设常数Fmax，使得初始制造项目为形成。纠正初始制造项目，以免违反预设约束条件。等式（1）等于：F（a，n）= K（a，n）x {Tave'（a，n） - Tw1（a，n）} - + TR {Tave'（a，n + 1） - Tw1（a，n + 1）}

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