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    • 3. 发明申请
    • LOAD DISPLAY DEVICE FOR DUMP TRUCK
    • 用于推车的负载显示装置
    • US20130120579A1
    • 2013-05-16
    • US13811475
    • 2012-05-23
    • Shinji MIitsutaShigeru HaradaTomikazu TanukiEishin MasutaniYukihiro NakanishiTakeshi KuriharaDai TsuboneMasaomi Machida
    • Shinji MIitsutaShigeru HaradaTomikazu TanukiEishin MasutaniYukihiro NakanishiTakeshi KuriharaDai TsuboneMasaomi Machida
    • H04N7/18
    • H04N7/18B60P1/283B60R1/00B60R2300/607B60R2300/70G01G19/10
    • A periphery monitoring device (10) comprises a monitor (50) that displays a bird's-eye image (200) that includes an image of a dump truck (1), a payload meter ECU (21) that detects the load of the dump truck (1), and a controller (20) that switches the size of a cargo image (C1) displayed over the vessel (4) of the dump truck (1) and displays this image on the monitor (50) on the basis of the detection result of the payload meter ECU (21).In a load display device for a dump truck, a plurality of cameras are installed and the load display device monitors the periphery by using a bird's-eye image that combines images obtained by the plurality of cameras. The load display device includes a display component, a detector and a display controller. The display component is configured to display the bird's-eye image including an image of the dump truck. The detector is configured to detect a load of the dump truck. The display controller is configured to switch a size of a simulated cargo image displayed over a vessel of the dump truck based on a detection result of the detector and to display the simulated cargo image on the display component.
    • 外围监视装置(10)包括监视器(50),其显示包括自卸车(1)的图像的鸟瞰图(200),检测自卸车的负载的有效载荷计量器ECU(21) (1),以及控制器(20),其切换显示在自卸车(1)的容器(4)上方的货物图像(C1)的尺寸,并将该图像基于 有效载荷表ECU(21)的检测结果。 在用于自卸车的负载显示装置中,安装多个照相机,并且负载显示装置通过使用组合由多个照相机获得的图像的鸟瞰图像来监视周边。 负载显示装置包括显示部件,检测器和显示控制器。 显示部件被配置为显示包括自卸车的图像的鸟瞰图像。 检测器被配置为检测自卸车的负载。 显示控制器被配置为基于检测器的检测结果来切换在自卸车的容器上显示的模拟货物图像的尺寸,并且将模拟的货物图像显示在显示部件上。
    • 4. 发明授权
    • Image correction circuit, image correction method and image display
    • 图像校正电路,图像校正方法和图像显示
    • US08369646B2
    • 2013-02-05
    • US11743366
    • 2007-05-02
    • Shigeru Harada
    • Shigeru Harada
    • G06K9/40G06K9/00G06T5/40
    • H04N5/20G09G5/10G09G2320/066G09G2320/0673G09G2360/16
    • An image correction method includes the steps of: acquiring a black-side intermediate luminance distribution as a luminance distribution in a region between a lowest luminance in a given intermediate luminance region in a luminance distribution of input image data in an image frame and a reference luminance provided in the center of the intermediate luminance region; determining a low-luminance-region input/output characteristic curve on the basis of the acquired black-side intermediate luminance distribution, the low-luminance-region input/output characteristic curve passing through a reference point, in the reference input/output characteristic line, determined in accordance with the reference luminance and through a minimum luminance point of the reference input/output characteristic line; and executing image correction on input image data having a luminance which is lower than the reference luminance on the basis of the determined low-luminance-region input/output characteristic curve.
    • 图像校正方法包括以下步骤:在图像帧中的输入图像数据的亮度分布中的给定中间亮度区域中的最低亮度与参考亮度之间的区域中获取作为亮度分布的黑色侧中间亮度分布 设置在中间亮度区域的中心; 基于获取的黑侧中间亮度分布,通过参考点的低亮度区域输入/输出特性曲线,在参考输入/输出特性线中,确定低亮度区域输入/输出特性曲线 根据参考亮度和参考输入/输出特性线的最小亮度点确定; 以及基于所确定的低亮度区域输入/输出特性曲线对具有低于参考亮度的亮度的输入图像数据执行图像校正。
    • 5. 发明授权
    • Image correction circuit, image correction method and image display
    • 图像校正电路,图像校正方法和图像显示
    • US08369645B2
    • 2013-02-05
    • US11743339
    • 2007-05-02
    • Shigeru Harada
    • Shigeru Harada
    • G06K9/40G06K9/00G06T5/40
    • H04N5/202G06T5/009G06T5/40G06T2207/10016H04N5/208H04N5/775
    • An image correction circuit includes: a region determining means for determining an intermediate luminance region in each image frame on the basis of the description of input image data; a luminance distribution acquiring means for acquiring a luminance distribution of input image data in the determined intermediate luminance region in each image frame; a determining means for determining an input/output characteristic line in each image frame by adaptively changing a predetermined reference input/output characteristic line on the basis of the acquired luminance distribution of the intermediate luminance region, the input/output characteristic line defining the substance of image correction on input image data; and a correction executing means for executing image correction on input image data on the basis of the determined input/output characteristic line.
    • 图像校正电路包括:区域确定装置,用于根据输入图像数据的描述确定每个图像帧中的中间亮度区域; 亮度分布获取装置,用于获取每个图像帧中所确定的中间亮度区域中的输入图像数据的亮度分布; 确定装置,用于通过基于所获取的中间亮度区域的亮度分布自适应地改变预定参考输入/输出特性线来确定每个图像帧中的输入/输出特性线,该输入/输出特性线限定 输入图像数据的图像校正; 以及校正执行装置,用于根据确定的输入/输出特性线对输入图像数据执行图像校正。
    • 10. 发明授权
    • Semiconductor device with improved immunity to contact and conductor
defects
    • 具有改善的抗接触和导体缺陷的半导体器件
    • US5481137A
    • 1996-01-02
    • US246375
    • 1994-05-18
    • Shigeru HaradaHisao MasudaReiji Tamaki
    • Shigeru HaradaHisao MasudaReiji Tamaki
    • H01L23/532H01L23/48H01L29/34H01L29/46H01L29/62
    • H01L23/53219H01L23/532H01L2924/0002
    • In a semiconductor device, an impurity diffused layer serving as an active region is formed in a predetermined region of the surface of a semiconductor substrate of silicon, an underlayer insulating film is formed on the semiconductor substrate for the purpose of protecting and stabilizing the surface of the semiconductor substrate, and an interconnection electrically connected to the impurity diffused layer through a contact hole and formed on an Al-Si-Sn alloy, an Al-Si-Sb alloy or alloys having Ti added to the respective alloys, so that occurrence of an alloy pit and a silicon nodule is prevented. In addition, a completed protective film is formed on the interconnection and the underlayer insulating film and an aperture in a bonding pad region is formed in a predetermined region of the completed protective film, so that the interconnection and the bonding pad are electrically connected to each other. The proportion of silicon and other materials in the alloy are controlled to simultaneously avoid alloy pit and silicon nodule defects both at the contact hole and throughout the alloy conductor.
    • 在半导体器件中,在硅的半导体衬底的表面的预定区域中形成用作有源区的杂质扩散层,为了保护和稳定表面的目的,在半导体衬底上形成下层绝缘膜 半导体衬底以及通过接触孔与杂质扩散层电连接并且在Al-Si-Sn合金,Al-Si-Sb合金或其合金上添加有Ti的合金形成的互连,从而发生 防止了合金凹坑和硅结节。 此外,在互连和下层绝缘膜上形成完整的保护膜,并且在完成的保护膜的预定区域中形成焊盘区域中的孔,使得互连和焊盘与每个 其他。 控制合金中硅和其他材料的比例,以同时避免接触孔和整个合金导体中的合金凹坑和硅结节缺陷。