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1. 发明授权

US6108797A Method and system for loading microprograms in partially defective memory 失效
标题翻译：在部分缺陷记忆中加载微程序的方法和系统
公开(公告)号：US6108797A
公开(公告)日：2000-08-22
申请号：US988574
申请日：1997-12-11
申请人： Shi-Tron Lin , Ding-Yuan Yang , Meng-Tsang Wu
发明人： Shi-Tron Lin , Ding-Yuan Yang , Meng-Tsang Wu
IPC分类号： G06F9/445 , G11C29/00 , G06F12/02
CPC分类号： G06F9/445 , G11C29/76 , G11C29/88
摘要： When loading executable machine code into memories, the defective memory locations can be bypassed by properly inserting jump instructions or dummy memory allocation instructions in the program code. Prior to loading the executable code into the memories, defective memory locations are checked and recorded first. The source program code are analyzed to see which instruction step will fall into defective memory locations. Dummy memory space allocation instructions or additional jump instructions, are inserted in the original micro code, such that defective memory locations can be bypassed when the modified program code is loaded into the working memory space. The present invention is useful for loading executable programs in programmable and verifiable memories, such as Flash/EEPROM, EPROM, SRAM and DRAM, etc.
摘要翻译：当将可执行机器码加载到存储器中时，可以通过在程序代码中适当地插入跳转指令或虚拟存储器分配指令来绕过有缺陷的存储单元。在将可执行代码加载到存储器之前，首先检查和记录缺陷存储单元。分析源程序代码，以查看哪个指令步骤将落入有缺陷的存储器位置。虚拟存储器空间分配指令或附加跳转指令被插入到原始微代码中，使得当修改的程序代码被加载到工作存储器空间中时可以绕过有缺陷的存储器位置。本发明可用于在诸如闪存/ EEPROM，EPROM，SRAM和DRAM等的可编程和可验证存储器中加载可执行程序。

2. 发明授权

US6141768A Self-corrective memory system and method 失效
标题翻译：自校正记忆系统及方法
公开(公告)号：US6141768A
公开(公告)日：2000-10-31
申请号：US41226
申请日：1998-03-12
申请人： Shi-Tron Lin , Ding-Yuan Yang
发明人： Shi-Tron Lin , Ding-Yuan Yang
IPC分类号： G06F11/22 , G11C29/00 , G11C29/44 , G06F11/00
CPC分类号： G11C29/76 , G06F11/2284 , G11C29/44
摘要： A computer system is provided which performs a self-test of the memory cells of a memory device prior to loading of a computer program into the memory device, so as to determine the locations of defective memory cells. During loading of the computer program, each instruction step, data block and stack declaration is decoded, and the present invention creates and inserts a jump instruction into the original program code to bypass any defective memory cells without interrupting the intended operation of the instruction steps that are loaded into the memory. The loaded program code is then modified to correct any address-referencing that may be changed due to the insertion of the jump instructions. The present invention can even periodically perform a self-test procedure during the normal operation of the computer system so as to locate new defective memory cells and to modify the program code to bypass these newly-located defective memory cells.
摘要翻译：提供一种计算机系统，其在将计算机程序加载到存储器件之前对存储器件的存储器单元执行自检，以便确定有缺陷的存储器单元的位置。在加载计算机程序期间，解码每个指令步骤，数据块和堆栈声明，并且本发明创建并将跳转指令插入到原始程序代码中以绕过任何有缺陷的存储器单元而不中断指令步骤的预期操作，被加载到内存中。然后修改加载的程序代码以校正任何可能由于插入跳转指令而改变的地址引用。本发明甚至可以在计算机系统的正常操作期间周期性地执行自检程序，以便定位新的有缺陷的存储器单元并且修改程序代码以绕过这些新定位的有缺陷的存储器单元。

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