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    • 1. 发明授权
    • Gas-sensor
    • 气体传感器
    • US08747634B2
    • 2014-06-10
    • US13045223
    • 2011-03-10
    • Seiji OyaShin YoshidaYuko Yamada
    • Seiji OyaShin YoshidaYuko Yamada
    • G01N27/409G01N27/26
    • G01N27/407
    • A gas sensor including a gas sensor element, and an inner member surrounding the gas sensor element. The gas sensor element has a detection element having therein a space to which a gas to be measured is introduced, and a heater laminated on the detection element. The detection element includes a first oxygen pumping cell for pumping oxygen into or out of the space, an oxygen concentration detection cell, a detection electrode and a reference electrode. In side faces of the detection element along a laminating direction, a region from a front end of the inner member to a part of the detection electrode along a longitudinal direction is covered with a glass coat having a glass transition point of over 700° C. Further the detection electrode is controlled at a temperature range from 600° C. or more to not more than the glass transition point of the glass coat.
    • 包括气体传感器元件的气体传感器和围绕气体传感器元件的内部构件。 气体传感器元件具有检测元件,其中具有引入待测气体的空间,层叠在检测元件上的加热器。 检测元件包括用于将氧气输入或流出空间的第一氧气泵浦单元,氧浓度检测单元,检测电极和参考电极。 沿着层叠方向的检测元件的侧面,从玻璃化转变点为700℃以上的玻璃涂层覆盖从内部构件的前端到沿着长度方向的检测电极的一部分的区域。 此外,将检测电极控制在玻璃涂层的玻璃化转变点的600℃以上的范围内。
    • 5. 发明授权
    • Method for manufacturing an electrical test probe
    • 电测试探头的制造方法
    • US07736690B2
    • 2010-06-15
    • US12017300
    • 2008-01-21
    • Hideki HirakawaYuko YamadaYosuke YoshizawaTakayuki HayashizakiAkira SomaShinji Kuniyoshi
    • Hideki HirakawaYuko YamadaYosuke YoshizawaTakayuki HayashizakiAkira SomaShinji Kuniyoshi
    • B05D5/12
    • G01R1/06755G01R1/06733Y10T29/49117Y10T29/49204
    • A probe tip section of an electrical test probe has a laminated structure consisting of a first deposition portion and a second deposition portion covering the first deposition portion, and by the laminated structure, a maximum cross-sectional area portion at which the cross-sectional area of the probe tip section is increased to a base portion is provided between a tip end of the probe tip section and the base portion in the probe tip section. At the maximum cross-sectional area portion, a dimension in the X direction as seen on a flat surface perpendicular to a protruding direction of the probe tip section is increased in a one-dimensional way, and in addition, a dimension in the Y direction perpendicular to the X direction is increased from the tip end toward the base portion, as a result of which the cross-sectional area of the probe tip section can be increased in a two-dimensional way. Thus, the cross-sectional area at the maximum cross-sectional area portion reaching the base portion of the probe tip section can be made to be larger than in the conventional case, and along with the increase of the cross-sectional area, the stress acting on the base portion can be lowered.
    • 电测试探针的探针尖端部分具有由第一沉积部分和覆盖第一沉积部分的第二沉积部分组成的层压结构,并且通过层压结构,包括最大横截面积部分,其截面积 在探针末端部的前端部与探针头部的基部之间,设置有探针头部的部分增加到基部。 在最大横截面积部分,在垂直于探针尖端部分的突出方向的平坦表面上看到的X方向上的尺寸以一维方式增加,另外,Y方向上的尺寸 与X方向垂直的方向从前端朝向基部增加,结果能够以二维方式增大探针末端部的截面积。 因此,能够使到达到探头前端部的基部的最大截面积部分的截面积大于常规情况,并且随着横截面积的增加,应力 可以降低作用于基部的部分。