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    • 1. 发明授权
    • Drive circuit for liquid crystal display cell
    • 液晶显示单元的驱动电路
    • US06476785B1
    • 2002-11-05
    • US09436064
    • 1999-11-08
    • Saroj PathakJames E. Payne
    • Saroj PathakJames E. Payne
    • G05B1942
    • G09G3/3659G09G2300/0814G09G2300/0842G09G2300/0852
    • A driver circuit for use in an array of picture elements in a liquid crystal display is capable of displaying one set of image data while receiving a second set of image data. A first select switch transistor responsive to a first select signal controls the coupling of a first image to a first storage capacitor. A second select switch transistor responsive to a second select signal controls the coupling of a second image to a second storage capacitor. The first storage capacitor may be selectively coupled to an output node by means of a first enable switch transistor responsive to a first enable signal. The second storage capacitor may be selectively coupled to the same output node by means of a second enable switch transistor responsive to a second enable signal. By proper manipulation of the switch transistors, one storage capacitor may be coupled to the output node while the other storage capacitor is isolated from the output node and receiving new image data.
    • 用于液晶显示器中的像素阵列的驱动电路能够在接收第二组图像数据的同时显示一组图像数据。 响应于第一选择信号的第一选择开关晶体管控制第一图像与第一存储电容器的耦合。 响应于第二选择信号的第二选择开关晶体管控制第二图像与第二存储电容器的耦合。 可以通过响应于第一使能信号的第一使能开关晶体管将第一存储电容器选择性地耦合到输出节点。 第二存储电容器可以通过响应于第二使能信号的第二使能开关晶体管选择性地耦合到相同的输出节点。 通过对开关晶体管的适当操作,一个存储电容器可以耦合到输出节点,而另一个存储电容器与输出节点隔离并接收新的图像数据。
    • 4. 发明授权
    • High voltage bit/column latch for Vcc operation
    • 用于Vcc操作的高电压位/列锁存器
    • US06618289B2
    • 2003-09-09
    • US10039916
    • 2001-10-29
    • Saroj PathakJames E. PayneHarry H. Kuo
    • Saroj PathakJames E. PayneHarry H. Kuo
    • G11C1606
    • G11C16/24
    • A bit/column latch comprising a pair of first and second cross-coupled CMOS inverters. Each inverter of the pair comprises an NMOS transistor and a PMOS transistor. The first CMOS inverter has the source of its NMOS transistor coupled to ground via a control transistor and has its output connected to the associated bit line. When low voltage data intended for the associated memory cell appears on the bit line, the control transistor is barely turned on to weaken the NMOS transistor of the first inverter. This makes it easier for the data on the bit line to turn on the NMOS transistor of the second inverter so as to switch the bit latch from storing a ‘low’ to storing a ‘high’. In other words, the data bit from the bit line is loaded into the bit latch. After that, the control transistor is strongly turned on and therefore it becomes transparent to the latch. As a result, the latch is stable when the bit line later ramps up to a high programming level.
    • 一个位/列锁存器,包括一对第一和第二交叉耦合CMOS反相器。 该对的每个反相器包括NMOS晶体管和PMOS晶体管。 第一个CMOS反相器的NMOS晶体管的源极通过控制晶体管耦合到地,并且其输出连接到相关的位线。 当位于相应存储单元上的低电压数据出现在位线上时,控制晶体管几乎不导通,以削弱第一反相器的NMOS晶体管。 这使得位线上的数据更容易打开第二反相器的NMOS晶体管,以便将位锁存器从存储“低”切换到存储“高”。 换句话说,来自位线的数据位被加载到位锁存器中。 此后,控制晶体管被强烈导通,因此对锁存器变得透明。 因此,当位线稍后上升到高编程电平时,锁存器是稳定的。
    • 6. 发明授权
    • Zero power high speed configuration memory
    • 零功率高速配置存储器
    • US5946267A
    • 1999-08-31
    • US978286
    • 1997-11-25
    • Saroj PathakGlen A. RosendaleJames E. PayneNianglamching Hangzo
    • Saroj PathakGlen A. RosendaleJames E. PayneNianglamching Hangzo
    • G11C16/02G11C7/10G11C8/00
    • G11C7/1039
    • A serial configuration memory device comprises an architecture wherein the reading out of data and the outputting of the bitstream are performed in pipeline fashion. As a result, the device is capable of outputting a bitstream based solely on the frequency of an externally provided clock, and is not limited by the slower operating speed of the sense amp circuitry. A caching scheme is provided which allows the first byte to be pre-loaded during a reset cycle so that the device can immediately begin outputting the bitstream as soon as the reset cycle completes. In a preferred embodiment of the invention, the bitstream consists of serially accessed memory locations starting from memory location zero. In one variation, the bitstream can begin from a memory location other than memory location zero.
    • 串行配置存储器件包括以流水线方式执行读出数据和输出比特流的架构。 结果,该装置能够仅基于外部提供的时钟的频率输出比特流,并且不受感测放大器电路的较慢的操作速度的限制。 提供了一种缓存方案,其允许在复位周期期间预加载第一字节,使得一旦复位周期完成,设备就可以立即开始输出比特流。 在本发明的优选实施例中,比特流由从存储器位置零开始的串行访问的存储器位置组成。 在一个变型中,比特流可以从除存储器位置零之外的存储器位置开始。
    • 7. 发明授权
    • Breakdown protection circuit using high voltage detection
    • 击穿保护电路采用高压检测
    • US5493244A
    • 1996-02-20
    • US180689
    • 1994-01-13
    • Saroj PathakJames E. PayneGlen A. Rosendale
    • Saroj PathakJames E. PayneGlen A. Rosendale
    • H03K17/0814H03K17/10H03K17/687H03K17/693H03K19/003H03K5/08
    • H03K17/693H03K17/08142H03K17/102H03K19/00315H03K19/00361H01L2924/0002
    • A high voltage circuit includes a first switching device for supplying one of a high voltage (V.sub.pp) and a low voltage (V.sub.cc) to a controlled path that includes a series connection of a control p-channel transistor and a protection p-channel transistor. A high voltage detector is utilized to determine whether V.sub.pp or V.sub.cc is applied to the controlled path. The high voltage detector also establishes a protecting condition for the protection p-channel transistor during V.sub.pp operation. On the other hand, the detector establishes a non-protecting condition during V.sub.cc operation, thereby rendering the protecting p-channel transistor transparent to circuit performance. A signal input switches the control p-channel transistor between on and off states. When the control transistor is in an off state and the protection transistor is in a protecting condition, the voltage drop along the controlled path will cause the protection transistor to turn off, so as to limit the voltage across the control transistor. A second controlled path is preferably in series connection with the first controlled path. The second controlled path includes n-channel transistors, with one of the transistors fixed at V.sub.cc in order to guard against gate-aided junction breakdown of the other transistor. In this embodiment, the high voltage circuit is preferably an inverter circuit.
    • 高压电路包括用于将高电压(Vpp)和低电压(Vcc)中的一个提供给包括控制p沟道晶体管和保护p沟道晶体管的串联连接的受控路径的第一开关器件。 利用高电压检测器来确定是否将Vpp或Vcc应用于受控路径。 高电压检测器还在Vpp操作期间为保护p沟道晶体管建立了保护条件。 另一方面,检测器在Vcc操作期间建立非保护状态,从而使得保护p沟道晶体管对电路性能是透明的。 信号输入在控制p沟道晶体管的导通和截止状态之间切换。 当控制晶体管处于断开状态并且保护晶体管处于保护状态时,沿受控路径的电压降将导致保护晶体管截止,从而限制控制晶体管两端的电压。 第二受控路径优选地与第一受控路径串联连接。 第二受控路径包括n沟道晶体管,其中一个晶体管固定在Vcc,以防止另一个晶体管的栅极辅助结击穿。 在本实施例中,高压电路优选为逆变器电路。
    • 9. 发明授权
    • Reference cell for high speed sensing in non-volatile memories
    • 用于非易失性存储器中高速感测的参考单元
    • US06411549B1
    • 2002-06-25
    • US09602108
    • 2000-06-21
    • Saroj PathakJames E. PayneJagdish Pathak
    • Saroj PathakJames E. PayneJagdish Pathak
    • G11C1606
    • G11C16/28G11C7/067G11C7/14
    • A reference cell for use in a high speed sensing circuit includes a first sub-circuit and a second sub-circuit. The first sub-circuit has a structure similar to memory cells within odd number rows of a main memory array. The second sub-circuit has a structure similar to memory cells within even numbered rows of the main memory array. If a target cell within the main memory array lies within an odd numbered row, then the first sub-circuit is selected, and if the target cell lies within an even numbered row, then second sub-circuit is selected. Both of the first and second sub-circuits include a reference transistors having its control gate broken into two parts. A first part is a poly 1 layer and is separated from the channel region by a tunneling oxide. A second part is a metal or poly 2 layer over the first part and separated from the first part by a gate oxide. A via is used to connect the first part to the second part.
    • 用于高速感测电路的参考单元包括第一子电路和第二子电路。 第一子电路具有类似于主存储器阵列的奇数行内的存储单元的结构。 第二子电路具有类似于主存储器阵列的偶数行内的存储单元的结构。 如果主存储器阵列内的目标单元位于奇数行内,则选择第一子电路,并且如果目标单元位于偶数行中,则选择第二子电路。 第一和第二子电路都包括其控制门分成两部分的参考晶体管。 第一部分是聚1层,并且通过隧道氧化物与沟道区分离。 第二部分是在第一部分上的金属或聚二层,并且通过栅极氧化物与第一部分分离。 通孔用于将第一部分连接到第二部分。
    • 10. 发明授权
    • Zero power high speed programmable circuit device architecture
    • 零功率高速可编程电路器件架构
    • US5440508A
    • 1995-08-08
    • US194930
    • 1994-02-09
    • Saroj PathakJames E. Payne
    • Saroj PathakJames E. Payne
    • G11C17/00G11C14/00G11C16/04
    • G11C14/00
    • A non-volatile, low, and zero power, high speed self-sensing programmable device and architecture including a non-volatile self-sensing cell. The non-volatile self-sensing cell is connected out of the speed path of the programmable device, permitting rapid, non-volatile programming and reading operations to be conducted. According to one version, two self-sensing cells are provided with a means for selecting one of the cells for programming or read operation. Each non-volatile self-sensing cell includes a latch having cross-coupled, pull-up transistors and non-volatile pull-down cells. The cross-coupled pull-up transistors are field effect transistors having gates which are connected to the opposite sources of the cross-coupled pull-up transistors.
    • 非易失性,低功耗和零功率的高速自感可编程器件和架构,包括非易失性自感应单元。 非易失性自感应单元被连接在可编程设备的速度路径之外,允许进行快速,非易失性的编程和读取操作。 根据一个版本,两个自感应单元被提供有用于选择一个单元以进行编程或读取操作的装置。 每个非易失性自感应单元包括具有交叉耦合的上拉晶体管和非易失性下拉单元的锁存器。 交叉耦合上拉晶体管是具有连接到交叉耦合上拉晶体管的相反源极的栅极的场效应晶体管。