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1. 发明申请

US20120208122A1 Continuous emulsification-aggregation process for the production of particles 有权
标题翻译：连续乳化聚集工艺生产颗粒
公开(公告)号：US20120208122A1
公开(公告)日：2012-08-16
申请号：US13432122
申请日：2012-03-28
申请人： Santiago Faucher , Kimberly Nosella , David Thomas Borbely , Gaetano Lavigne , Simon Burke
发明人： Santiago Faucher , Kimberly Nosella , David Thomas Borbely , Gaetano Lavigne , Simon Burke
IPC分类号： G03G9/093 , G03G9/08 , B01J8/00
CPC分类号： B01J19/1862 , B01F7/00383 , B01F7/00633 , B01F7/169 , B01J19/0066 , B01J2219/00094 , B01J2219/00177 , B01J2219/00779 , G03G9/0804 , G03G9/0806 , G03G9/0819 , G03G9/09392
摘要： A continuous emulsion aggregation process for the production of particles is presented including a plurality of continuous stirred-tank reactors (CSTR). The plurality of continuous stirred-tank reactors includes at least one feed tank of raw materials, at least one reactor for facilitating cold addition, at least two reactors for facilitating an aggregation process, at least one reactor for facilitating a shell addition process; at least one reactor for facilitating a freeze process, at least one reactor for facilitating a chelating process, at least one reactor for facilitating a ramp-up process and at least one reactor for facilitating a coalescence process, wherein the reactors are sequentially assembled in a series configuration and separated by short conduits to produce toner particles that are narrowly distributed.
摘要翻译：提出了用于生产颗粒的连续乳液聚集方法，包括多个连续搅拌釜反应器（CSTR）。多个连续搅拌釜反应器包括至少一个原料进料罐，用于促进冷加成的至少一个反应器，用于促进聚集过程的至少两个反应器，用于促进壳加成过程的至少一个反应器; 用于促进冷冻过程的至少一个反应器，用于促进螯合过程的至少一个反应器，用于促进加速过程的至少一个反应器和用于促进聚结过程的至少一个反应器，其中反应器依次组装成串联构造并由短导管隔开以产生狭窄分布的调色剂颗粒。

2. 发明授权

US08916098B2 Continuous emulsification-aggregation process for the production of particles 有权
公开(公告)号：US08916098B2
公开(公告)日：2014-12-23
申请号：US13432122
申请日：2012-03-28
申请人： Santiago Faucher , Kimberly Nosella , David Thomas Borbely , Gaetano Lavigne , Simon Burke
发明人： Santiago Faucher , Kimberly Nosella , David Thomas Borbely , Gaetano Lavigne , Simon Burke
IPC分类号： B01J19/18 , G03G9/093 , B01F7/00 , B01F7/16 , B01J19/00 , G03G9/08
CPC分类号： B01J19/1862 , B01F7/00383 , B01F7/00633 , B01F7/169 , B01J19/0066 , B01J2219/00094 , B01J2219/00177 , B01J2219/00779 , G03G9/0804 , G03G9/0806 , G03G9/0819 , G03G9/09392
摘要： A continuous emulsion aggregation process for the production of particles is presented including a plurality of continuous stirred-tank reactors (CSTR). The plurality of continuous stirred-tank reactors includes at least one feed tank of raw materials, at least one reactor for facilitating cold addition, at least two reactors for facilitating an aggregation process, at least one reactor for facilitating a shell addition process; at least one reactor for facilitating a freeze process, at least one reactor for facilitating a chelating process, at least one reactor for facilitating a ramp-up process and at least one reactor for facilitating a coalescence process, wherein the reactors are sequentially assembled in a series configuration and separated by short conduits to produce toner particles that are narrowly distributed.

3. 发明申请

US20080250368A1 Inductance mitigation through switching density analysis 有权
标题翻译：通过开关密度分析减小电感
公开(公告)号：US20080250368A1
公开(公告)日：2008-10-09
申请号：US11732950
申请日：2007-04-04
申请人： Stuart A. Taylor , Edward M. Roseboom , Simon Burke
发明人： Stuart A. Taylor , Edward M. Roseboom , Simon Burke
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G06F2217/62
摘要： Embodiments of a method for detecting potential areas of inductive coupling in a high density integrated circuit design are described. The inductance mitigation process first converts the inductive analysis into a density problem. The density of wires within a region that may switch within a portion of the system clock are compared to the density of wires will not switch within that same time. Regions of the chip that have a high ratio of density of switching wires versus non-switching wires are determined to have the potential of an inductive coupling problem. Additional grounded metal is added into the problematic regions of the chip to improve the switching versus non-switching wire density.
摘要翻译：描述了用于检测高密度集成电路设计中的电感耦合的潜在面积的方法的实施例。电感减轻过程首先将归纳分析转换为密度问题。在系统时钟的一部分内切换的区域内的线的密度与电线的密度进行比较将不会在同一时间内转换。确定开关线与非开关线之间的高密度比的芯片的区域具有电感耦合问题的潜力。额外的接地金属被添加到芯片的有问题的区域中以改善开关与非开关线密度。

4. 发明授权

US08060846B2 Inductance mitigation through switching density analysis 有权
标题翻译：通过开关密度分析减小电感
公开(公告)号：US08060846B2
公开(公告)日：2011-11-15
申请号：US11732950
申请日：2007-04-04
申请人： Stuart A. Taylor , Edward M. Roseboom , Simon Burke
发明人： Stuart A. Taylor , Edward M. Roseboom , Simon Burke
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G06F2217/62
摘要： Embodiments of a method for detecting potential areas of inductive coupling in a high density integrated circuit design are described. The inductance mitigation process first converts the inductive analysis into a density problem. The density of wires within a region that may switch within a portion of the system clock are compared to the density of wires will not switch within that same time. Regions of the chip that have a high ratio of density of switching wires versus non-switching wires are determined to have the potential of an inductive coupling problem. Additional grounded metal is added into the problematic regions of the chip to improve the switching versus non-switching wire density.
摘要翻译：描述了用于检测高密度集成电路设计中的电感耦合的潜在面积的方法的实施例。电感减轻过程首先将归纳分析转换为密度问题。在系统时钟的一部分内切换的区域内的线的密度与电线的密度进行比较将不会在同一时间内转换。确定开关线与非开关线之间的高密度比的芯片的区域具有电感耦合问题的潜力。额外的接地金属被添加到芯片的有问题的区域中以改善开关与非开关线密度。

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