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1. 发明申请

US20110134307A1 CAMERA MODULE 有权
标题翻译：相机模块
公开(公告)号：US20110134307A1
公开(公告)日：2011-06-09
申请号：US12760838
申请日：2010-04-15
申请人： Sang-Jin Lee , Yong-Gu Kim
发明人： Sang-Jin Lee , Yong-Gu Kim
IPC分类号： H04N5/225
CPC分类号： H04N5/2253 , G02B5/208 , H04N5/2254 , H04N5/2257 , H04N5/33
摘要： A camera module is disclosed. In accordance with an embodiment of the present invention, the camera module includes a lens unit, an image sensing unit, which converts light received through the lens unit to an electrical signal, and a shield can, which supports the lens unit and is made of a conductive metallic material so as to shield an electromagnetic wave.
摘要翻译：公开了一种相机模块。根据本发明的实施例，相机模块包括透镜单元，将通过透镜单元接收的光转换为电信号的图像感测单元，以及支撑透镜单元并由导电金属材料，以屏蔽电磁波。

2. 发明授权

US08436931B2 Camera module 有权
标题翻译：相机模块
公开(公告)号：US08436931B2
公开(公告)日：2013-05-07
申请号：US12760838
申请日：2010-04-15
申请人： Sang-Jin Lee , Yong-Gu Kim
发明人： Sang-Jin Lee , Yong-Gu Kim
IPC分类号： H04N5/225
CPC分类号： H04N5/2253 , G02B5/208 , H04N5/2254 , H04N5/2257 , H04N5/33
摘要： A camera module is disclosed. In accordance with an embodiment of the present invention, the camera module includes a lens unit, an image sensing unit, which converts light received through the lens unit to an electrical signal, and a shield can, which supports the lens unit and is made of a conductive metallic material so as to shield an electromagnetic wave.
摘要翻译：公开了一种相机模块。根据本发明的实施例，相机模块包括透镜单元，将通过透镜单元接收的光转换为电信号的图像感测单元，以及支撑透镜单元并由导电金属材料，以屏蔽电磁波。

3. 发明授权

US08259195B2 Camera module 有权
标题翻译：相机模块
公开(公告)号：US08259195B2
公开(公告)日：2012-09-04
申请号：US12759241
申请日：2010-04-13
申请人： Yong-Gu Kim , Sang-Jin Lee
发明人： Yong-Gu Kim , Sang-Jin Lee
IPC分类号： H04N5/262
CPC分类号： H04N5/2253 , G02B7/006 , G02B7/04 , H04N5/2254 , H04N5/2257 , H04N5/33
摘要： A camera module is disclosed. In accordance with an embodiment of the present invention, the camera module includes a lens unit, an image sensing unit, which converts light received through the lens unit to an electrical signal, a housing, which supports the lens unit, and a shield can, which supports a lower side of the housing and is made of a conductive metallic material so as to shield an electromagnetic wave.
摘要翻译：公开了一种相机模块。根据本发明的实施例，相机模块包括透镜单元，将通过透镜单元接收的光转换成电信号的图像感测单元，支撑透镜单元的外壳和屏蔽壳，其支撑壳体的下侧，并且由导电金属材料制成以屏蔽电磁波。

4. 发明申请

US20110134306A1 CAMERA MODULE 有权
标题翻译：相机模块
公开(公告)号：US20110134306A1
公开(公告)日：2011-06-09
申请号：US12759241
申请日：2010-04-13
申请人： Yong-Gu KIM , Sang-Jin Lee
发明人： Yong-Gu KIM , Sang-Jin Lee
IPC分类号： H04N5/225
CPC分类号： H04N5/2253 , G02B7/006 , G02B7/04 , H04N5/2254 , H04N5/2257 , H04N5/33
摘要： A camera module is disclosed. In accordance with an embodiment of the present invention, the camera module includes a lens unit, an image sensing unit, which converts light received through the lens unit to an electrical signal, a housing, which supports the lens unit, and a shield can, which supports a lower side of the housing and is made of a conductive metallic material so as to shield an electromagnetic wave.
摘要翻译：公开了一种相机模块。根据本发明的实施例，相机模块包括透镜单元，将通过透镜单元接收的光转换成电信号的图像感测单元，支撑透镜单元的外壳和屏蔽壳，其支撑壳体的下侧，并且由导电金属材料制成以屏蔽电磁波。

5. 发明授权

US09068231B2 Method for screening cancer therapeutic agent using galectin-3, GSK-3β, and fascin-1 有权
标题翻译：使用半乳凝素-3，GSK-3和bgr以及肌成束蛋白-1筛选癌症治疗剂的方法
公开(公告)号：US09068231B2
公开(公告)日：2015-06-30
申请号：US12901337
申请日：2010-10-08
申请人： Kyung-Hee Chun , Seok-Jun Kim , Teak-Chin Cheong , Il-Ju Choi , Yeon Su Lee , Sang-Jin Lee
发明人： Kyung-Hee Chun , Seok-Jun Kim , Teak-Chin Cheong , Il-Ju Choi , Yeon Su Lee , Sang-Jin Lee
IPC分类号： C12Q1/00 , C12Q1/68 , G01N33/53 , G01N33/50 , G01N33/68
CPC分类号： C12Q1/6886 , C12N15/1138 , C12N2310/14 , C12N2320/10 , C12Q2600/136 , G01N33/5011 , G01N33/6845 , G01N2333/4724 , G01N2333/9121 , G01N2440/14 , G01N2500/02 , G01N2500/04
摘要： Disclosed is a method for screening a novel cancer therapeutic agent. The cancer therapeutic agent exhibits down-regulation of galectin-3 and fascin-1 or interferes with the interaction between galectin-3 and GSK-3β.
摘要翻译：公开了一种筛选新型癌症治疗剂的方法。癌症治疗剂显示半乳凝素-3和肌成束蛋白-1的下调或干扰半乳凝素-3和GSK-3与bgr之间的相互作用。

6. 发明授权

US08508017B2 Test device and semiconductor integrated circuit device 有权
标题翻译：测试器件和半导体集成电路器件
公开(公告)号：US08508017B2
公开(公告)日：2013-08-13
申请号：US13067833
申请日：2011-06-29
申请人： Sang-Jin Lee , Gin-Kyu Lee
发明人： Sang-Jin Lee , Gin-Kyu Lee
IPC分类号： H01L21/70 , H01L23/58
CPC分类号： G01R31/2884 , G01R31/025 , G11C11/41 , G11C29/02 , G11C29/24 , G11C29/50008 , H01L22/34
摘要： Test devices and integrated circuits with improved productivity are provided. In accordance with example embodiments, a test device may include a first test region with a first test element and a second test region with a second test element defined on a semiconductor substrate. The first test element may include a pair of first secondary test regions in the semiconductor substrate and a pair of first test gate lines. One of the first test gate lines may overlap one of the first secondary test regions and the other first test gate line may overlap the other first secondary test region. The second test element may include structures corresponding to the first test element except the second test element does not include structures corresponding to the pair of first secondary test regions and the pair of first test gate lines.
摘要翻译：提供了提高生产率的测试设备和集成电路。根据示例实施例，测试设备可以包括具有第一测试元件的第一测试区域和具有限定在半导体衬底上的第二测试元件的第二测试区域。第一测试元件可以包括半导体衬底中的一对第一次级测试区域和一对第一测试栅极线。第一测试栅极线之一可以与第一次级测试区域中的一个重叠，而另一个第一测试栅极线可能与另一个第一次级测试区域重叠。第二测试元件可以包括对应于第一测试元件的结构，除了第二测试元件不包括对应于该对第一次级测试区域对和该对第一测试栅极线对的结构。

7. 发明申请

US20130095364A1 SECONDARY BATTERY 有权
标题翻译：二次电池
公开(公告)号：US20130095364A1
公开(公告)日：2013-04-18
申请号：US13475838
申请日：2012-05-18
申请人： Jun-Sun Yong , Chang-Seob Kim , Sang-Jin Lee , Sae-Weon Roh , Sang-Jin Park
发明人： Jun-Sun Yong , Chang-Seob Kim , Sang-Jin Lee , Sae-Weon Roh , Sang-Jin Park
IPC分类号： H01M2/30 , H01M10/50 , H01M2/02
CPC分类号： H01M2/02 , H01M2/04 , H01M2/0404 , H01M2/0473 , H01M2/06 , H01M2/30 , H01M2/34
摘要： A secondary battery including: an electrode assembly; a case containing the electrode assembly; a cap plate covering an opening of the case; a safety device on the cap plate and including a first lead; and an electrode terminal electrically connecting the electrode assembly and the first lead, the cap plate including a conductive member and an insulating portion, and the first lead is supported on the insulating portion, and the conductive member and the insulating portion being integrally formed.
摘要翻译：一种二次电池，包括：电极组件; 包含电极组件的壳体; 覆盖所述壳体的开口的盖板; 盖板上的安全装置，包括第一引线; 以及电极端子，其电连接所述电极组件和所述第一引线，所述盖板包括导电构件和绝缘部，所述第一引线被支撑在所述绝缘部上，并且所述导电构件和所述绝缘部一体地形成。

8. 发明授权

US08258805B2 Test device and semiconductor integrated circuit device 有权
标题翻译：测试器件和半导体集成电路器件
公开(公告)号：US08258805B2
公开(公告)日：2012-09-04
申请号：US12458535
申请日：2009-07-15
申请人： Sang-Jin Lee , Gin-Kyu Lee
发明人： Sang-Jin Lee , Gin-Kyu Lee
IPC分类号： G01R31/26 , H01L23/58
CPC分类号： H01L22/34 , G11C11/41 , G11C29/50
摘要： A test device and a semiconductor integrated circuit are provided. The test device may include a first test region and a second test region defined on a semiconductor substrate. The first test region may include a first test element and the second region may include a second test element. The first test element may include a pair of first secondary test regions in the semiconductor substrate extending in a first direction. The second test element may include structures corresponding to the first test element except the second test element does not include structures corresponding to the pair of first secondary test regions.
摘要翻译：提供了一种测试装置和半导体集成电路。测试装置可以包括限定在半导体衬底上的第一测试区域和第二测试区域。第一测试区域可以包括第一测试元件，并且第二区域可以包括第二测试元件。第一测试元件可以包括在第一方向上延伸的半导体衬底中的一对第一次级测试区域。第二测试元件可以包括对应于第一测试元件的结构，除了第二测试元件不包括与该对第一次测试区对应的结构。

9. 发明申请

US20110260161A1 Test device and semiconductor integrated circuit device 有权
公开(公告)号：US20110260161A1
公开(公告)日：2011-10-27
申请号：US13067833
申请日：2011-06-29
申请人： Sang-Jin Lee , Gin-Kyu Lee
发明人： Sang-Jin Lee , Gin-Kyu Lee
IPC分类号： H01L23/544
CPC分类号： G01R31/2884 , G01R31/025 , G11C11/41 , G11C29/02 , G11C29/24 , G11C29/50008 , H01L22/34
摘要： Test devices and integrated circuits with improved productivity are provided. In accordance with example embodiments, a test device may include a first test region with a first test element and a second test region with a second test element defined on a semiconductor substrate. The first test element may include a pair of first secondary test regions in the semiconductor substrate and a pair of first test gate lines. One of the first test gate lines may overlap one of the first secondary test regions and the other first test gate line may overlap the other first secondary test region. The second test element may include structures corresponding to the first test element except the second test element does not include structures corresponding to the pair of first secondary test regions and the pair of first test gate lines.

10. 发明授权

US07994811B2 Test device and semiconductor integrated circuit device 有权
标题翻译：测试器件和半导体集成电路器件
公开(公告)号：US07994811B2
公开(公告)日：2011-08-09
申请号：US12385117
申请日：2009-03-31
申请人： Sang-Jin Lee , Gin-Kyu Lee
发明人： Sang-Jin Lee , Gin-Kyu Lee
IPC分类号： G01R31/02
CPC分类号： G01R31/2884 , G01R31/025 , G11C11/41 , G11C29/02 , G11C29/24 , G11C29/50008 , H01L22/34
摘要： Test devices and integrated circuits with improved productivity are provided. In accordance with example embodiments, a test device may include a first test region with a first test element and a second test region with a second test element defined on a semiconductor substrate. The first test element may include a pair of first secondary test regions in the semiconductor substrate and a pair of first test gate lines. One of the first test gate lines may overlap one of the first secondary test regions and the other first test gate line may overlap the other first secondary test region. The second test element may include structures corresponding to the first test element except the second test element does not include structures corresponding to the pair of first secondary test regions and the pair of first test gate lines.
摘要翻译：提供了提高生产率的测试设备和集成电路。根据示例实施例，测试设备可以包括具有第一测试元件的第一测试区域和具有限定在半导体衬底上的第二测试元件的第二测试区域。第一测试元件可以包括半导体衬底中的一对第一次级测试区域和一对第一测试栅极线。第一测试栅极线之一可以与第一次级测试区域中的一个重叠，而另一个第一测试栅极线可能与另一个第一次级测试区域重叠。第二测试元件可以包括对应于第一测试元件的结构，除了第二测试元件不包括对应于该对第一次级测试区域对和该对第一测试栅极线对的结构。

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