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1. 发明申请

US20180322005A1 DEVICE AND SYSTEM INCLUDING ADAPTIVE REPAIR CIRCUIT 审中-公开
公开(公告)号：US20180322005A1
公开(公告)日：2018-11-08
申请号：US16032368
申请日：2018-07-11
申请人： Samsung Electronics Co., Ltd.
发明人： Sang-Hoon SHIN , Hae-Suk LEE , Han-Vit JUNG , Kyo-Min SOHN
IPC分类号： G06F11/07 , G06F11/20 , G06F11/18 , G06F11/14 , G06F11/16
CPC分类号： G06F11/0793 , G06F11/0703 , G06F11/0796 , G06F11/142 , G06F11/1423 , G06F11/1616 , G06F11/18 , G06F11/2002 , G06F11/2017
摘要： A device, system, and/or method includes an internal circuit configured to perform at least one function, an input-output terminal set and a repair circuit. The input-output terminal set includes a plurality of normal input-output terminals connected to an external device via a plurality of normal signal paths and at least one repair input-output terminal selectively connected to the external device via at least one repair signal path. The repair circuit repairs at least one failed signal path included in the normal signal paths based on a mode signal and fail information signal, where the mode signal represents whether to use the repair signal path and the fail information signal represents fail information on the normal signal paths. Using the repair circuit, various systems adopting different repair schemes may be repaired and cost of designing and manufacturing the various systems may be reduced.

2. 发明申请

US20150363258A1 DEVICE AND SYSTEM INCLUDING ADAPTIVE REPAIR CIRCUIT 有权
标题翻译：包括自适应维修电路的设备和系统
公开(公告)号：US20150363258A1
公开(公告)日：2015-12-17
申请号：US14739534
申请日：2015-06-15
申请人： Samsung Electronics Co., Ltd.
发明人： Sang-Hoon SHIN , Hae-Suk LEE , Han-Vit JUNG , Kyo-Min SOHN
IPC分类号： G06F11/07
CPC分类号： G06F11/0793 , G06F11/0703 , G06F11/0796 , G06F11/142 , G06F11/1423 , G06F11/1616 , G06F11/18 , G06F11/2002 , G06F11/2017
摘要： A device, system, and/or method includes an internal circuit configured to perform at least one function, an input-output terminal set and a repair circuit. The input-output terminal set includes a plurality of normal input-output terminals connected to an external device via a plurality of normal signal paths and at least one repair input-output terminal selectively connected to the external device via at least one repair signal path. The repair circuit repairs at least one failed signal path included in the normal signal paths based on a mode signal and fail information signal, where the mode signal represents whether to use the repair signal path and the fail information signal represents fail information on the normal signal paths. Using the repair circuit, various systems adopting different repair schemes may be repaired and cost of designing and manufacturing the various systems may be reduced.
摘要翻译：一种设备，系统和/或方法包括被配置为执行至少一个功能的内部电路，输入 - 输出端子组和修复电路。输入输出端子组包括经由多个正常信号路径连接到外部设备的多个正常输入 - 输出端子和经由至少一个修复信号路径有选择地连接到外部设备的至少一个修复输入 - 输出端子。修复电路基于模式信号和故障信息信号修复包括在正常信号路径中的至少一个故障信号路径，其中模式信号表示是否使用修复信号路径，并且故障信息信号表示正常信号的故障信息路径。使用维修电路，可以修复采用不同维修方案的各种系统，并且可以降低各种系统的设计和制造成本。

3. 发明申请

US20170315860A1 DEVICE AND SYSTEM INCLUDING ADAPTIVE REPAIR CIRCUIT 审中-公开
公开(公告)号：US20170315860A1
公开(公告)日：2017-11-02
申请号：US15650096
申请日：2017-07-14
申请人： Samsung Electronics Co., Ltd.
发明人： Sang-Hoon SHIN , Hae-Suk LEE , Han-Vit JUNG , Kyo-Min SOHN
IPC分类号： G06F11/07 , G06F11/20 , G06F11/18 , G06F11/16 , G06F11/14
CPC分类号： G06F11/0793 , G06F11/0703 , G06F11/0796 , G06F11/142 , G06F11/1423 , G06F11/1616 , G06F11/18 , G06F11/2002 , G06F11/2017
摘要： A device, system, and/or method includes an internal circuit configured to perform at least one function, an input-output terminal set and a repair circuit. The input-output terminal set includes a plurality of normal input-output terminals connected to an external device via a plurality of normal signal paths and at least one repair input-output terminal selectively connected to the external device via at least one repair signal path. The repair circuit repairs at least one failed signal path included in the normal signal paths based on a mode signal and fail information signal, where the mode signal represents whether to use the repair signal path and the fail information signal represents fail information on the normal signal paths. Using the repair circuit, various systems adopting different repair schemes may be repaired and cost of designing and manufacturing the various systems may be reduced.

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