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1. 发明申请

US20230010259A1 WAVELENGTH MULTIPLEXING/DEMULTIPLEXING DEVICE 有权
公开(公告)号：US20230010259A1
公开(公告)日：2023-01-12
申请号：US17852576
申请日：2022-06-29
申请人： SUMITOMO ELECTRIC INDUSTRIES, LTD.
发明人： Masato TANAKA , Eiichiro YAMADA , Hidehisa TAZAWA , Osamu SHIMAKAWA
IPC分类号： H04J14/02 , G02B6/293
摘要： A wavelength multiplexing/demultiplexing device includes a first collimator, an M number of second collimators, and the M number of filters. The filters have transmission wavelength bands differing from each other. An optical path connecting the first collimator and the second collimator in first order to each other passes through the filter in first order. An optical path connecting a surface opposite to a multilayer film of the filter in mth (m=1, . . . , M) order and the second collimator in (m+1)th order to each other passes through the filter in (m+1)th order. The filter in (m+1)th order is optically coupled on the surface opposite to the multilayer film to the filter in mth order and is optically coupled on a surface of the multilayer film to the second collimator in (m+1)th order.

2. 发明申请

US20210389525A1 OPTICAL MODULE AND METHOD FOR MANUFACTURING OPTICAL MODULE 有权
公开(公告)号：US20210389525A1
公开(公告)日：2021-12-16
申请号：US17284376
申请日：2019-10-10
申请人： SUMITOMO ELECTRIC INDUSTRIES, LTD.
发明人： Eiichiro YAMADA , Takafumi OHTSUKA
IPC分类号： G02B6/255 , G02B6/02
摘要： An optical module according to an embodiment includes a first optical component and a second optical component including a multicore fiber (MCF) and a spatial joining part. The first optical component includes a first uncoupled MCF having small optical coupling between cores and a first coupled MCF having a mode field diameter (MFD) larger than a MFD of the first uncoupled MCF. The second optical component includes a second uncoupled MCF having small optical coupling between cores and a second coupled MCF having a MFD larger than a MFD of the second uncoupled MCF. In the first coupled MCF and the second coupled MCF, crosstalk is periodically produced along the length direction of an MCF, and the total of the length of the first coupled MCF and the length of the second coupled MCF is a length L in which crosstalk is suppressed.

3. 发明公开

US20230168432A1 WAVELENGTH MULTIPLEXER/DEMULTIPLEXER 审中-公开
公开(公告)号：US20230168432A1
公开(公告)日：2023-06-01
申请号：US17983602
申请日：2022-11-09
申请人： SUMITOMO ELECTRIC INDUSTRIES, LTD.
发明人： Masato TANAKA , Hidehisa TAZAWA , Eiichiro YAMADA , Masato FURUKAWA
IPC分类号： G02B6/293 , H04Q11/00
CPC分类号： G02B6/29365 , G02B6/2938 , H04Q11/0005 , H04Q2011/0009
摘要： A wavelength multiplexer/demultiplexer includes a first collimator, M-number of second collimators, M-number of wavelength selective filters, and a base plate. Each of the wavelength selective filters includes a substrate having optical transparency and a multilayer film. The substrate includes a first main surface and a second main surface, and a bottom surface facing a placement surface of the base plate. The multilayer film is formed on the first main surface and transmits an optical signal in a specific transmission wavelength band and reflect an optical signal in a wavelength band other than the specific transmission wavelength band.
Each of the wavelength selective filters is fixed to the placement surface by a cured adhesive. The cured adhesive is in contact with the bottom surface and is in non-contact with the multilayer film in at least one wavelength selective filter among the wavelength selective filters.

4. 发明申请

US20140319351A1 INSPECTION APPARATUS AND AN INSPECTION METHOD 审中-公开
标题翻译：检查装置和检查方法
公开(公告)号：US20140319351A1
公开(公告)日：2014-10-30
申请号：US14260063
申请日：2014-04-23
申请人： Sumitomo Electric Industries, Ltd.
发明人： Eiichiro YAMADA , Akinori KIMURA
IPC分类号： G01J1/42 , G01N21/88
CPC分类号： G01N21/8901 , G01N21/359
摘要： Detection of articles of different kind or defective quality can be accomplished with higher accuracy. With an inspection apparatus 100 and an inspection method using the inspection apparatus 100, in an analyzing unit 30, first, target pixels having imaged inspection objects are extracted from spectral data of each pixel acquired in a detecting unit 20, and the spectral data of plural target pixels which have imaged the same inspection object are grouped beforehand, and the classification of inspection objects is performed using the thus grouped spectra of the target objects. Therefore, the classification of inspection objects is done using the spectral data of a plurality of target pixels which have imaged the same inspection object. This enables reducing the possibility of incorrect judgment due to a noise contained in a specific pixel. Thus, the detection of articles of different kind or defective quality can be accomplished with higher accuracy.
摘要翻译：可以更高精度地检测不同种类或缺陷品质的物品。使用检查装置100和使用检查装置100的检查方法，在分析单元30中，首先从检测单元20中获取的每个像素的频谱数据中提取具有成像检查对象的目标像素，并且将多个频谱数据已经成像了相同检查对象的目标像素被预先分组，并且使用目标对象的这样分组的光谱来执行检查对象的分类。因此，使用对相同检查对象成像的多个目标像素的光谱数据进行检查对象的分类。这使得能够减少由于特定像素中包含的噪声导致的错误判断的可能性。因此，可以以更高的精度实现不同种类的物品的检测或缺陷质量的检测。

5. 发明申请

US20130100320A1 IMAGING APPARATUS AND IMAGING METHOD 审中-公开
标题翻译：成像装置和成像方法
公开(公告)号：US20130100320A1
公开(公告)日：2013-04-25
申请号：US13658185
申请日：2012-10-23
申请人： Sumitomo Electric Industries, Ltd.
发明人： Eiichiro YAMADA , Tatsuhiko SAITOH
IPC分类号： H04N5/217
CPC分类号： H04N5/3675 , H04N5/367
摘要： An imaging apparatus includes a control unit, an imaging device, a memory, and a correction unit. The memory stores information for specifying a pixel as a defect pixel among the arrayed pixels if a variation in image data of the pixel in a period is a predetermined value or larger, the image data of each pixel being output from the imaging device when light with a constant first light-quantity level is incident on each pixel of the imaging device for the period. The correction unit obtains data for the defect pixel based on image data of a good pixel that is adjacent to the defect pixel among the arrayed pixels.
摘要翻译：成像装置包括控制单元，成像装置，存储器和校正单元。如果周期中的像素的图像数据的变化是预定值或更大，则存储器将用于指定像素的像素指定为排列像素中的缺陷像素的信息，当来自成像装置的光与在该期间，恒定的第一光量水平入射到成像装置的每个像素上。校正单元基于与排列像素中的缺陷像素相邻的良好像素的图像数据，获得缺陷像素的数据。

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