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    • 8. 发明授权
    • Finding optimal read thresholds and related voltages for solid state memory
    • 找到固态存储器的最佳读取阈值和相关电压
    • US09305658B2
    • 2016-04-05
    • US14546545
    • 2014-11-18
    • SK hynix memory solutions inc.
    • Xiangyu TangLingqi ZengJason BelloradoFrederick K. H. LeeArunkumar Subramanian
    • G11C11/34G11C16/26
    • G11C16/26
    • A read is performed using a first iteration of a read threshold voltage that is set to a default voltage to obtain a first characteristic. A second iteration of the read threshold voltage is generated using the default voltage and an offset. A read is performed using the second iteration of the read threshold voltage to obtain a second characteristic. A third iteration of the read threshold voltage is generated using the first and second characteristics. A read is performed using the third iteration of the read threshold voltage to obtain a third characteristic. It is determined if the third characteristic is one of the two characteristics closest to a stored characteristic. If so, a fourth iteration of the read threshold voltage is generated using the two closest characteristics.
    • 使用被设置为默认电压的读取阈值电压的第一次迭代来执行读取以获得第一特性。 使用默认电压和偏移量产生读取阈值电压的第二次迭代。 使用读取阈值电压的第二次迭代执行读取以获得第二特性。 使用第一和第二特性产生读取阈值电压的第三次迭代。 使用读取阈值电压的第三次迭代执行读取以获得第三特性。 确定第三特性是否是最接近存储特性的两个特征之一。 如果是这样,则使用两个最接近的特征产生读取阈值电压的第四次迭代。