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    • 9. 发明授权
    • Near UV light emitting device
    • 近UV发光装置
    • US09312447B2
    • 2016-04-12
    • US14526110
    • 2014-10-28
    • SEOUL VIOSYS CO., LTD.
    • Chang Suk HanHwa Mok KimHyo Shik ChoiMi So KoA Ram Cha Lee
    • H01L33/06H01L33/32H01L33/04H01L33/14
    • H01L33/32H01L33/04H01L33/06H01L33/14
    • Disclosed is a near UV light emitting device. The light emitting device includes an n-type contact layer, a p-type contact layer, an active area of a multi-quantum well structure disposed between the n-type contact layer and the p-type contact layer, and at least one electron control layer disposed between the n-type contact layer and the active area. Each of the n-type contact layer and the p-type contact layer includes an AlInGaN or AlGaN layer, and the electron control layer is formed of AlInGaN or AlGaN. In addition, the electron control layer contains a larger amount of Al than adjacent layers to obstruct flow of electrons moving into the active area. Accordingly, electron mobility is deteriorated, thereby improving recombination rate of electrons and holes in the active area.
    • 公开了一种近紫外发光装置。 发光器件包括n型接触层,p型接触层,设置在n型接触层和p型接触层之间的多量子阱结构的有源区,以及至少一个电子 控制层设置在n型接触层和有源区之间。 n型接触层和p型接触层中的每一个包括AlInGaN或AlGaN层,并且电子控制层由AlInGaN或AlGaN形成。 此外,电子控制层包含比相邻层更大量的Al,以阻止电子流入有源区域。 因此,电子迁移率恶化,从而提高有源区域中的电子和空穴的复合率。