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    • 10. 发明授权
    • Memory device and method of operating the same
    • 存储器件及其操作方法
    • US09530494B2
    • 2016-12-27
    • US14697244
    • 2015-04-27
    • SAMSUNG ELECTRONICS CO., LTD.
    • Yong-Kyu LeeDae-Seok ByeonYeong-Taek LeeChi-Weon YoonHyun-Kook ParkHyo-Jin Kwon
    • G11C16/10G11C13/00
    • G11C13/0069G11C13/0033G11C13/0035G11C16/10G11C2013/0092
    • A method of operating a memory device, which includes of memory cells respectively arranged in regions where first signal lines and second lines cross each other, includes determining a plurality of pulses so that each of the plurality of pulses that are sequentially applied to a selected memory cell among the plurality of memory cells is changed according to a number of times of executing programming loops. In response to the change of the plurality of pulses, at least one of a first inhibit voltage and a second inhibit voltage is determined so that a voltage level of at least one of the first and second inhibit voltages that are respectively applied to unselected first and second signal lines connected to unselected memory cells among the plurality of memory cells is changed according to the number of times of executing the programming loops.
    • 一种操作存储器件的方法,所述存储器件包括分别布置在第一信号线和第二线彼此交叉的区域中的存储器单元,包括确定多个脉冲,使得多个脉冲中的每一个顺序地施加到选择的存储器 根据执行编程循环的次数来改变多个存储单元之间的单元。 响应于多个脉冲的变化,确定第一禁止电压和第二禁止电压中的至少一个,使得分别施加到未选择的第一和第二禁止电压中的至少一个的电压电平, 连接到多个存储单元之间的未选择的存储单元的第二信号线根据执行编程循环的次数而改变。