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    • 2. 发明申请
    • APPARATUS AND METHOD FOR MEASURING TEMPERATURE
    • 用于测量温度的装置和方法
    • US20140119403A1
    • 2014-05-01
    • US13759555
    • 2013-02-05
    • SAMSUNG ELECTRO-MECHANICS CO., LTD.
    • Yo Sub MOON
    • G01K11/26
    • G01K7/32
    • There are provided an apparatus and a method for measuring a temperature. The apparatus includes: a temperature sensor measuring a temperature and providing the measured temperature; a temperature comparing unit comparing the measured temperature with a preset reference temperature and providing a comparison result signal; a quartz oscillating unit generating an oscillating frequency signal according to temperature; a frequency counting unit counting a frequency of the oscillating frequency signal and providing a frequency count value; and a signal processing unit determining a temperature according to the comparison result signal and the frequency count value.
    • 提供了一种用于测量温度的装置和方法。 该装置包括:测量温度并提供测量温度的温度传感器; 温度比较单元将测量的温度与预设的参考温度进行比较并提供比较结果信号; 石英振荡单元,根据温度产生振荡频率信号; 频率计数单元,对振荡频率信号的频率进行计数并提供频率计数值; 以及信号处理单元,根据比较结果信号和频率计数值确定温度。