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    • 5. 发明申请
    • Method evaluating threshold level of a data cell in a memory device
    • 方法评估存储器件中数据单元的阈值水平
    • US20060271323A1
    • 2006-11-30
    • US11139172
    • 2005-05-28
    • David BaldwinEric BlackallJoseph DevoreRoss Teggatz
    • David BaldwinEric BlackallJoseph DevoreRoss Teggatz
    • G06F19/00
    • G11C16/34
    • A method evaluating threshold of a data cell in a memory device including a programming locus coupled with the data cell for receiving a programming signal setting a stored signal level in the data cell and responding to a read signal to indicate the stored signal at a read locus; includes the steps of: (a) in no particular order: (1) selecting a test threshold signal; and (2) setting a read signal at a non-read level; (b) applying the test threshold signal to the programming locus; (c) cycling the read signal between a read level and a non-read level while applying the test threshold signal to the programming locus to present at least two test signals at the read locus when the read signal is at the read level; and (d) while cycling, observing whether the at least two test signals manifest a difference greater than a predetermined amount.
    • 一种评估存储器件中的数据单元的阈值的方法,包括与所述数据单元耦合的编程轨迹,用于接收在所述数据单元中设置存储的信号电平的编程信号,并且响应于读取信号以指示所读取的位置处存储的信号 ; 包括以下步骤:(a)没有特定的顺序:(1)选择测试阈值信号; 和(2)以非读取级别设置读取信号; (b)将测试阈值信号应用于编程轨迹; (c)在读取电平和非读取电平之间循环读取信号,同时当读取信号处于读取电平时,将测试阈值信号施加到编程轨迹,以在读取轨迹处呈现至少两个测试信号; 和(d)循环时,观察至少两个测试信号是否表现出大于预定量的差。
    • 7. 发明申请
    • Method Evaluating Threshold Level of a Data Cell in a Memory Device
    • 方法评估存储器件中数据单元的阈值级别
    • US20070240026A1
    • 2007-10-11
    • US11755891
    • 2007-05-31
    • David BaldwinEric BlackallJoseph DevoreRoss Teggatz
    • David BaldwinEric BlackallJoseph DevoreRoss Teggatz
    • G01R31/28
    • G11C16/34
    • A method evaluating threshold of a data cell in a memory device including a programming locus coupled with the data cell for receiving a programming signal setting a stored signal level in the data cell and responding to a read signal to indicate the stored signal at a read locus; includes the steps of: (a) in no particular order: (1) selecting a test threshold signal; and (2) setting a read signal at a non-read level; (b) applying the test threshold signal to the programming locus; (c) cycling the read signal between a read level and a non-read level while applying the test threshold signal to the programming locus to present at least two test signals at the read locus when the read signal is at the read level; and (d) while cycling, observing whether the at least two test signals manifest a difference greater than a predetermined amount.
    • 一种评估存储器件中的数据单元的阈值的方法,包括与所述数据单元耦合的编程轨迹,用于接收在所述数据单元中设置存储的信号电平的编程信号,并且响应于读取信号以指示所读取的位置处存储的信号 ; 包括以下步骤:(a)没有特定的顺序:(1)选择测试阈值信号; 和(2)以非读取级别设置读取信号; (b)将测试阈值信号应用于编程轨迹; (c)在读取电平和非读取电平之间循环读取信号,同时当读取信号处于读取电平时,将测试阈值信号施加到编程轨迹,以在读取轨迹处呈现至少两个测试信号; 和(d)循环时,观察至少两个测试信号是否表现出大于预定量的差。
    • 8. 发明申请
    • Low cost integrated MEMS hybrid
    • 低成本集成MEMS混合
    • US20050132803A1
    • 2005-06-23
    • US10811101
    • 2004-03-26
    • David BaldwinEric BlackallRoss Teggatz
    • David BaldwinEric BlackallRoss Teggatz
    • G01P15/125
    • G01P15/125G01P2015/0831
    • The present invention is directed to MEMS-based accelerometer comprising semiconductor substrate and a generally hollow shell having an open end and a closed end, wherein the open end of the shell is generally bonded to the top surface of the substrate. The shell comprises a plurality of capacitor plates electrically connected to a respective plurality of capacitor electrodes associated with the shell, wherein the shell further comprises a common electrode, and wherein the plurality of capacitor electrodes and the common electrode are electrically connected to the substrate via the bonding of the open end of the shell to the substrate. The accelerometer further comprises a sensing element comprising an electrically conductive torsion bar coupled to the shell, defining an axis of rotation. A proof mass and a plurality of electrically conductive paddles are coupled to the torsion bar, wherein a movement of the proof mass is operable to cause a rotation of the paddles about the axis of rotation, therein changing a capacitance between the plurality of paddles and the respective plurality of capacitor plates.
    • 本发明涉及基于MEMS的加速度计,其包括半导体衬底和具有开口端和封闭端的大致中空的壳体,其中壳体的开口端通常结合到衬底的顶表面。 壳体包括电连接到与壳体相关联的相应多个电容器电极的多个电容器板,其中壳体还包括公共电极,并且其中多个电容器电极和公共电极经由 将壳体的开口端粘合到基底上。 加速度计进一步包括感测元件,其包括耦合到壳体的导电扭杆,限定旋转轴线。 检测质量块和多个导电桨叶耦合到扭杆,其中检测质量块的运动可操作以使得桨叶围绕旋转轴线旋转,其中改变多个桨叶之间的电容和 各个电容器板。