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1. 发明申请

US20070126448A1 System-on-a-chip pipeline tester and method 有权
标题翻译：片上系统管线测试仪及方法
公开(公告)号：US20070126448A1
公开(公告)日：2007-06-07
申请号：US11294712
申请日：2005-12-05
申请人： Ronald Hubscher , Jason Smith , Frank Hamlin
发明人： Ronald Hubscher , Jason Smith , Frank Hamlin
IPC分类号： G01R31/02
CPC分类号： G01R31/2886 , G01R31/01
摘要： A pipeline tester is disclosed that is capable of testing systems-on-a-chip (SOCs) or Devices Under Test (DUTs) in pipeline fashion. The tester provides faster, more economical testing of such SOCs and DUTs, which are loaded sequentially into the tester. A plurality of underlying test stations are disposed in the tester. Above the test stations are disposed corresponding test fixtures which are configured to receive moveable test beds therein. The test beds are mechanically and electrically connected to the underlying test stations. Loaded within each test bed is an SOC or DUT. One or more electrical or electronic tests are performed on each SOC or DUT while the SOC or DUT is loaded in a test bed positioned above a test station. Once the test has been completed, the test bed is moved to another test station, where another electrical or electronic test is performed. Electrical or electronic tests may be performed in parallel on different DUTs or SOCs loaded into different test beds.
摘要翻译：公开了一种能够以管道方式测试片上系统（SOC）或被测设备（DUT）的流水线测试仪。测试仪可以更快，更经济地测试这些SOC和DUT，这些测试器依次加载到测试仪中。在测试仪中设置多个底层测试站。在测试台上方设置相应的测试夹具，其被配置为在其中接收可移动测试床。测试台机械和电气连接到底层测试站。在每个测试台内加载的是SOC或DUT。对SOC或DUT进行一个或多个电气或电子测试，同时将SOC或DUT装载在位于测试台上方的测试台中。一旦测试完成，测试台移动到另一个测试站，进行另一个电子或电子测试。电气或电子测试可以在不同的DUT或加载到不同测试台的SOC中并行执行。

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