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1. 发明授权

US08136389B2 Probe tip assembly for scanning probe microscopes 失效
标题翻译：用于扫描探针显微镜的探针头组件
公开(公告)号：US08136389B2
公开(公告)日：2012-03-20
申请号：US11930439
申请日：2007-10-31
申请人： Richard Paul Tella , George M. Clifford, Jr. , Richard R. Workman , Storrs Townsend Hoen , David Patrick Fromm
发明人： Richard Paul Tella , George M. Clifford, Jr. , Richard R. Workman , Storrs Townsend Hoen , David Patrick Fromm
IPC分类号： H01J37/00
CPC分类号： G01Q70/02
摘要： A probe assembly for a scanning probe microscope (SPM), a cartridge for a probe assembly for an SPM, and a method of attaching a probe tip to an SPM are described.
摘要翻译：描述了用于扫描探针显微镜（SPM）的探针组件，用于SPM的探针组件的盒以及将探针尖附接到SPM的方法。

2. 发明申请

US20090107266A1 PROBE TIP ASSEMBLY FOR SCANNING PROBE MICROSCOPES 失效
标题翻译：用于扫描探针显微镜的探测头组件
公开(公告)号：US20090107266A1
公开(公告)日：2009-04-30
申请号：US11930439
申请日：2007-10-31
申请人： Richard Paul Tella , George M. Clifford, JR. , Richard R. Workman , Storrs Townsend Hoen , David Patrick Fromm
发明人： Richard Paul Tella , George M. Clifford, JR. , Richard R. Workman , Storrs Townsend Hoen , David Patrick Fromm
IPC分类号： G01D11/30
CPC分类号： G01Q70/02
摘要： A probe assembly for a scanning probe microscope (SPM), a cartridge for a probe assembly for an SPM, and a method of attaching a probe tip to an SPM are described.
摘要翻译：描述了用于扫描探针显微镜（SPM）的探针组件，用于SPM的探针组件的盒以及将探针尖附接到SPM的方法。

3. 发明申请

US20080142708A1 SYSTEM FOR SCANNING PROBE MICROSCOPE INPUT DEVICE 有权
标题翻译：扫描探针输入装置系统
公开(公告)号：US20080142708A1
公开(公告)日：2008-06-19
申请号：US11555220
申请日：2006-10-31
申请人： Richard K. Workman , David Patrick Fromm
发明人： Richard K. Workman , David Patrick Fromm
IPC分类号： G01N23/00
CPC分类号： G01Q30/04
摘要： In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.
摘要翻译：根据本发明，计算机指向装置与SPM系统接口以提供SPM的实时控制并提高易用性。

4. 发明授权

US07659509B2 System for scanning probe microscope input device 有权
标题翻译：扫描探针显微镜输入装置系统
公开(公告)号：US07659509B2
公开(公告)日：2010-02-09
申请号：US11555220
申请日：2006-10-31
申请人： Richard K. Workman , David Patrick Fromm
发明人： Richard K. Workman , David Patrick Fromm
IPC分类号： G01N23/00 , G21K7/00 , H01J3/14
CPC分类号： G01Q30/04
摘要： In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.
摘要翻译：根据本发明，计算机指向装置与SPM系统接口以提供SPM的实时控制并提高易用性。

5. 发明申请

US20090107222A1 Scanning Probe Microscope with Improved Scanning Speed 审中-公开
标题翻译：扫描探针显微镜具有改进的扫描速度
公开(公告)号：US20090107222A1
公开(公告)日：2009-04-30
申请号：US11926342
申请日：2007-10-29
申请人： Daniel Yves Abramovitch , David Patrick Fromm , Dale Schroeder
发明人： Daniel Yves Abramovitch , David Patrick Fromm , Dale Schroeder
IPC分类号： G01B5/28
CPC分类号： G01Q60/32 , G01Q10/06
摘要： A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electro-mechanical actuator, and a controller. The probe has a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The electro-mechanical actuator moves the sample relative to the probe tip in three dimensions. The controller maintains the probe tip in a fixed relationship with respect to the sample in one of the dimensions, and causes the electro-mechanical actuator to move the sample relative to the probe tip in the other two of the dimensions along a smooth path to generate an image of an object in the sample in an area sampled along the smooth path.
摘要翻译：公开了扫描探针显微镜及其使用方法。扫描探针显微镜包括探针，机电致动器和控制器。探针具有响应于尖端和样品的局部特征之间的相互作用而移动的尖端。机电致动器在三个维度上相对于探针尖端移动样品。控制器将探针尖端保持在与其中一个尺寸相对于样品的固定关系中，并且使得机电致动器沿着平滑路径在另外两个尺寸中相对于探针尖端移动样品以产生沿着平滑路径采样的区域中的样本中的对象的图像。

6. 发明申请

US20090139313A1 Time-Tagged Data for Atomic Force Microscopy 审中-公开
标题翻译：用于原子力显微镜的时间标签数据
公开(公告)号：US20090139313A1
公开(公告)日：2009-06-04
申请号：US11949578
申请日：2007-12-03
申请人： David Patrick Fromm , Richard Kenton Workman , John Paul Flowers
发明人： David Patrick Fromm , Richard Kenton Workman , John Paul Flowers
IPC分类号： G01B5/28
CPC分类号： G01Q10/06
摘要： A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electromechanical actuator that moves the sample relative to the probe, an external interface, and a controller. The probe has a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The external interface provides a connection between the scanning probe microscope and a device external to the scanning probe microscope. The controller records scanning probe microscope data measurements, each scanning probe microscope data measurement including a location of the probe in the three dimensions and a label that uniquely identifies that measurement and allows that measurement to be correlated with data generated by a device that is external to the scanning probe microscope. The unique label could include the time at which the data measurement was made.
摘要翻译：公开了扫描探针显微镜及其使用方法。扫描探针显微镜包括探针，相对于探针移动样品的机电致动器，外部接口和控制器。探针具有响应于尖端和样品的局部特征之间的相互作用而移动的尖端。外部接口提供扫描探针显微镜与扫描探针显微镜外部的设备之间的连接。控制器记录扫描探针显微镜数据测量，每个扫描探针显微镜数据测量包括三维探针的位置和唯一标识该测量的标签，并允许该测量与由外部设备外部的设备产生的数据相关扫描探针显微镜。唯一的标签可能包括进行数据测量的时间。

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