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1. 发明授权

US08766192B2 Method for inspecting a photovoltaic substrate 有权
标题翻译：检查光伏基板的方法
公开(公告)号：US08766192B2
公开(公告)日：2014-07-01
申请号：US12916694
申请日：2010-11-01
申请人： Ran Shi Wang , Jiangwen Deng , Chung Yan Lau
发明人： Ran Shi Wang , Jiangwen Deng , Chung Yan Lau
IPC分类号： G01J5/02
CPC分类号： G01N21/9505 , G01N21/359 , G01N25/72
摘要： A method for inspecting a substrate having intrinsic heterogeneous patterns for the presence of cracks comprises the steps of providing an optical device and front-side lighting on a first side of the substrate and providing near-infrared lighting on a second side of the substrate opposite to the first side. The near-infrared lighting is operable to penetrate the substrate so as to be detectable by the optical device through the substrate. One or more images are obtained by illuminating the substrate with the front-side lighting and/or the near-infrared lighting from the second side. The one or more images are thereafter processed to distinguish between the heterogeneous patterns on the substrate and any cracks present on the substrate.
摘要翻译：用于检查具有固有异质图案的衬底以存在裂缝的方法包括以下步骤：在衬底的第一侧上提供光学器件和前侧照明，并在衬底的与第二侧相对的第二侧上提供近红外线照明第一面。近红外照明可操作地穿透基板，以便可以通过基板通过光学装置检测。利用来自第二面的前侧照明和/或近红外照明照射基板来获得一个或多个图像。此后处理一个或多个图像以区分基底上的异质图案和存在于基底上的任何裂纹。

2. 发明授权

US08610902B2 Apparatus and method for inspecting an object with increased depth of field 有权
标题翻译：用于检查具有增加景深的物体的装置和方法
公开(公告)号：US08610902B2
公开(公告)日：2013-12-17
申请号：US13151436
申请日：2011-06-02
申请人： Wing Hong Leung , Jiangwen Deng , Zhuanyun Zhang
发明人： Wing Hong Leung , Jiangwen Deng , Zhuanyun Zhang
IPC分类号： G01B11/24
CPC分类号： G01B11/0608
摘要： An apparatus for measuring a height of an object plane or multiple points on an object is disclosed. The apparatus comprises an imaging system having a focal plane passing through a focal point of the imaging system, wherein the focal plane of the imaging system is tilted at an oblique angle with respect to the object plane such that only a small portion of the object is in focus. Alternatively, the focal plane is tilted at an oblique angle with respect to a scanning direction of the imaging system during relative movement between the imaging system and the object.
摘要翻译：公开了一种用于测量物体的高度或物体上的多个点的装置。该装置包括具有通过成像系统的焦点的焦平面的成像系统，其中成像系统的焦平面相对于物平面倾斜倾斜，使得只有一小部分物体是焦点。或者，在成像系统和物体之间的相对运动期间，焦平面相对于成像系统的扫描方向以倾斜角倾斜。

3. 发明授权

US08654352B1 Chromatic confocal scanning apparatus 有权
标题翻译：色共焦扫描仪
公开(公告)号：US08654352B1
公开(公告)日：2014-02-18
申请号：US13569413
申请日：2012-08-08
申请人： Jiangwen Deng , Zhuanyun Zhang , Fang Han Chen , Wui Fung Sze
发明人： Jiangwen Deng , Zhuanyun Zhang , Fang Han Chen , Wui Fung Sze
IPC分类号： G01B11/24
CPC分类号： G01B11/24 , G01B2210/50
摘要： A chromatic confocal scanning apparatus comprises a light source for producing light rays comprising a plurality of wavelengths, a first screen having an open elongated slit which allows a strip of light rays produced from the light source to pass through the slit and a cylindrical objective lens both to converge the light rays onto an object surface that is to be measured, and to image light rays reflected from the object surface. An intermediate cylindrical lens set converges a strip of light rays imaged from the cylindrical objective lens to pass through an open elongated slit comprised in a second screen, and a color sensor receives light rays which have passed through the slit of the second screen for determining a plurality of wavelengths of the said strip of light rays, to thereby construct a height profile of at least a portion of the object surface.
摘要翻译：彩色共焦扫描装置包括用于产生包括多个波长的光线的光源，具有开口细长狭缝的第一屏幕，其允许从光源产生的光束穿过狭缝和圆柱形物镜两者以将光线会聚到要测量的物体表面上，并且对从物体表面反射的光线进行成像。中间圆柱形透镜组会聚从圆柱形物镜成像的光线条，以穿过包含在第二屏幕中的开放细长狭缝，并且彩色传感器接收穿过第二屏幕的狭缝的光线，以确定所述光线条的多个波长，从而构成物体表面的至少一部分的高度分布。

4. 发明授权

US10659699B2 Apparatus and method for reconstructing a three-dimensional profile of a target surface 有权
公开(公告)号：US10659699B2
公开(公告)日：2020-05-19
申请号：US14326630
申请日：2014-07-09
申请人： Jiangwen Deng , Wui Fung Sze , Qi Lang
发明人： Jiangwen Deng , Wui Fung Sze , Qi Lang
IPC分类号： H04N5/235 , G01B11/25 , G06T7/521
摘要： Disclosed is an apparatus for reconstructing a three-dimensional profile of a target surface of an object. The apparatus comprises: i) a lighting apparatus having at least two modes of illumination to illuminate the target surface, wherein a first mode of illumination produces a pattern onto the target surface and a second mode of illumination illuminates every part of the target surface; ii) an imaging device for capturing respective images of the target surface upon a sequential activation of the first and second modes of illumination of the target surface by the lighting apparatus; and iii) a processor for reconstructing the three-dimensional profile of the target surface based on the images of the target surface as captured by the imaging device. A method of reconstructing a 3D profile of a target surface of an object is also disclosed.

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