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    • 2. 发明授权
    • Local plasma confinement and pressure control arrangement and methods thereof
    • 局部血浆限制和压力控制布置及其方法
    • US08900398B2
    • 2014-12-02
    • US12872982
    • 2010-08-31
    • Rajinder DhindsaMichael C. KelloggBabak KadkhodayanAndrew D. Bailey, III
    • Rajinder DhindsaMichael C. KelloggBabak KadkhodayanAndrew D. Bailey, III
    • H01L21/3065H01J37/32
    • H01J37/32642H01J37/32623
    • An arrangement for performing pressure control within a processing chamber substrate processing is provided. The arrangement includes a peripheral ring configured at least for surrounding a confined chamber volume that is configured for sustaining a plasma for etching the substrate during substrate processing. The peripheral ring includes a plurality of slots that is configured at least for exhausting processed byproduct gas from the confined chamber volume during substrate processing. The arrangement also includes a conductive control ring that is positioned next to the peripheral ring and is configured to include plurality of slots. The pressure control is achieved by moving the conductive control ring relative to the peripheral ring such that a first slot on the peripheral ring and a second slot on the conductive control ring are offset with respect to one another in a range of zero offset to full offset.
    • 提供了一种用于在处理室衬底处理中执行压力控制的装置。 该装置包括至少围绕限制室容积配置的外围环,该限定室容积被配置为在衬底处理期间维持用于刻蚀衬底的等离子体。 周边环包括多个狭槽,其被构造成至少在衬底处理期间从受限腔体积中排出经处理的副产物气体。 该布置还包括导电控制环,该导电控制环位于外围环旁边并且被配置为包括多个狭槽。 通过相对于外围环移动导电控制环来实现压力控制,使得外围环上的第一槽和导电控制环上的第二槽相对于彼此在零偏移到全偏移的范围内彼此偏移 。
    • 10. 发明授权
    • Dual plasma volume processing apparatus for neutral/ion flux control
    • 用于中性/离子通量控制的双等离子体体积处理装置
    • US09184028B2
    • 2015-11-10
    • US12850559
    • 2010-08-04
    • Rajinder DhindsaAlexei MarakhatnovAndrew D. Bailey, III
    • Rajinder DhindsaAlexei MarakhatnovAndrew D. Bailey, III
    • C23F1/00H01L21/306H01J37/32
    • H01J37/32449H01J37/32091H01J37/32697H01J37/32715H01J37/32834H01L21/67069H01L21/67259H01L21/6831H01L22/26
    • A semiconductor wafer processing apparatus includes a first electrode exposed to a first plasma generation volume, a second electrode exposed to a second plasma generation volume, and a gas distribution unit disposed between the first and second plasma generation volumes. The first electrode is defined to transmit radiofrequency (RF) power to the first plasma generation volume, and distribute a first plasma process gas to the first plasma generation volume. The second electrode is defined to transmit RF power to the second plasma generation volume, and hold a substrate in exposure to the second plasma generation volume. The gas distribution unit includes an arrangement of through-holes defined to fluidly connect the first plasma generation volume to the second plasma generation volume. The gas distribution unit also includes an arrangement of gas supply ports defined to distribute a second plasma process gas to the second plasma generation volume.
    • 半导体晶片处理装置包括暴露于第一等离子体产生体积的第一电极,暴露于第二等离子体产生体积的第二电极和设置在第一和第二等离子体产生体积之间的气体分配单元。 第一电极被定义为将射频(RF)功率传送到第一等离子体产生体积,并且将第一等离子体处理气体分配到第一等离子体产生体积。 第二电极被定义为将RF功率传送到第二等离子体产生体积,并且保持衬底暴露于第二等离子体产生体积。 气体分配单元包括限定为将第一等离子体产生体积流体连接到第二等离子体产生体积的通孔的布置。 气体分配单元还包括被定义为将第二等离子体处理气体分配到第二等离子体产生体积的气体供给端口的布置。