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    • 9. 发明申请
    • Multiple pBIST Controllers
    • 多个pBIST控制器
    • US20090172487A1
    • 2009-07-02
    • US11967148
    • 2007-12-29
    • Raguram DamodaranUmang Bharatkumar ThakkarJohn David Sayre
    • Raguram DamodaranUmang Bharatkumar ThakkarJohn David Sayre
    • G06F11/27
    • G06F11/27
    • A system on a single integrated circuit chip (SoC) includes a plurality of operational circuits to be tested. A plurality of programmable built-in self-test (pBIST) controllers is connected to respective ones of the plurality of operational circuits in a manner that allows the pBIST controllers to test the respective operation circuits in parallel. An interface is connected to each of the plurality of pBIST controllers for connection to an external tester to facilitate programming of each of the plurality of pBIST controllers by the external tester, such that the plurality of pBIST controllers are operable to test the plurality of operational circuits in parallel and report the results of the parallel tests to the external tester, thereby reducing test time.
    • 单个集成电路芯片(SoC)上的系统包括要测试的多个操作电路。 多个可编程内置自检(pBIST)控制器以允许pBIST控制器并行测试各个操作电路的方式连接到多个操作电路中的相应的一个操作电路。 接口连接到多个pBIST控制器中的每一个,用于连接到外部测试器,以便外部测试器对多个pBIST控制器中的每一个进行编程,使得多个pBIST控制器可操作以测试多个操作电路 并行并行测试结果报告给外部测试仪,从而减少测试时间。
    • 10. 发明授权
    • ROM-based memory testing
    • 基于ROM的内存测试
    • US07324392B2
    • 2008-01-29
    • US11422726
    • 2006-06-07
    • Ananthakrishnan RamamurtiRaguram Damodaran
    • Ananthakrishnan RamamurtiRaguram Damodaran
    • G11C7/00G11C29/00G06F11/00G01R31/28
    • G11C29/16G11C17/14
    • This invention uniquely partitions the pBIST ROM for storing program and data information. The pBIST unit selectively loads both the algorithm and data, the algorithm only or the data only for each test set stored in the pBIST ROM into read/write registers. These registers are memory mapped readable/writable. A configuration register has an algorithm bit and a data bit which determines whether the corresponding algorithm or data is loaded from the pBIST ROM. The pBIST unit includes another configuration register having one bit corresponding to each possible test set stored in the pBIST ROM. The pBIST unit runs a test set if the corresponding bit in the configuration register has a first digital state.
    • 本发明独特地划分用于存储程序和数据信息的pBIST ROM。 pBIST单元选择性地将存储在pBIST ROM中的每个测试集合的算法和数据,仅算法或数据加载到读/写寄存器中。 这些寄存器是可读写的内存映射。 配置寄存器具有算法位和数据位,用于确定对应的算法或数据是否从pBIST ROM加载。 pBIST单元包括具有与存储在pBIST ROM中的每个可能测试集相对应的一个位的另一个配置寄存器。 如果配置寄存器中的相应位具有第一数字状态,则pBIST单元运行测试集。