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1. 发明授权

US07444573B2 VLCT programmation/read protocol 有权
标题翻译： VLCT程序设计/读取协议
公开(公告)号：US07444573B2
公开(公告)日：2008-10-28
申请号：US11422751
申请日：2006-06-07
申请人： Raguram Damodaran , Ananthakrishnan Ramamurti , Ravi Lakshmanan
发明人： Raguram Damodaran , Ananthakrishnan Ramamurti , Ravi Lakshmanan
IPC分类号： G01R31/28
CPC分类号： G01R31/31724 , G06F11/27
摘要： An integrated circuit with built-in self test enables internal data registers to be written to or read from via an external tester. In a command phase the programmable built-in self test unit receives a command, an address and a data transfer count. The address specifies the initial data register address. The data transfer count corresponds to the amount of data transferred and the number of cycle in the data access phase. The data access phase begins by accessing the data register corresponding to the address from the command phase. During subsequent cycles of the data access phase, the external tester accesses sequential data registers. The programmable built-in self test unit includes a pointer register and an adder to update the address each cycle of the data phase.
摘要翻译：具有内置自检功能的集成电路可通过外部测试仪将内部数据寄存器写入或读取。在命令阶段，可编程内置自检单元接收命令，地址和数据传输计数。地址指定初始数据寄存器地址。数据传输计数对应于传输的数据量和数据访问阶段的周期数。数据访问阶段从命令阶段访问对应于地址的数据寄存器开始。在数据访问阶段的后续周期期间，外部测试人员访问顺序数据寄存器。可编程内置自检单元包括指针寄存器和加法器，用于在数据相位的每个周期更新地址。

2. 发明申请

US20070033472A1 VLCT Programmation/Read Protocol 有权
标题翻译： VLCT程序设计/读取协议
公开(公告)号：US20070033472A1
公开(公告)日：2007-02-08
申请号：US11422751
申请日：2006-06-07
申请人： Raguram Damodaran , Ananthakrishnan Ramamurti , Ravi Lakshmanan
发明人： Raguram Damodaran , Ananthakrishnan Ramamurti , Ravi Lakshmanan
IPC分类号： G01R31/28
CPC分类号： G01R31/31724 , G06F11/27
摘要： An integrated circuit with built-in self test enables internal data registers to be written to or read from via an external tester. In a command phase the programmable built-in self test unit receives a command, an address and a data transfer count. The address specifies the initial data register address. The data transfer count corresponds to the amount of data transferred and the number of cycle in the data access phase. The data access phase begins by accessing the data register corresponding to the address from the command phase. During subsequent cycles of the data access phase, the external tester accesses sequential data registers. The programmable built-in self test unit includes a pointer register and an adder to update the address each cycle of the data phase.
摘要翻译：具有内置自检功能的集成电路可通过外部测试仪将内部数据寄存器写入或读取。在命令阶段，可编程内置自检单元接收命令，地址和数据传输计数。地址指定初始数据寄存器地址。数据传输计数对应于传输的数据量和数据访问阶段的周期数。数据访问阶段从命令阶段访问对应于地址的数据寄存器开始。在数据访问阶段的后续周期期间，外部测试人员访问顺序数据寄存器。可编程内置自检单元包括指针寄存器和加法器，用于在数据相位的每个周期更新地址。

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