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    • 8. 发明申请
    • METHODS AND SYSTEMS FOR CALIBRATION OF RFID SENSORS
    • RFID传感器校准方法与系统
    • US20090278685A1
    • 2009-11-12
    • US12118950
    • 2008-05-12
    • Radislav Alexandrovich PotyrailoWilliam Guy Morris
    • Radislav Alexandrovich PotyrailoWilliam Guy Morris
    • G08B13/22
    • G06K19/0723G01N33/0006G01N33/0073G06K7/0095G06K19/0716
    • Methods and systems for calibration of RFID sensors used in manufacturing and monitoring systems are provided. The methods include measuring impedance of an RFID sensor antenna, relating the measurement of impedance to one or more parameters (such as physical, chemical and biological properties), computing one or more analytical fit coefficients, and storing the one or more analytical fit coefficients on a memory chip of the RFID sensor. Measuring impedance of the RFID sensor may comprise measuring complex impedance which involves measuring complex impedance spectrum, phase angle and magnitude of the impedance, at least one of frequency of the maximum of the real part of the complex impedance, magnitude of the real part of the complex impedance, zero-reactance frequency, resonant frequency of the imaginary part of the complex impedance, and antiresonant frequency of the imaginary part of the complex impedance. Also provided are manufacturing or monitoring systems comprised of an RFID sensor wherein the RFID sensor comprises, a memory chip, an antenna, and a sensing film wherein analytical fit coefficients are stored on the memory chip to allow calibration of the RFID sensor. Also provided are manufacturing or monitoring systems comprised of an RFID sensor wherein the RFID sensor comprises, a memory chip, an antenna, and a complementary sensor attached to the antenna where the complementary sensor in a pre-calibrated fashion predictably affects the impedance of the antenna.
    • 提供了用于制造和监控系统中使用的RFID传感器校准的方法和系统。 所述方法包括测量RFID传感器天线的阻抗,将阻抗测量与一个或多个参数(诸如物理,化学和生物特性)相关联,计算一个或多个分析拟合系数,以及将一个或多个分析拟合系数存储在 RFID传感器的存储芯片。 RFID传感器的测量阻抗可以包括测量复阻抗,其包括测量复阻抗谱,阻抗的相位角和幅度,复阻抗的实部的最大值的频率中的至少一个, 复阻抗,零电抗频率,复阻抗的虚部的谐振频率以及复阻抗的虚部的反谐振频率。 还提供了包括RFID传感器的制造或监控系统,其中RFID传感器包括存储器芯片天线和感测膜,其中分析拟合系数存储在存储器芯片上以允许RFID传感器的校准。 还提供了由RFID传感器组成的制造或监测系统,其中RFID传感器包括存储芯片天线和附接到天线的互补传感器,其中预校准方式的互补传感器可预测地影响天线的阻抗 。
    • 9. 发明授权
    • Authenticable optical disc, system for authenticating an optical disc and method thereof
    • 认证光盘,用于认证光盘的系统及其方法
    • US07218589B2
    • 2007-05-15
    • US10723682
    • 2003-11-24
    • Marc Brian WisnudelRadislav Alexandrovich PotyrailoWilliam Guy Morris
    • Marc Brian WisnudelRadislav Alexandrovich PotyrailoWilliam Guy Morris
    • G11B7/00
    • G11B7/24G11B20/00086G11B20/00123G11B20/00173
    • An authenticable optical disc and a system and method for authenticating the optical disc are provided. The optical disc comprising a reflective layer; an optically transparent substrate disposed between the reflective layer and a light incident surface of the optical disc; a data layer disposed between the substrate and the reflective layer, the data layer including a predetermined signature; and at least one measurable feature, wherein the at least one feature is compared to the predetermined signature for authenticating the optical disc. The method comprises the steps of preparing an optical disc with at least one optical feature; measuring intensity of transmitted light from the at least one optical feature; and comparing the measured intensity to a predetermined signature, wherein if the measured intensity and predetermined signature matches, access to the optical disc is granted.
    • 提供了一种认证光盘和用于认证光盘的系统和方法。 该光盘包括反射层; 设置在所述反射层和所述光盘的光入射表面之间的光学透明基板; 设置在所述基板和所述反射层之间的数据层,所述数据层包括预定的签名; 以及至少一个可测量特征,其中将所述至少一个特征与用于认证所述光盘的所述预定签名进行比较。 该方法包括准备具有至少一个光学特征的光盘的步骤; 测量来自所述至少一个光学特征的透射光的强度; 以及将测量的强度与预定签名进行比较,其中如果所测量的强度和预定签名匹配,则允许对光盘的访问。