会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • SEMICONDUCTOR DEVICE
    • US20230131034A1
    • 2023-04-27
    • US17912013
    • 2021-03-24
    • ROHM CO., LTD.
    • Tadao YUKI
    • H01L27/02
    • A semiconductor device includes a semiconductor layer, a first region of a first conductivity type formed in the semiconductor layer and connected to a ground potential, a second region of a second conductivity type formed in the semiconductor layer, an insulating film formed on the semiconductor layer and covering the first region and the second region, an internal circuit, signal terminal for driving the internal circuit or to be driven by the internal circuit, a first wiring connecting the internal circuit and the signal terminal, a resistance element formed on the insulating film and interposed halfway through the first wiring, the resistance element including a first resistor facing the second region across the insulating film, and a second wiring connected to the first wiring on a side closer to the signal terminal than the resistance element and connecting the first wiring and the second region.
    • 2. 发明申请
    • SEMICONDUCTOR DEVICE
    • US20220336682A1
    • 2022-10-20
    • US17762022
    • 2020-11-25
    • ROHM CO., LTD.
    • Tadao YUKITakeshi ISHIDA
    • H01L29/861H01L29/06H01L29/66H01L29/08H01L29/10H01L29/423H01L29/36
    • A semiconductor device includes a semiconductor layer of a first conductivity type that has a main surface and that includes a device region, a base region of a second conductivity type that is formed in a surface layer portion of the main surface at the device region, a source region of the first conductivity type that is formed in a surface layer portion of the base region at an interval inward from a peripheral portion of the base region and that defines a channel region with the semiconductor layer, a base contact region of the second conductivity type that is formed in a region different from the source region at the surface layer portion of the base region and that has an impurity concentration exceeding an impurity concentration of the base region, a well region of the first conductivity type that is formed in the surface layer portion of the main surface at an interval from the base region at the device region and that defines a drift region with the base region, a drain region of the first conductivity type that is formed in a surface layer portion of the well region, an impurity region of the second conductivity type that is formed in the surface layer portion of the well region and that is electrically connected to the drain region, and a gate structure that has a gate insulating film covering the channel region on the main surface and a gate electrode facing the channel region on the gate insulating film and electrically connected to the source region and the base contact region.