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    • 4. 发明申请
    • Method and apparatus for downhole spectroscopy processing
    • 用于井下光谱处理的方法和装置
    • US20060091307A1
    • 2006-05-04
    • US10541091
    • 2003-11-21
    • Roger GriffithsJack HorkowitzKai Hsu
    • Roger GriffithsJack HorkowitzKai Hsu
    • G01V5/00
    • G01V5/045
    • A method for downhole spectroscopy processing is described. The method includes: obtaining raw spectroscopy data using a downhole tool; processing the raw spectroscopy data using the downhole tool to obtain a downhole processed solution; transmitting the downhole processed solution to a surface processing system; and using the surface processing system to determine lithology information from the downhole processed solution. A downhole tool for processing raw spectroscopy data is also described. The tool includes: a neutron source; at least one detector for detecting the raw spectroscopy data; processing means for processing the raw spectroscopy data to produce a downhole processed solution; and means for transmitting the downhole processed solution to a surface location.
    • 描述了井下光谱处理的方法。 该方法包括:使用井下工具获得原始光谱数据; 使用井下工具处理原始光谱数据以获得井下处理溶液; 将井下处理的溶液传送到表面处理系统; 并使用表面处理系统从井下处理溶液中确定岩性信息。 还描述了用于处理原始光谱数据的井下工具。 该工具包括:中子源; 用于检测原始光谱数据的至少一个检测器; 用于处理原始光谱数据以产生井下处理溶液的处理装置; 以及用于将井下处理的溶液传送到表面位置的装置。
    • 10. 发明申请
    • ESTIMATING SIGMA LOG BEYOND THE MEASUREMENTS POINTS
    • 估计SIGMA记录在测量点之外
    • US20110004408A1
    • 2011-01-06
    • US12797182
    • 2010-06-09
    • Chanh Cao MinhMarie Laure MauborgneRoger GriffithsDarwin Ellis
    • Chanh Cao MinhMarie Laure MauborgneRoger GriffithsDarwin Ellis
    • G01V5/04G06F19/00
    • G01V11/00
    • The present disclosure relates to a method to determine the capture cross-section of a subsurface formation at a desired depth in the formation. A database of Sigma values for known lithologies, porosities, and salinities is provided, and multiple Sigma measurements are obtained from a downhole logging tool. Within the database, Sigma values are interpolated to determine the respective depths of investigation of the multiple Sigma measurements. A monotonic function is fitted to the multiple Sigma measurements at the determined depths of investigation, and the capture cross-section of the subsurface formation at any desired depth in the formation is determined using the fitted function. Similarly, a system to determine the capture cross-section of a subsurface formation at a desired depth in the formation and/or a depth of invasion of drilling fluids is also disclosed.
    • 本公开涉及确定地层中所需深度处的地下地层的捕获横截面的方法。 提供了用于已知岩性,孔隙度和盐度的Sigma值的数据库,并且从井下测井工具获得多个Sigma测量。 在数据库中,内插Sigma值以确定多个Sigma测量的相应调查深度。 在确定的调查深度上将多元西格玛测量拟合为单调函数,并且使用拟合函数确定地层中任何所需深度处的地下地层的捕获截面。 类似地,还公开了一种用于确定地层中所需深度和/或钻井液侵入深度的地下地层的捕获横截面的系统。