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    • 2. 发明授权
    • Method of IC fabrication, IC mask fabrication and program product therefor
    • IC制造方法,IC掩模制造及其程序产品
    • US07353492B2
    • 2008-04-01
    • US11043482
    • 2005-01-26
    • Puneet GuptaFook-Luen HengMark A. Lavin
    • Puneet GuptaFook-Luen HengMark A. Lavin
    • G06F17/50
    • G03F1/36
    • A method of forming integrated circuit (IC) chip shapes and a method and computer program product for converting an IC design to a mask, e.g., for standard cell design. Individual book/macro physical designs (layouts) are proximity corrected before unnesting and an outer proximity range is determined for each proximity corrected physical design. Shapes with a unique design (e.g., in boundary cells and unique instances of books) are tagged and the design is unnested. Only the unique shapes are proximity corrected in the unnested design, which may be used to make a mask for fabricating IC chips/wafers.
    • 一种形成集成电路(IC)芯片形状的方法以及用于将IC设计转换为掩模的方法和计算机程序产品,例如用于标准单元设计。 单独的书/宏物理设计(布局)在不需要之前进行邻近校正,并且为每个邻近校正的物理设计确定外部接近度范围。 具有独特设计的形状(例如,在边界单元格和图书的独特实例中)被标记,并且设计不被忽视。 只有独特的形状在未设计的设计中被接近校正,其可以用于制造用于制造IC芯片/晶片的掩模。
    • 5. 发明授权
    • Method, system, and computer-readable medium for providing location-based listing services
    • 用于提供基于位置的列表服务的方法,系统和计算机可读介质
    • US09210538B2
    • 2015-12-08
    • US13425849
    • 2012-03-21
    • Puneet GuptaAkshay DarbariVenkat Kumar Sivaramamurthy
    • Puneet GuptaAkshay DarbariVenkat Kumar Sivaramamurthy
    • H04W24/00H04W4/02H04W4/00H04W64/00
    • H04W4/02H04W4/50H04W64/00
    • The present invention relates to a computer-implemented method, system and computer readable medium for providing context-based listing services. The method comprises registering at least one first service provider with an second service provider wherein registering comprises that the first service provider provides the information via a communication network to the second service provider and it validates the information. Validating comprises identify the location of the first service provider and/or request to at least one predefined user located nearby the location of the first service provider. At least one user requests the second service provider for the information via the communication network. At least one user retrieves the information and provides ranking to category of services so as to update the information in the second service provider.
    • 本发明涉及一种用于提供基于上下文的列表服务的计算机实现的方法,系统和计算机可读介质。 该方法包括向第二服务提供商注册至少一个第一服务提供商,其中注册包括第一服务提供商经由通信网络向第二服务提供商提供信息,并验证该信息。 验证包括将位于第一服务提供商的位置附近的至少一个预定义用户识别第一服务提供商的位置和/或请求。 至少一个用户通过通信网络请求第二服务提供商的信息。 至少一个用户检索信息并提供对服务类别的排名,以便更新第二服务提供商中的信息。
    • 8. 发明授权
    • Standard cells having transistors annotated for gate-length biasing
    • 具有用于栅极长度偏置的晶体管的标准单元
    • US08949768B2
    • 2015-02-03
    • US13620669
    • 2012-09-14
    • Puneet GuptaAndrew B. Kahng
    • Puneet GuptaAndrew B. Kahng
    • G06F17/50G06F9/455
    • G06F17/5081G06F17/5063G06F17/5068G06F2217/78
    • A standard cell library is disclosed. The standard cell library contains cells wherein at least one transistor in at least one cell is annotated for gate length biasing. Gate length biasing includes the modification of the gate length, so as to change the speed or power consumption of the modified gate length. The standard cell library is one used in the manufacturing of semiconductor devices (e.g., that result as semiconductor chips), by way of fabricating features defined on one or more layouts of geometric shapes. The annotations serve to identify which ones of the transistor gate features are to be modified before using the geometric shapes for manufacturing the semiconductor device.
    • 公开了一种标准细胞库。 标准单元库包含其中注释至少一个单元中的至少一个晶体管用于栅长度偏置的单元。 栅极长度偏置包括栅极长度的修改,以便改变修改的栅极长度的速度或功率消耗。 标准单元库是用于制造半导体器件(例如,作为半导体芯片的结果)的方法,通过制造在几何形状的一个或多个布局上限定的特征。 注释用于在使用用于制造半导体器件的几何形状之前识别哪些晶体管栅极特征将被修改。