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1. 发明申请

US20060289728A1 Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns 失效
标题翻译：具有包括层状图案的光耦合表面的电磁波检测器
公开(公告)号：US20060289728A1
公开(公告)日：2006-12-28
申请号：US10558187
申请日：2004-05-26
申请人： Philippe Bois , Eric Costard , Alfredo De Rossi , Alexandru Nedelcu
发明人： Philippe Bois , Eric Costard , Alfredo De Rossi , Alexandru Nedelcu
IPC分类号： H01J40/14
CPC分类号： B82Y20/00 , H01L31/02327 , H01L31/035236
摘要： The invention relates to a detector comprising a multiple quantum well structure operating on interband or intersubband transitions by absorption of radiation having a wavelength λ having a polarization comprising a component perpendicular to the plane of the multiple quantum well structure, and comprising optical coupling means for coupling said radiation, wherein the coupling means comprise a set of first diffractive lamellar features that are distributed along at least a first direction and a set of second diffractive lamellar features that are distributed along at least a second direction, said first and second directions being mutually perpendicular and lying in a plane parallel to the plane of the multiple quantum well structure.
摘要翻译：本发明涉及一种检测器，其包括通过吸收具有包括垂直于多量子阱结构的平面的分量的波长的波长λ的辐射而在带间或子带间跃迁上工作的多量子阱结构，并且包括用于耦合的光耦合装置所述辐射，其中所述耦合装置包括沿着至少第一方向分布的一组第一衍射层状特征和沿着至少第二方向分布的一组第二衍射层状特征，所述第一和第二方向是相互垂直的并且位于平行于多量子阱结构的平面的平面中。

2. 发明授权

US07741594B2 Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns 失效
标题翻译：具有包括层状图案的光耦合表面的电磁波检测器
公开(公告)号：US07741594B2
公开(公告)日：2010-06-22
申请号：US10558187
申请日：2004-05-26
申请人： Philippe Bois , Eric Costard , Alfredo De Rossi , Alexandru Nedelcu
发明人： Philippe Bois , Eric Costard , Alfredo De Rossi , Alexandru Nedelcu
IPC分类号： H01L31/00
CPC分类号： B82Y20/00 , H01L31/02327 , H01L31/035236
摘要： The invention relates to a detector comprising a multiple quantum well structure operating on interband or intersubband transitions by absorption of radiation having a wavelength λ having a polarization comprising a component perpendicular to the plane of the multiple quantum well structure, and comprising optical coupling means for coupling said radiation, wherein the coupling means comprise a set of first diffractive lamellar features that are distributed along at least a first direction and a set of second diffractive lamellar features that are distributed along at least a second direction, said first and second directions being mutually perpendicular and lying in a plane parallel to the plane of the multiple quantum well structure.
摘要翻译：本发明涉及一种检测器，其包括通过吸收具有波长λ的波长的辐射而在带间或子带间跃迁上工作的多量子阱结构，该波长包括垂直于多量子阱结构的平面的分量的偏振，并且包括用于耦合的光耦合装置所述辐射，其中所述耦合装置包括沿着至少第一方向分布的一组第一衍射层状特征和沿着至少第二方向分布的一组第二衍射层状特征，所述第一和第二方向是相互垂直的并且位于平行于多量子阱结构的平面的平面中。

3. 发明申请

US20100108861A1 Multispectral imaging device based on multiple quantum wells 有权
标题翻译：基于多量子阱的多光谱成像装置
公开(公告)号：US20100108861A1
公开(公告)日：2010-05-06
申请号：US12605188
申请日：2009-10-23
申请人： Alexandru Nedelcu , Philippe Bois , Eric Costard
发明人： Alexandru Nedelcu , Philippe Bois , Eric Costard
IPC分类号： H01L31/0352 , H01L27/146
CPC分类号： H01L27/14625 , B82Y20/00 , G01J3/0259 , G01J3/1804 , G01J3/36 , G01J2003/1861 , H01L27/14621 , H01L27/14649 , H01L31/02327 , H01L31/035236 , H01L31/101
摘要： The invention relates to a multispectral imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ lying within a set of wavelengths to which said structure is sensitive, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets (Eij) of four individual detection pixels, a first individual detection pixel (Pλ1) comprising a first diffraction grating (Rλ1) sensitive to a first subset of wavelengths, a second individual detection pixel (Pλ2) comprising a second diffraction grating (Rλ2) sensitive to a second subset of wavelengths, a third individual detection pixel (Pλ3) comprising a third diffraction grating (Rλ3) sensitive to a third subset of wavelengths and a fourth individual detection pixel (PΔλ) not comprising a wavelength-selective diffraction grating, the first, second and third subsets of wavelengths belonging to the set of wavelengths to which said structure is sensitive.
摘要翻译：本发明涉及一种多光谱成像装置，其包括通过吸收位于所述结构敏感的一组波长内的波长λ的辐射而在子带间跃迁上操作的多量子阱结构，所述结构包括：单个检测像素，其特征在于，矩阵被组织在四个单独检测像素的子集（Eij）中，第一个体检测像素（Pλ1）包括对第一波长子集敏感的第一衍射光栅（Rλ1），第二个体检测包括对第二波长子集敏感的第二衍射光栅（Rλ2）的像素（Pλ2），包括对第三子波长敏感的第三衍射光栅（Rλ3）的第三个别检测像素（Pλ3）和第四单独检测像素 P＆Dgr;λ）不包括波长选择性衍射光栅，第一，第二和第三波长子集属于se 所述结构敏感的波长t。

4. 发明授权

US08378301B2 Multispectral imaging device based on multiple quantum wells 有权
标题翻译：基于多量子阱的多光谱成像装置
公开(公告)号：US08378301B2
公开(公告)日：2013-02-19
申请号：US12605188
申请日：2009-10-23
申请人： Alexandru Nedelcu , Philippe Bois , Eric Costard
发明人： Alexandru Nedelcu , Philippe Bois , Eric Costard
IPC分类号： H01L29/06 , H01L29/732
CPC分类号： H01L27/14625 , B82Y20/00 , G01J3/0259 , G01J3/1804 , G01J3/36 , G01J2003/1861 , H01L27/14621 , H01L27/14649 , H01L31/02327 , H01L31/035236 , H01L31/101
摘要： The invention relates to a multispectral imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ lying within a set of wavelengths to which said structure is sensitive, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets (Eij) of four individual detection pixels, a first individual detection pixel (Pλ1) comprising a first diffraction grating (Rλ1) sensitive to a first subset of wavelengths, a second individual detection pixel (Pλ2) comprising a second diffraction grating (Rλ2) sensitive to a second subset of wavelengths, a third individual detection pixel (Pλ3) comprising a third diffraction grating (Rλ3) sensitive to a third subset of wavelengths and a fourth individual detection pixel (PΔλ) not comprising a wavelength-selective diffraction grating, the first, second and third subsets of wavelengths belonging to the set of wavelengths to which said structure is sensitive.
摘要翻译：本发明涉及一种多光谱成像装置，其包括通过吸收位于所述结构敏感的一组波长内的波长λ的辐射而在子带间跃迁上操作的多量子阱结构，所述结构包括：单个检测像素，其特征在于，矩阵被组织在四个单独检测像素的子集（Eij）中，第一个体检测像素（Pλ1）包括对第一波长子集敏感的第一衍射光栅（Rλ1），第二个体检测包括对第二波长子集敏感的第二衍射光栅（Rλ2）的像素（Pλ2），包括对第三子波长敏感的第三衍射光栅（Rλ3）的第三个别检测像素（Pλ3）和第四单独检测像素 P＆Dgr;λ）不包括波长选择性衍射光栅，第一，第二和第三波长子集属于se 所述结构敏感的波长t。

5. 发明申请

US20060243892A1 Amorphous optical coupling structure for an electromagnetic wave detector and associated detector 有权
标题翻译：用于电磁波探测器和相关检测器的无定形光耦合结构
公开(公告)号：US20060243892A1
公开(公告)日：2006-11-02
申请号：US10558247
申请日：2004-05-26
申请人： Philippe Bois , Nadia Briere De L'Isle , Eric Costard , Alfredo De Rossi
发明人： Philippe Bois , Nadia Briere De L'Isle , Eric Costard , Alfredo De Rossi
IPC分类号： H01J40/14
CPC分类号： B82Y20/00 , H01L31/02327 , H01L31/035236
摘要： The invention relates to an optical coupling structure intended to couple electromagnetic radiation to the surface of a photodetector, wherein a coupling surface paved along mutually perpendicular first and second directions by a set of N series (M1i, M2i, . . . Mni) of first features, second features, . . . nth features, the features being identical within any one series, the features being distributed along the first and second directions, the distance between the centers of two adjacent features or the inter-reticular distances between two adjacent features being variable. The subject of the invention is also a detector or a laser source comprising said coupling structure.
摘要翻译：本发明涉及一种用于将电磁辐射耦合到光电检测器的表面的光耦合结构，其中通过一系列N系列（M1i，M2i，...，Mni）的第一和第二方向沿相互垂直的第一和第二方向铺设的耦合表面功能，第二个功能。。。第n个特征，特征在任何一个系列中是相同的，特征沿着第一和第二方向分布，两个相邻特征的中心之间的距离或两个相邻特征之间的网间距离是可变的。本发明的主题也是包括所述耦合结构的检测器或激光源。

6. 发明授权

US07687760B2 Amorphous optical coupling structure for an electromagnetic wave detector and associated detector 有权
标题翻译：用于电磁波探测器和相关检测器的无定形光耦合结构
公开(公告)号：US07687760B2
公开(公告)日：2010-03-30
申请号：US10558247
申请日：2004-05-26
申请人： Philippe Bois , Nadia Briere De L'Isle , Eric Costard , Alfredo De Rossi
发明人： Philippe Bois , Nadia Briere De L'Isle , Eric Costard , Alfredo De Rossi
IPC分类号： H01L31/00
CPC分类号： B82Y20/00 , H01L31/02327 , H01L31/035236
摘要： The invention relates to an optical coupling structure intended to couple electromagnetic radiation to the surface of a photodetector, wherein a coupling surface paved along mutually perpendicular first and second directions by a set of N series (M1i, M2i, . . . . Mni) of first features, second features, . . . nth features, the features being identical within any one series, the features being distributed along the first and second directions, the distance between the centers of two adjacent features or the inter-reticular distances between two adjacent features being variable. The subject of the invention is also a detector or a laser source comprising said coupling structure.
摘要翻译：本发明涉及一种用于将电磁辐射耦合到光电检测器的表面的光耦合结构，其中通过一系列N系列（M1i，M2i，...，Mni），沿着相互垂直的第一和第二方向铺设的耦合表面第一个功能，第二个功能，。。。第n个特征，特征在任何一个系列中是相同的，特征沿着第一和第二方向分布，两个相邻特征的中心之间的距离或两个相邻特征之间的网间距离是可变的。本发明的主题还是包括所述耦合结构的检测器或激光源。

7. 发明申请

US20100110433A1 Polarimetric imaging device optimized for polarization contrast 审中-公开
标题翻译：针对极化对比度优化的偏振成像装置
公开(公告)号：US20100110433A1
公开(公告)日：2010-05-06
申请号：US12605194
申请日：2009-10-23
申请人： Alexandru Nedelcu , Philippe Bois , Eric Costard
发明人： Alexandru Nedelcu , Philippe Bois , Eric Costard
IPC分类号： G01J4/00
摘要： The invention relates to a polarimetric imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets of four individual pixels, a first pixel comprising a first diffraction grating (RP1) sensitive to a first polarization, a second polarimetric pixel comprising a second diffraction grating (RP2) sensitive to a second polarization orthogonal to the first polarization, a third polarimetric pixel comprising a third diffraction grating (RP3) sensitive to a third polarization oriented at an angle between the first and second polarizations and a fourth pixel not comprising a polarization-selective diffraction rating (R2D).
摘要翻译：本发明涉及一种偏振成像装置，其包括通过吸收波长为λ的辐射而在子带间转变上工作的多量子阱结构，所述结构包括单个检测像素的矩阵，其特征在于，所述矩阵被组织在四个单独像素的子集，包括对第一偏振敏感的第一衍射光栅（RP1）的第一像素，包括对与第一偏振正交的第二偏振敏感的第二衍射光栅（RP2）的第二偏振像素，第三偏振像素包括对以第一和第二偏振之间的角度取向的第三偏振敏感的第三衍射光栅（RP3）和不包括偏振选择性衍射等级（R2D）的第四像素。

8. 发明授权

US06797938B2 Polarimetric optical device with an insulating layer between detectors 失效
标题翻译：偏振光学器件在检测器之间具有绝缘层
公开(公告)号：US06797938B2
公开(公告)日：2004-09-28
申请号：US10275893
申请日：2002-11-12
申请人： Philippe Bois , Eric Costard , Marcel-Francis Audier , Eric Herniou
发明人： Philippe Bois , Eric Costard , Marcel-Francis Audier , Eric Herniou
IPC分类号： G02F101
CPC分类号： B82Y20/00 , H01L27/1446 , H01L31/02327 , H01L31/035236
摘要： This optical polarimetric detector comprises: a first active detector element having a photoconductor (1) with which a first diffraction grating (3) is associated allowing incident light from a first specific polarization direction to be coupled in the first detector element and allowing the latter to detect the light having this first polarization direction; a second active detector element having a photoconductor (1′) with which a second diffraction grating (3′) is associated allowing incident light from a second polarization direction to be coupled in the second detector element and allowing the latter to detect the light having this second polarization direction. Furthermore, a detector (2) is provided making it possible to eliminate the background noise detected by previous detectors.
摘要翻译：该光学偏振检测器包括：具有光电导体（1）的第一有源检测器元件，第一衍射光栅（3）与第一衍射光栅（3）相关联，允许来自第一特定偏振方向的入射光耦合在第一检测器元件中，检测具有该第一偏振方向的光;具有光电导体（1'）的第二有源检测器元件，第二衍射光栅（3'）与第二衍射光栅（3'）相关联，允许来自第二偏振方向的入射光耦合在第二检测器元件中，允许后者检测具有该第二偏振方向的光。此外，提供检测器（2），使得可以消除由先前检测器检测到的背景噪声。

9. 发明授权

US06627868B2 Bi-functional optical detector including four optical detectors used to detect combination of two wavelengths 有权
标题翻译：双功能光学检测器，包括用于检测两个波长的组合的四个光学检测器
公开(公告)号：US06627868B2
公开(公告)日：2003-09-30
申请号：US09852211
申请日：2001-05-10
申请人： Philippe Bois , Eric Costard , Marcel-Francis Audier , Eric Herniou
发明人： Philippe Bois , Eric Costard , Marcel-Francis Audier , Eric Herniou
IPC分类号： H01L2714
CPC分类号： B82Y20/00 , H01L27/14649
摘要： A bi-functional optical detector including a first active photoconduction detection element configured to detect light within first and second wavelength ranges, a first diffraction grating associated with the first detection element and configured to couple the light within the first wavelength range so that the first active photoconducting detection element detects the light in the first wavelength range, a second active photoconduction detection element configured to detect light within the first and second wavelength ranges, and a second diffraction grating associated with the second detection element and configured to couple the light within the second wavelength range so that the second active photoconduction detection element detects the light in the second wavelength range. Also included is a third active photoconduction detection element associated with the first detection element and configured to detect the light within the first and second wavelength ranges, a fourth active photoconduction detection element associated with the second detection element and configured to detect the light within the first and second wavelength ranges, and a common contact layer separating the first and second detection elements from the third and fourth detection elements.
摘要翻译：一种双功能光学检测器，包括被配置为检测第一和第二波长范围内的光的第一有源光电导检测元件，与第一检测元件相关联并被配置为将光耦合在第一波长范围内的第一衍射光栅，光电导检测元件检测第一波长范围内的光，配置成检测第一和第二波长范围内的光的第二有源光电导检测元件，以及与第二检测元件相关联的第二衍射光栅，使得第二有源光电导检测元件检测第二波长范围内的光。还包括与第一检测元件相关联并被配置为检测第一和第二波长范围内的光的第三有源光电导检测元件，与第二检测元件相关联并被配置为检测第一和第二波长范围内的光的第四有源光电导检测元件，和第二波长范围，以及将第一和第二检测元件与第三和第四检测元件分开的公共接触层。

10. 发明授权

US6157020A Bispectral electromagnetic wave detector 失效
标题翻译：双频电磁波探测器
公开(公告)号：US6157020A
公开(公告)日：2000-12-05
申请号：US984950
申请日：1997-12-04
申请人： Pascal Krapf , Eric Costard , Philippe Bois
发明人： Pascal Krapf , Eric Costard , Philippe Bois
IPC分类号： H01L31/0248 , H01L25/04 , H01L27/146 , H01J40/14
CPC分类号： H01L25/043 , H01L27/1465 , H01L2924/0002
摘要： The disclosure relates to a bispectral electromagnetic wave detector including at least one first and one second overlaid plane active detector elements separated by a common layer, said first and second detector elements being sensitive to the different wavelengths; a first means of connection connected in common to said first and second detector elements, a second means of connection connected to said first detector element, and a third means of connection connected to said second detector element; means for applying successively a control voltage to each means of connection; and means connected to said first means of connection to detect a photoconduction current each time a control voltage is applied. The invention is used in applications requiring detection of electromagnetic waves in two bands of different wavelengths.
摘要翻译：本发明涉及一种双谱电磁波检测器，包括由公共层分离的至少一个第一和第二叠层有源检测器元件，所述第一和第二检测器元件对不同波长敏感; 连接到所述第一和第二检测器元件的第一连接装置，连接到所述第一检测器元件的第二连接装置和连接到所述第二检测器元件的第三连接装置; 用于连续地对每个连接装置施加控制电压的装置; 以及连接到所述第一连接装置的装置，以在每次施加控制电压时检测光电导电流。本发明用于需要检测不同波长的两个波段中的电磁波的应用中。

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