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    • 10. 发明授权
    • Selective refresh of single bit memory cells
    • 选择性刷新单位存储单元
    • US07936610B1
    • 2011-05-03
    • US12534792
    • 2009-08-03
    • Robert MelcherSean EilertJohn Egler
    • Robert MelcherSean EilertJohn Egler
    • G11C16/06
    • G11C16/3418G11C16/06G11C16/349
    • Methods and systems to selectively refresh a single bit per cell non-volatile memory cell to reduce memory cell errors. In an embodiment, a memory device scans its memory cells, performing a multi-level read on memory cells in a single bit per cell mode. Depending on the state sensed, the cell is refreshed to a correct state if necessary. In one embodiment, the memory scan is appended to a user erase operation, a flash block is swapped with another bock if the state sensed indicates charge gain, and a flash cell is programmed up if the state sensed indicates charge loss.
    • 用于选择性地刷新每个单元非易失性存储单元的单个位以减少存储单元错误的方法和系统。 在一个实施例中,存储器设备扫描其存储器单元,以每单元模式的单个位执行对存储器单元的多级读取。 根据感测状态,如果需要,将单元格刷新到正确的状态。 在一个实施例中,将存储器扫描附加到用户擦除操作,如果所感测的状态指示充电增益,则闪存块与另一个块交换,并且如果所感测的状态指示电荷损失,则闪存单元被编程。