会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 7. 发明授权
    • Optical device for measuring modulated signal light
    • 用于测量调制信号光的光学装置
    • US07738115B2
    • 2010-06-15
    • US11997386
    • 2006-09-27
    • Nenad OcelicRainer Hillenbrand
    • Nenad OcelicRainer Hillenbrand
    • G01B11/02
    • G01Q60/22G11B7/005G11B7/1387
    • An optical device for determining at least one signal light component being characteristic for an optical near-field interaction of a probe with an object to be investigated, wherein the near-field interaction is subjected to a fundamental modulation at a fundamental frequency Ω, comprises an interferometer device with an illumination light path (I) being directed to the probe, a reference light path (II) being directed to a detector device for obtaining detector output signals including signal light components, and a signal light path (III) being directed from the probe to the detector device, wherein the reference and signal light paths (II, III) are superimposed at the detector device, and a demodulation device for determining the signal light components by demodulating the detector output signals, wherein the reference light path (II) does not contain the probe, an interferometer phase modulator is arranged in the reference light path (II) or signal light path (III) for changing an interferometer phase comprising the optical phase difference between the reference light and the signal light, and the demodulation device is adapted for determining the signal light components from the detector output signals obtained at three or more different interferometer states, which represent three or more different interferometer phases or at least two different interferometer phases with at least one state wherein the reference light path (II) is blocked.
    • 一种光学装置,用于确定至少一个信号光分量是探针与待研究物体的光学近场相互作用的特征,其中所述近场相互作用在基频ωg下进行基本调制,包括 具有照明光路(I)的干涉仪装置被引导到探针,参考光路(II)被引导到检测器装置,用于获得包括信号光分量的检测器输出信号和指向的信号光路(III) 从所述探针到所述检测器装置,其中所述参考信号光路(II,III)叠加在所述检测器装置处,以及解调装置,用于通过解调所述检测器输出信号来确定所述信号光分量,其中所述参考光路径 II)不包含探针,在参考光路(II)或信号光路(III)中布置干涉仪相位调制器 包括参考光和信号光之间的光学相位差的干涉仪相位,并且所述解调装置适用于从三个或更多个不同的干涉仪状态获得的检测器输出信号中确定信号光分量,所述干涉仪表示三个或更多个不同的 干涉仪相位或具有至少一个状态的至少两个不同的干涉仪相位,其中参考光路(II)被阻挡。
    • 9. 发明申请
    • Method and device for recording optical near field interaction signals
    • 用于记录光学近场相互作用信号的方法和装置
    • US20050259252A1
    • 2005-11-24
    • US10519349
    • 2003-06-23
    • Rainer HillenbrandFritz KeilmannThomas Taubner
    • Rainer HillenbrandFritz KeilmannThomas Taubner
    • G01Q60/18G01J3/28
    • G11B9/14G01Q60/22G11B9/02G11B9/149
    • Described are methods for acquiring optical near-field interaction signals in the infrared spectral region, involving the steps of: illuminating an object combination comprising at least two objects (1, 2) with infrared radiation so that an infrared near-field coupling is produced between the objects (1, 2); and acquiring the scattered light which is scattered by the object combination, which scattered light comprises a fraction(s) that has been modified as a result of the near-field coupling; wherein at least one of the objects (1, 2) comprises a polar material which at least in part comprises a polar solid-state structure; and during illumination in at least one of the objects (1, 2) with the polar material at least one phonon resonance is excited with which the modified fraction(s) of the scattered light is strengthened. Also described are applications of the method in the fields of metrology, data storage technology and optical signal processing.
    • 描述了用于在红外光谱区域中获取光学近场相互作用信号的方法,包括以下步骤:用红外辐射照射包括至少两个物体(1,2)的物体组合,使得在两个物体(1,2)之间产生红外近场耦合, 对象(1,2); 并且获取由对象组合散射的散射光,该散射光包括作为近场耦合的结果而被修改的分数; 其中所述物体(1,2)中的至少一个包括至少部分地包括极性固态结构的极性材料; 并且在至少一个具有极性材料的物体(1,2)中的照射期间,激发至少一个声子共振,从而增强散射光的改性分数。 还描述了该方法在计量学,数据存储技术和光信号处理领域的应用。
    • 10. 发明授权
    • Mirror optic for near-field optical measurements
    • 用于近场光学测量的镜面光学器件
    • US07591858B2
    • 2009-09-22
    • US11653601
    • 2007-01-16
    • Fritz KeilmannRainer Hillenbrand
    • Fritz KeilmannRainer Hillenbrand
    • G01B15/00
    • G01Q60/22Y10S977/862
    • A mirror optic (10) is provided for near-field optical measurement of a specimen (1), wherein the mirror optic (10) has a reflector (11) with the shape of a paraboloid with a paraboloid axis (12) and a focal point (13), which can be illuminated along a first illumination beam path (I), whereby the reflector 11 has at least one edge recess (14) in such a way that the focal point (13) can be illuminated along a second illumination beam path (II) which deviates from the first illumination beam path (I). A near-field microscope with such a mirror optic is also provided.
    • 提供了一种用于样本(1)的近场光学测量的镜面光学元件(10),其中镜面光学元件(10)具有反射器(11),其具有抛物面形状,具有抛物面轴(12)和焦点 点(13),其可以沿着第一照明光束路径(I)照亮,由此反射器11具有至少一个边缘凹部(14),使得焦点(13)可以沿着第二照明 离开第一照明光束路径(I)的光束路径(II)。 还提供了具有这种镜面光学器件的近场显微镜。