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1. 发明授权

US6084428A Programmable integrated circuit having shared programming conductors between columns of logic modules 失效
标题翻译：可编程集成电路在逻辑模块的列之间具有共享编程导体
公开(公告)号：US6084428A
公开(公告)日：2000-07-04
申请号：US931897
申请日：1997-09-17
申请人： Paige A. Kolze , James A. Apland
发明人： Paige A. Kolze , James A. Apland
IPC分类号： H02H9/00 , H03K17/22 , H03K19/177
CPC分类号： H03K19/17764 , H03K17/223 , H03K19/17736 , H03K19/1778 , H03K19/17796
摘要： A field programmable gate array has columns of logic modules. A programming conductor used to conduct programming current to program antifuses of the field programmable gate array extends between two adjacent columns of logic modules. First wire segments extend from the programming conductor and toward the logic modules of a first of the two adjacent columns. Second wire segments extend the opposite direction from the programming conductor and toward logic modules of the second of the two adjacent columns. Programming current used to program antifuses disposed along the first wire segments as well as antifuses disposed along the second wire segments can be supplied from the same programming conductor that extends between the two columns of logic modules. The logic modules of the first column are mirrored versions of the logic modules of the second column.
摘要翻译：现场可编程门阵列具有逻辑模块列。用于编程电流编程现场可编程门阵列的反熔丝的编程导体在两个相邻列的逻辑模块之间延伸。第一线段从编程导体延伸到两个相邻列中的第一个的逻辑模块。第二线段从编程导体向相反方向延伸，并且朝两个相邻列中的第二列的逻辑模块延伸。用于编程沿着第一线段设置的反熔丝的编程电流以及沿着第二线段设置的反熔丝可以从在两列逻辑模块之间延伸的相同编程导体提供。第一列的逻辑模块是第二列逻辑模块的镜像版本。

2. 发明授权

US6130554A Programmable integrated circuit having a test circuit for testing the integrity of routing resource structures 失效
标题翻译：具有用于测试路由资源结构的完整性的测试电路的可编程集成电路
公开(公告)号：US6130554A
公开(公告)日：2000-10-10
申请号：US932390
申请日：1997-09-17
申请人： Paige A. Kolze , Andrew K. Chan , James A. Apland
发明人： Paige A. Kolze , Andrew K. Chan , James A. Apland
IPC分类号： H02H9/00 , H03K17/22 , H03K19/177
CPC分类号： H03K19/17764 , H03K17/223 , H03K19/17736 , H03K19/1778 , H03K19/17796
摘要： A programmable integrated circuit (see FIG. 13) includes a plurality of routing resources including collinearly extending routing wire segments and a test circuit for testing the integrity of the routing wire segments. The routing resource structures include a plurality of unprogrammed antifuses disposed between routing wire segments and a plurality of transistors disposed electrically in parallel with a corresponding respective one of the antifuses. The test circuit has a common node that may be coupled to a selected one of the routing resource structures for testing. In test mode, the test circuit detects whether a current flows through the selected routing resource structure and in response provides either a digital low value or a digital high value on an output node.
摘要翻译：可编程集成电路（参见图13）包括多个路由资源，包括共线延伸的路由线段和用于测试路由线段完整性的测试电路。路由资源结构包括布置在布线线段与多个晶体管之间的多个未编程的反熔丝，所述多个晶体管与相应的相应一个反熔丝电并联放置。测试电路具有可以耦合到选择的一个路由资源结构以用于测试的公共节点。在测试模式下，测试电路检测电流是否流过所选择的路由资源结构，并且响应于在输出节点上提供数字低值或数字高值。

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