会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Cylindrical grating rotation sensor
    • 圆柱形光栅旋转传感器
    • US08345259B2
    • 2013-01-01
    • US12659781
    • 2010-03-22
    • Olivier ParriauxYves JourlinNikolay Lyndin
    • Olivier ParriauxYves JourlinNikolay Lyndin
    • G01B11/02
    • G01D5/38G01D5/24438G01D5/24476G01D5/3473
    • Disclosed is a Rotation sensor with a light source, a light detector, an internal part having a first lateral surface, which is globally cylindrical and convex, and an external part having a second lateral surface which is globally cylindrical and concave. The first and second lateral surfaces both have a same central axis defining a rotation axis for a relative rotation between the internal part and the external part the angle of which this rotation sensor can measure. A first grating is arranged at the first lateral surface with its grating lines parallel to the rotation axis, and a second grating is arranged at the second lateral surface with its grating lines parallel to said rotation axis.
    • 公开了具有光源的旋转传感器,光检测器,具有全局圆柱形和凸形的第一侧表面的内部部件和具有全局圆柱形和凹入的第二侧表面的外部部件。 第一和第二侧表面都具有相同的中心轴线,该中心轴线限定用于内部部件和外部部件之间的相对旋转的旋转轴线,该旋转传感器可测量的角度。 第一光栅布置在第一侧表面处,其光栅线平行于旋转轴线,并且第二光栅布置在第二侧表面处,其光栅线平行于所述旋转轴线。
    • 2. 发明申请
    • Cylindrical grating rotation sensor
    • 圆柱形光栅旋转传感器
    • US20100245841A1
    • 2010-09-30
    • US12659781
    • 2010-03-22
    • Olivier ParriauxYves JourlinNikolay Lyndin
    • Olivier ParriauxYves JourlinNikolay Lyndin
    • G01B9/02
    • G01D5/38G01D5/24438G01D5/24476G01D5/3473
    • Disclosed is a Rotation sensor with a light source, a light detector, an internal part having a first lateral surface, which is globally cylindrical and convex, and an external part having a second lateral surface which is globally cylindrical and concave. The first and second lateral surfaces both have a same central axis defining a rotation axis for a relative rotation between the internal part and the external part the angle of which this rotation sensor can measure. A first grating is arranged at the first lateral surface with its grating lines parallel to the rotation axis, and a second grating is arranged at the second lateral surface with its grating lines parallel to said rotation axis.
    • 公开了具有光源的旋转传感器,光检测器,具有全局圆柱形和凸形的第一侧表面的内部部件和具有全局圆柱形和凹入的第二侧表面的外部部件。 第一和第二侧表面都具有相同的中心轴线,该中心轴线限定用于内部部件和外部部件之间的相对旋转的旋转轴线,该旋转传感器可测量的角度。 第一光栅布置在第一侧表面处,其光栅线平行于旋转轴线,并且第二光栅布置在第二侧表面处,其光栅线平行于所述旋转轴线。
    • 5. 发明申请
    • DIFFRACTIVE POLARIZING MIRROR DEVICE
    • 偏振极化反射器件
    • US20110102877A1
    • 2011-05-05
    • US13002445
    • 2009-05-20
    • Olivier Parriaux
    • Olivier Parriaux
    • G02F1/03
    • G02B5/3058G02B5/1819G02B5/3041G02B5/3066G02B27/4261
    • A polarizing mirror device including an optical substrate (1) of real refractive index ns; a dielectric multilayer mirror (2), composed of dielectric layers of low and high refractive index; and a corrugated grating layer (6) of local period Λ at the side of a cover medium of refractive index nc. The local period Λ is selected such that upon substantially normal incidence of an incident wave at wavelength λ from the cover medium there is no diffraction order other than the 0th reflected order in the cover medium, such that the field of the +1st and −1st orders diffracted into the layers of the multilayer and into the optical substrate have a non-evanescent propagating character, and such that the respective angles under which the +1st and −1st orders propagate in each layer of said multilayer have an absolute value larger than or equal to the angle corresponding to the angular band edge of the central TM reflection band and, if a central TE reflection band of finite angular width exits, smaller than the angle corresponding to the angular band edge of this central TE reflection band in the angular spectrum of the multilayer at the wavelength λ with a fictive incident medium having the index of the considered layer of this multilayer.
    • 一种偏光镜装置,包括实际折射率ns的光学基片(1) 由低折射率和高折射率的电介质层构成的电介质多层反射镜(2) 以及在折射率nc的覆盖介质侧的局部周期Λ的波纹光栅层(6)。 局部周期Λ被选择为使得在覆盖介质上基本上正常入射波长为λ的入射波,除了覆盖介质中的第0反射次序之外,不存在衍射级,使得+ 1和-1的场 衍射到多层的层中并进入光学衬底的阶数具有非消逝的传播特性,并且使得在第一层和第一层顺序在第一层中传播的各个角度的绝对值大于或等于 等于对应于中心TM反射带的角带边缘的角度,并且如果有限角宽度的中心TE反射带出射,小于与角频谱中的该中心TE反射带的角带边缘对应的角度 的波长λ的多层膜,其中具有该多层膜所考虑的层的指数的虚构入射介质。
    • 6. 发明申请
    • Information carrier
    • 信息载体
    • US20070147221A1
    • 2007-06-28
    • US11636715
    • 2006-12-11
    • Olivier ParriauxAlexander TishchenkoReinhold Mutschler
    • Olivier ParriauxAlexander TishchenkoReinhold Mutschler
    • G11B7/24
    • G01D5/38G01D5/34707
    • The invention relates to an information carrier (10), having a metal layer (40) with at least one track (14) in which marks (20) are disposed, which can be detected by means of light of a central wavelength (λ) which is emitted by a light source (30) and which is incident upon the information carrier (10) at an angle (θi), and from which the position of the information carrier (10) can be derived, wherein the marks (20) are formed by areas (25) which are structured at least by first structures (22) of a lattice period (Λ) which are disposed on the back side (40b) of the metal layer (40) and/or on the front side (40a) of the metal layer (40), and wherein the lattice period (Λ) of the first structures (22) satisfies the equation Λ=λ/(np*−sin(⊖i)) or Λ=λ/(np*+sin(⊖i)), wherein λ is the central wavelength of the used light, ⊖i is the angle at which the light of the light source (30) is incident upon the information carrier (10) and np* is the effective index of a plasmon mode along the metal layer (40).
    • 本发明涉及一种具有金属层(40)的信息载体(10),所述金属层具有设置有标记(20)的至少一个轨道(14),其可通过中心波长(λ)的光检测, 其由光源(30)发射并且以角度θθ入射到信息载体(10)上,信息载体(10)的位置可以从该光源 其中所述标记(20)由至少由晶格周期(λ)的第一结构(22)构成的区域(25)形成,所述第一结构(22)设置在所述金属层(40)的背侧(40b)上 )和/或在金属层(40)的前侧(40a)上,并且其中第一结构(22)的晶格周期(λ)满足等式Lambda =λ/(n< p& )或λ=λ/(n + p + + sin(⊖i>)),其中λ 是所使用的光的中心波长,⊖是the的角度 所述光源(30)的光入射到所述信息载体(10)上,并且n是沿着所述金属层(40)的等离子体激元模式的有效折射率。
    • 7. 发明授权
    • Planar polarization transformer
    • 平面极化变压器
    • US09389351B2
    • 2016-07-12
    • US14118796
    • 2012-05-31
    • Thomas KaempfeOlivier Parriaux
    • Thomas KaempfeOlivier Parriaux
    • G02B5/30G02B5/18G02B27/28G06F17/50
    • G02B5/30G02B5/1809G02B5/1871G02B5/3083G02B27/286G06F17/50
    • The planar polarization transformer for a normally incident optical wave or beam having a given vacuum wavelength λ comprises an optical planar grating between a cover medium of refractive index nc and an optical substrate of refractive index ns, this planar grating defining a binary index modulation or corrugation of substantially rectangular profile with periodic ridges. This polarization transformer is characterized in that the ridge refractive index nr is larger than the substrate refractive index ns, the grating period Λ is larger than 0.4·λ/nc, the substrate refractive index ns is smaller than 2.7·nc, and the index modulation or corrugation is designed such that, according to the grating mode dispersion equation, the effective index of the mode TE0 is larger than the substrate index ns and the effective index of the mode TM0 is larger than the cover refractive index and smaller than the substrate index.
    • 具有给定真空波长λ的正常入射光波或光束的平面偏振变换器包括折射率为nc的覆盖介质和折射率为ns的光学基板之间的光学平面光栅,该平面光栅限定二进制索引调制或波纹 具有周期性脊的大致矩形轮廓。 该偏振变换器的特征在于,脊折射率nr大于基板折射率ns,光栅周期Λ大于0.4·λ/ nc,基板折射率ns小于2.7·nc,折射率调制 或波纹被设计成使得根据光栅模式色散方程,模式TE0的有效指数大于衬底指数ns,并且模式TM0的有效指数大于覆盖折射率并且小于衬底指数 。
    • 8. 发明授权
    • Force meter with optical waveguide integrated in a substrate
    • 强度计与光波导集成在基板中
    • US4984863A
    • 1991-01-15
    • US410520
    • 1989-09-21
    • Olivier ParriauxVictor NeumanGuy Voirin
    • Olivier ParriauxVictor NeumanGuy Voirin
    • G01L1/24G02B6/00G02B6/12G02F1/01
    • G01L1/243
    • An optical waveguide force meter for the measurement of forces or stresses integrated on a single substrate, including: a single-mode transducer waveguide supporting only the stresses which are applied through the intermediate portion of an upper plate of the force meter; a coupling/mixing grating having N focussing concave gratings provided adjacent an exit end of the optical waveguide; N detectors arranged at each of the N focussing points of waves defracted by the coupling/mixing grating; N TM polarization filters arranged respectively between each concave grating and each detector; and a single-mode laser source. The waveguide, coupling/mixing grating and polarization filters are all provided on the single substrate. The single-mode laser source and detectors are supported by the substrate and by an underlying base plate member.
    • 一种用于测量集成在单个基板上的力或应力的光波导力计,包括:单模式换能器波导,其仅支撑通过力计的上板的中间部分施加的应力; 耦合/混合光栅,其具有邻近光波导的出射端设置的N个聚焦凹形光栅; N个检测器布置在由耦合/混合光栅消除的波的N个聚焦点中的每一个处; N TM偏振滤光器分别布置在每个凹光栅和每个检测器之间; 和单模激光源。 波导,耦合/混合光栅和偏振滤光片都在单个基板上提供。 单模激光源和检测器由衬底和底层基板构件支撑。
    • 10. 发明授权
    • Diffractive polarizing mirror device
    • 衍射偏振镜装置
    • US08238025B2
    • 2012-08-07
    • US13002445
    • 2009-05-20
    • Olivier Parriaux
    • Olivier Parriaux
    • G02B5/30G02B27/44
    • G02B5/3058G02B5/1819G02B5/3041G02B5/3066G02B27/4261
    • A polarizing mirror device including an optical substrate (1) of real refractive index ns; a dielectric multilayer mirror (2), composed of dielectric layers of low and high refractive index; and a corrugated grating layer (6) of local period Λ at the side of a cover medium of refractive index nc. The local period Λ is selected such that upon substantially normal incidence of an incident wave at wavelength λ from the cover medium there is no diffraction order other than the 0th reflected order in the cover medium, such that the field of the +1st and −1st orders diffracted into the layers of the multilayer and into the optical substrate have a non-evanescent propagating character, and such that the respective angles under which the +1st and −1st orders propagate in each layer of said multilayer have an absolute value larger than or equal to the angle corresponding to the angular band edge of the central TM reflection band and, if a central TE reflection band of finite angular width exits, smaller than the angle corresponding to the angular band edge of this central TE reflection band in the angular spectrum of the multilayer at the wavelength λ with a fictive incident medium having the index of the considered layer of this multilayer.
    • 一种偏光镜装置,包括实际折射率ns的光学基片(1) 由低折射率和高折射率的电介质层构成的电介质多层反射镜(2) 以及在折射率nc的覆盖介质侧的局部周期Λ的波纹光栅层(6)。 局部周期Λ被选择为使得在覆盖介质上基本上正常入射波长为λ的入射波,除了覆盖介质中的第0反射次序之外,不存在衍射级,使得+ 1和-1的场 衍射到多层的层中并进入光学衬底的阶数具有非消逝的传播特性,并且使得在第一层和第一层顺序在第一层中传播的各个角度的绝对值大于或等于 等于对应于中心TM反射带的角带边缘的角度,并且如果有限角宽度的中心TE反射带出射,小于与角频谱中的该中心TE反射带的角带边缘对应的角度 的波长λ的多层膜,其中具有该多层膜所考虑的层的指数的虚构入射介质。