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1. 发明授权

US10444187B2 System and method for electrical characterization of electrical materials 有权
公开(公告)号：US10444187B2
公开(公告)日：2019-10-15
申请号：US15690624
申请日：2017-08-30
申请人： Northwestern University
发明人： Matthew Grayson , Jiajun Luo
IPC分类号： G01N27/72 , G01R19/08 , H05K1/11 , G01R15/20 , G01R31/26
摘要： Systems and methods can provide a fast and accurate way to measure conductivity and Hall effect, such that transient conductivities, transient carrier densities or transient mobilities can be measured on millisecond time scales, for example. The systems and methods can also reduce the minimum magnetic field needed to extract carrier density or mobility of a given sample, and reduce the minimum mobility that can be measured with a given magnetic field.

2. 发明授权

US10720560B2 System and method for nanowire-array transverse thermoelectrics 有权
公开(公告)号：US10720560B2
公开(公告)日：2020-07-21
申请号：US14850014
申请日：2015-09-10
申请人： Northwestern University
发明人： Matthew Grayson , Mark C Hersam , Chuanle Zhou , Yang Tang , Tejas Shastry
IPC分类号： H01L35/32 , H01L35/22 , H01L35/34 , H01L35/24 , H01L35/16 , H01L35/18
摘要： A transverse thermoelectric includes a first array of hole-conducting nanowires and a second array of electron-conducting nanowires positioned orthogonal to the first array of nanowires. A substrate provides structure to the first array of nanowires and the second array of nanowires.

3. 发明申请

US20160079509A1 System and Method for Nanowire-Array Transverse Thermoelectrics 审中-公开
标题翻译：纳米线阵列横向热电的系统与方法
公开(公告)号：US20160079509A1
公开(公告)日：2016-03-17
申请号：US14850014
申请日：2015-09-10
申请人： Northwestern University
发明人： Matthew Grayson , Mark C. Hersam , Chuanle Zhou , Yang Tang , Tejas Shastry
IPC分类号： H01L35/32 , H01L35/24 , H01L35/18 , H01L35/34 , H01L35/22 , H01L35/16
摘要： A transverse thermoelectric includes a first array of hole-conducting nanowires and a second array of electron-conducting nanowires positioned orthogonal to the first array of nanowires. A substrate provides structure to the first array of nanowires and the second array of nanowires.
摘要翻译：横向热电包括空穴传导纳米线的第一阵列和与第一纳米线阵列正交设置的电子传导纳米线的第二阵列。衬底提供纳米线的第一阵列和第二纳米线阵列的结构。

4. 发明申请

US20210307731A1 MEDICAL SWAB 有权
公开(公告)号：US20210307731A1
公开(公告)日：2021-10-07
申请号：US17221200
申请日：2021-04-02
申请人： Northwestern University
发明人： Matthew Grayson , Jun Peng , Jiaxing Huang , Guillermo Ameer , Nancy Rivera Bolanos
IPC分类号： A61B10/00
摘要： A medical swab includes a hollow tube shaft that has a distal end and a proximal end. A swab tip is mounted to the hollow tube shaft such that a first portion of the swab tip is positioned within the distal end of the hollow tube shaft and a second portion of the swab tip extends out from the distal end of the hollow tube shaft.

5. 发明申请

US20200381607A1 FLEXIBLE WOVEN THERMOELECTRIC FABRICS FOR THERMAL MANAGEMENT 审中-公开
公开(公告)号：US20200381607A1
公开(公告)日：2020-12-03
申请号：US16970867
申请日：2019-03-07
申请人： Northwestern University
发明人： Matthew Grayson , Ramille Shah , Jun Peng , Adam Jakus , Nicholas Geisendorfer
IPC分类号： H01L35/32 , A41D1/00 , H01L35/26 , H01L35/34 , D03D1/00 , D03D15/00
摘要： Woven flexible thermoelectric fabrics are provided. The fabric is a woven material that includes a series of longitudinal threads interwoven with a series of transverse threads. Within the longitudinal series, the threads have a repeating thread pattern of an n-type thermoelectric thread, a p-type thermoelectric thread, and an insulating thread. Within the transverse series, the threads have a repeating thread pattern of a first double-sided thread with conducting side down and insulating side up, a second double-sided thread with conducting side down and insulating side up, and a third double-sided thread with conducting side up and insulating side down.

6. 发明授权

US10215796B2 System and method for deducing charge density gradients in doped semiconductors 有权
公开(公告)号：US10215796B2
公开(公告)日：2019-02-26
申请号：US15151216
申请日：2016-05-10
申请人： Northwestern University
发明人： Matthew Grayson , Wang Zhou
IPC分类号： G01R31/26
摘要： A system and a method determine a quality of a doped semiconductor layer in terms of a charge carrier density gradient by measuring two magnetic-field-dependent resistances using four contacts of a specimen.

7. 发明申请

US20130174884A1 ANISOTROPIC AMBIPOLAR TRANSVERSE THERMOELECTRICS AND METHODS FOR MANUFACTURING THE SAME 有权
标题翻译：各向异性金属横向热电及其制造方法
公开(公告)号：US20130174884A1
公开(公告)日：2013-07-11
申请号：US13735373
申请日：2013-01-07
申请人： Northwestern University
发明人： Matthew Grayson , Chuanle Zhou
IPC分类号： H01L35/28 , H01L21/18 , H01L35/18
CPC分类号： H01L35/28 , H01L21/18 , H01L35/18 , H01L35/26
摘要： A transverse thermoelectric device includes a superlattice body, electrically conductive first and second contacts, and first and second thermal contacts. The superlattice body extends between opposite first and second ends along a first direction and between opposite first and second sides along a different, second direction. The superlattice body includes alternating first and second layers of crystalline materials oriented at an oblique angle relative to the first direction. The electrically conductive first contact is coupled with the first end of the superlattice and the electrically conductive second contact is coupled with the second end of the superlattice. The first thermal contact is thermally coupled to the first side of the superlattice and the second thermal contact is thermally coupled to the second side of the superlattice. A Seebeck tensor of the superlattice body is ambipolar.
摘要翻译：横向热电装置包括超晶格体，导电的第一和第二触点以及第一和第二热触点。超晶格主体沿着第一方向在相对的第一和第二端之间沿着不同的第二方向在相对的第一和第二侧之间延伸。超晶格体包括相对于第一方向以倾斜角度定向的交替的第一和第二结晶材料层。导电的第一触点与超晶格的第一端耦合，并且导电的第二触点与超晶格的第二端耦合。第一热接触件热耦合到超晶格的第一侧，并且第二热接触件热耦合到超晶格的第二侧。超晶格体的塞贝克张量是双极的。

8. 发明授权

US11525847B2 Seebeck cancellation switch for precision DC voltage measurements 有权
公开(公告)号：US11525847B2
公开(公告)日：2022-12-13
申请号：US17484939
申请日：2021-09-24
申请人： NORTHWESTERN UNIVERSITY
发明人： Matthew Grayson , Chulin Wang , Juncen Li , William H. Reinhardt
IPC分类号： G01R19/00 , G01R33/07 , H01L35/28
摘要： Systems and methods include an electrical switch that establishes a first electrical conducting path between terminals of an electrical measurement apparatus through one or more electrical leads and an electrically-conductive sample in a first state, and a second electrical conducting path between the terminals through the one or more electrical leads while bypassing the sample in a second state. A voltage VS+L is measured across all of the sample and the one or more electrical leads in the first state, while a voltage VL is measured across the one or more electrical leads while bypassing the sample in the second state. Calculations according to the equation VS=VS+L−VL are performed to determine a precision DC voltage measurement of a voltage across the sample VS in the absence of Seebeck voltage offsets contributed by the one or more electrical leads.

9. 发明申请

US20220099711A1 SEEBECK CANCELLATION SWITCH FOR PRECISION DC VOLTAGE MEASUREMENTS 有权
公开(公告)号：US20220099711A1
公开(公告)日：2022-03-31
申请号：US17484939
申请日：2021-09-24
申请人： NORTHWESTERN UNIVERSITY
发明人： Matthew Grayson , Chulin Wang , Juncen Li , William H. Reinhardt
IPC分类号： G01R19/00 , H01L35/28 , G01R33/07
摘要： Systems and methods include an electrical switch that establishes a first electrical conducting path between terminals of an electrical measurement apparatus through one or more electrical leads and an electrically-conductive sample in a first state, and a second electrical conducting path between the terminals through the one or more electrical leads while bypassing the sample in a second state. A voltage VS+L is measured across all of the sample and the one or more electrical leads in the first state, while a voltage VL is measured across the one or more electrical leads while bypassing the sample in the second state. Calculations according to the equation VS=VS+L−VL are performed to determine a precision DC voltage measurement of a voltage across the sample VS in the absence of Seebeck voltage offsets contributed by the one or more electrical leads.

10. 发明授权

US10529674B2 System and method for stripline electrodes for thin-film characterization 有权
公开(公告)号：US10529674B2
公开(公告)日：2020-01-07
申请号：US15823933
申请日：2017-11-28
申请人： Northwestern University
发明人： Matthew Grayson , Yang Tang
IPC分类号： H01L23/58 , H05K3/32 , G01R1/067 , H01L23/52 , H01L21/66 , G01R15/20 , G01R27/14 , G01R31/28
摘要： Systems and methods provide a device for characterizing a thin film, including a conducting or insulating substrate, an active layer on the conducting or insulating substrate to be characterized, and a plurality of stripline electrodes on the active layer. The plurality of stripline electrodes include a pitch width of a same order as the thickness of the active layer and strip width smaller than the thickness of the active layer.

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