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    • 1. 发明授权
    • Cube corner article with altered inactive areas and method of making same
    • 具有改变的非活动区域的立方体角文章及其制作方法
    • US5940212A
    • 1999-08-17
    • US960841
    • 1997-10-30
    • Norbert L. JohnsonTheodore J. SzczechBruce D. Orensteen
    • Norbert L. JohnsonTheodore J. SzczechBruce D. Orensteen
    • G02B5/124G02B5/122
    • G02B5/124Y10S359/90
    • A reflective article has a structured surface which includes geometric structures each having at least three specularly reflecting faces which converge at an apex or other extremity. The article is marked with a plurality of spots located between the extremities, the spots having different reflectivity characteristics than the specularly reflecting faces. The geometric structures can comprise cube corner elements. The spots can be diffusely reflecting and distributed uniformly on the structured surface or distributed to define a particular pattern. The article can have a plurality of first active areas at a first illumination geometry, and the spots can be sized and positioned such that they avoid the first active areas. The article can have first inactive areas adjacent the first active areas, and each spot can cover a majority of one inactive area. Alternatively, at least some of the spots can be decentered within their respective inactive areas such that they are visible in retroreflected light only at selected illumination geometries, thereby forming a directional image.
    • 反射制品具有结构化表面,其包括几何结构,每个结构具有至少三个在顶点或其他末端会聚的镜面反射面。 该物品被标记有位于四肢之间的多个斑点,这些斑点具有与镜面反射面不同的反射特性。 几何结构可以包括立体角元件。 斑点可以在结构化表面上均匀地反射和均匀分布或分布以限定特定图案。 物品可以具有在第一照明几何形状的多个第一有源区域,并且斑点可以被定尺寸和定位,使得它们避开第一有源区域。 物品可以具有与第一有效区域相邻的第一非活动区域,并且每个斑点可以覆盖一个非活动区域的大部分。 或者,至少一些点可以在它们各自的无效区域内偏心,使得它们仅在选定的照明几何形状下在回射光中可见,从而形成定向图像。
    • 2. 发明申请
    • APPARATUS FOR MEASURING THE RETROREFLECTANCE OF MATERIALS
    • 用于测量材料回退的装置
    • US20120287432A1
    • 2012-11-15
    • US13106576
    • 2011-05-12
    • Stephen K. EckhardtNorbert L. Johnson
    • Stephen K. EckhardtNorbert L. Johnson
    • G01J3/28G01N21/55
    • G01J3/42G01J3/0229G01N21/55G01N2021/551
    • The present invention comprises various embodiments of a retroreflectometer capable of measuring the retroreflectance of a material. The retroreflectometer comprises an illumination path and a retroreflection path. The illumination path comprises focusing optics, a source aperture, a beamsplitter and a collimating lens. The retroreflection path comprises a focusing lens, a beamsplitter, a receiver aperture and a receiver. The source aperture shapes the transverse profile of the light to make it appropriate to the measurement. Focusing optics, such as a biconvex lens, may be placed between the light source and the source aperture. After the beam is reflected by the object under test, it enters the retroreflection path of the instrument. The focusing lens focuses the light through the beamsplitter and onto the receiver aperture. The receiver aperture may be the input slit for a spectrometer, or there may be optics, such as a lens or an optical fiber, that transfer the light from the aperture to the receiver. A photopically corrected detector, multiple detectors with filters or a spectrometer may be used in various embodiments of the present invention as the receiver.
    • 本发明包括能够测量材料的后向反射率的回射计的各种实施例。 后向反射计包括照明路径和回射路径。 照明路径包括聚焦光学元件,源孔径,分束器和准直透镜。 回射路径包括聚焦透镜,分束器,接收器孔径和接收器。 源孔径使光的横向轮廓成形,使其适合于测量。 可将聚焦光学元件(例如双凸透镜)放置在光源和光源孔之间。 光束被被测物体反射后,进入仪器的回射路径。 聚焦透镜通过分光镜将光线聚焦到接收器孔上。 接收器孔可以是用于光谱仪的输入狭缝,或者可以存在将光从孔转移到接收器的光学器件,例如透镜或光纤。 在本发明的各种实施例中,可以使用光学校正的检测器,具有滤波器或光谱仪的多个检测器作为接收器。
    • 3. 发明授权
    • Retroluminometer
    • 回光光度计
    • UST987003I4
    • 1979-10-02
    • US929299
    • 1978-07-31
    • Norbert L. JohnsonMichael J. Knowd
    • Norbert L. JohnsonMichael J. Knowd
    • G01N21/55
    • G01N21/55
    • a retroluminometer for measuring retroreflectivity of signs or markings at their actual point of use comprises (1) a source of alternating light; (2) optical means for both directing the alternating light onto a sign or marking that is to be tested and for transmitting light retroreflected by the sign or marking onto a panel within the retroluminometer; (3) a matrix of light-transmitting means arranged on the face of the panel; (4) photosensing means optically connected to the light-transmitting means and adjustable to sense and measure the light from different ones of the light-transmitting means, thereby measuring retroreflection at different angles of deviation from the axis of the light beam incident on the sign or marking; and (5) electric circuitry for presenting the photosensed light as a visually-readable measurement. The electric circuitry includes filtering circuitry for filtering out signals having a frequency different from that of the alternating source so as to eliminate the effect of ambient or extraneous light.
    • 4. 发明授权
    • Apparatus for measuring the retroreflectance of materials
    • 用于测量材料后向反射的装置
    • US08675194B2
    • 2014-03-18
    • US13106576
    • 2011-05-12
    • Stephen K. EckhardtNorbert L. Johnson
    • Stephen K. EckhardtNorbert L. Johnson
    • G01J3/28
    • G01J3/42G01J3/0229G01N21/55G01N2021/551
    • The present invention comprises various embodiments of a retroreflectometer capable of measuring the retroreflectance of a material. The retroreflectometer comprises an illumination path and a retroreflection path. The illumination path comprises focusing optics, a source aperture, a beamsplitter and a collimating lens. The retroreflection path comprises a focusing lens, a beamsplitter, a receiver aperture and a receiver. The source aperture shapes the transverse profile of the light to make it appropriate to the measurement. Focusing optics, such as a biconvex lens, may be placed between the light source and the source aperture. After the beam is reflected by the object under test, it enters the retroreflection path of the instrument. The focusing lens focuses the light through the beamsplitter and onto the receiver aperture. The receiver aperture may be the input slit for a spectrometer, or there may be optics, such as a lens or an optical fiber, that transfer the light from the aperture to the receiver. A photopically corrected detector, multiple detectors with filters or a spectrometer may be used in various embodiments of the present invention as the receiver.
    • 本发明包括能够测量材料的后向反射率的回射计的各种实施例。 后向反射计包括照明路径和回射路径。 照明路径包括聚焦光学元件,源孔径,分束器和准直透镜。 回射路径包括聚焦透镜,分束器,接收器孔径和接收器。 源孔径使光的横向轮廓成形,使其适合于测量。 可将聚焦光学元件(例如双凸透镜)放置在光源和光源孔之间。 光束被被测物体反射后,进入仪器的回射路径。 聚焦透镜通过分光镜将光线聚焦到接收器孔上。 接收器孔可以是用于光谱仪的输入狭缝,或者可以存在将光从孔转移到接收器的光学器件,例如透镜或光纤。 在本发明的各种实施例中,可以使用光学校正的检测器,具有滤波器或光谱仪的多个检测器作为接收器。