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    • 1. 发明授权
    • Sensitivity-calibration circuit for use in an absorption analyzer
    • 用于吸收分析仪的灵敏度校准电路
    • US4766304A
    • 1988-08-23
    • US906016
    • 1986-09-11
    • Nobutaka KiharaIchiro AsanoKennosuke Kojima
    • Nobutaka KiharaIchiro AsanoKennosuke Kojima
    • G01N21/27H01J40/14
    • G01N21/274
    • A sensitivity calibration circuit for use in an absorption analyzer provided with a check-signal generator for easily checking the sensitivity, includes a temperature compensating circuit for use in an optical system for compensating for a temperature draft due to said optical system and a temperature compensation circuit for use in a sample system for compensating for a temperature draft due to the sample system. The temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are separately provided and a switch is provided which is switchable to a measuring state in which both the temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are used and is switchable to a checking state in which the temperature compensation circuit for use in a sample system is disconnected so as not to be used but the temperature compensation circuit for use in an optical system is used.
    • 一种灵敏度校准电路,用于具有用于容易地检测灵敏度的检查信号发生器的吸收分析仪中,包括用于补偿由于所述光学系统导致的温度上升的光学系统的温度补偿电路和温度补偿电路 用于样品系统,用于补偿由于样品系统导致的温度上升。 分别设置用于光学系统的温度补偿电路和用于样本系统的温度补偿电路,并提供开关,该开关可切换到测量状态,其中在光学系统中使用的温度补偿电路和 使用用于采样系统的温度补偿电路,并且可切换到检查状态,其中用于采样系统中的温度补偿电路被断开以便不被使用,但是用于光学系统的温度补偿电路 用来。
    • 5. 发明授权
    • Multi-component analyzing apparatus
    • 多分量分析仪
    • US07071470B2
    • 2006-07-04
    • US10659436
    • 2003-09-11
    • Toshiyuki NomuraHiroji KohsakaKennosuke KojimaIchiro AsanoNaoyuki Matsumoto
    • Toshiyuki NomuraHiroji KohsakaKennosuke KojimaIchiro AsanoNaoyuki Matsumoto
    • G01N21/35
    • G01N21/3504
    • A multi-component analyzing apparatus in which infrared light is irradiated to a measuring-subject sample S which is constituted by either measuring-subject components whose sorts or quantities are limited or by a mixed article made of said measuring-subject components; intensity of infrared light having respective wavelength ranges which are fitted to infrared absorption spectra of the respective measuring-subject components among such infrared light penetrated through the measuring-subject sample S is measured by employing a plurality of detectors 4a to 4g corresponding thereto; and said multi-component analyzing apparatus is comprised of a calculation processing unit 6 for analyzing the infrared light intensity of the respective wavelength ranges so as to acquire concentration x1 to x7 of the respective measuring-subject components; wherein the calculation processing unit 6 is capable of executing an analyzing process program P for executing analysis operations of the concentration x1 to x7 of the respective measuring-subject components by solving simultaneous equations which are constituted by equations having mutual interference correction terms used to correct interference adverse influences occurred among the respective measuring-subject components.
    • 一种多组分分析装置,其中红外光照射到由测量对象部件或其数量受限制的测量对象样品S或由所述测量对象部件制成的混合物体; 通过使用与其对应的多个检测器4a〜4g来测量具有各自的波长范围的红外光的强度,该红外光适合于通过测量对象样品S穿透的红外光中的各测量对象成分的红外吸收光谱; 并且所述多分量分析装置包括:计算处理单元6,用于分析各个波长范围的红外光强度,以获得浓度x 1至x 7 的各个测量对象部件; 其中计算处理单元6能够执行分析处理程序P,用于通过求解各个测量对象分量来执行浓度x 1至x 7的分析操作 在相应的测量对象分量之间发生由用于校正干扰不利影响的相互干扰校正项的等式构成的联立方程。
    • 8. 发明授权
    • Optical detector
    • 光学探测器
    • US06777683B2
    • 2004-08-17
    • US10072960
    • 2002-02-12
    • Kennosuke KojimaMasahiko IshidaShuji Takada
    • Kennosuke KojimaMasahiko IshidaShuji Takada
    • G01N2161
    • G01N21/35G01J1/0271G01J1/04G01J1/0488G01J1/4228G01J3/36G01J5/602
    • An optical detector 1 wherein detection elements 11, 12, 13 and 14 are provided in a sealed case 4 whose opening portion 3 is blocked with a window material 2 for transmitting light such as an infrared and an ultraviolet ray therethrough, the detection elements being formed opposite to the window material; and optical filters 21, 22, 23 and 34 are disposed between the window material 2 and the detection elements 11, 12, 13 and 14 and used for selecting and causing only light composed of a predetermined band of wavelengths to be transmitted by thin optical films in connection with the detection elements 11, 12, 13 and 14. The optical detector includes a shielding body 9 having housing portions 28, 29, 30 and 31 for containing the optical filters 21, 22, 23 and 24 and used for preventing any light composed of other than the predetermined band of wavelength selected by the thin optical films and preventing light producing an interference effect during measurement from being transmitted through the optical filters 21, 22, 23 and 24.
    • 光检测器1,其中检测元件11,12,13和14设置在其开口部分3被用于透射诸如红外线和紫外线的光的窗口材料2阻挡在其中的密封壳体4中,形成检测元件 与窗材相对; 并且光学滤光器21,22,23和34设置在窗材料2和检测元件11,12,13和14之间,并且用于选择并且仅使由光学薄膜透射由预定波长带组成的光 与检测元件11,12,13和14相关。光学检测器包括屏蔽体9,屏蔽体9具有用于容纳滤光器21,22,23和24并用于防止任何光的壳体部分28,29,30和31 由除了由薄型光学膜选择的波长的预定波段以外的光线组成,并且防止在测量期间产生干涉效应的光透过光学滤波器21,22,23和24。