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    • 2. 发明授权
    • Pressure compensating device for optical apparatus
    • 光学仪器用压力补偿装置
    • US07082003B2
    • 2006-07-25
    • US10415213
    • 2002-03-19
    • Nico CorrensUllrich KlarnerWerner HoymeFelix Kerstan
    • Nico CorrensUllrich KlarnerWerner HoymeFelix Kerstan
    • G02B7/02H01J3/14
    • G02B27/0006G01J3/02G01J3/0286G01J5/02G01J5/0285G02B7/02
    • In order to provide an arrangement for pressure compensation for optical devices, particularly spectrometers or the like optical devices, for compensating pressure differences caused by changes in temperature and air pressure between the internal pressure and the external pressure at a housing of an optical device enclosing optical units, which arrangement prevents a contamination of optical functional surfaces of the optical units of the optical device and ensures a constant pressure balance between the interior space and the external surroundings of the housing of an optical device with its optical units while economizing on manufacturing costs, it is proposed that the arrangement for pressure compensation comprises at least one pressure compensating element which is constructed on both sides so as to be permeable to air and which is arranged in a housing opening of the housing wall of the optical device enclosing the optical units.
    • 为了提供用于光学装置,特别是光谱仪等的光学装置的压力补偿装置,用于补偿由封闭光学装置的光学装置的壳体处的内部压力和外部压力之间的温度和空气压力变化引起的压力差 单元,这种布置防止光学装置的光学单元的光学功能表面的污染,并且通过其光学单元确保光学装置的壳体的内部空间和外部周围之间的恒定的压力平衡,同时节省制造成本, 提出了用于压力补偿的装置包括至少一个压力补偿元件,该压力补偿元件构造在两侧以便能够透过空气并且布置在包围光学单元的光学装置的壳体壁的壳体开口中。
    • 3. 发明申请
    • Arrangement for Determining the Reflectivity of a Sample
    • 用于确定样品反射率的布置
    • US20110007319A1
    • 2011-01-13
    • US12745158
    • 2008-12-10
    • Nico CorrensWerner HoymeFelix KerstanThomas KeuneWilhelm Schebesta
    • Nico CorrensWerner HoymeFelix KerstanThomas KeuneWilhelm Schebesta
    • G01N21/55
    • G01N21/276G01N21/4738G01N2021/4742
    • The invention relates to an arrangement for measuring the reflectivity of the direct or scattered reflection of a sample (8), having a light source for separately lighting the sample (8) and of comparative surfaces. The arrangement comprises, in addition to the light source, preferably a reflector lamp (2), —a white standard (6), a black standard (7), and the surface of the sample (8) for embodying a measurement surface, wherein the exchange of the white standard (6), the black standard (7) and the sample (8) is provided in a prescribed sequence relative to each other, —means for measuring the intensity of the light reflected from an internal white surface (10) and for measuring the intensity of the light reflected from each measuring surface, and—an evaluation circuit designed for registering the measured intensity values and for linking the same mathematically to the reflectivity.
    • 本发明涉及一种用于测量样品(8)的直接或散射反射的反射率的装置,其具有用于分别照亮样品(8)和比较表面的光源。 除了光源之外,该装置优选地包括反射灯(2),白色标准(6),黑色标准(7)和用于体现测量表面的样品(8)的表面,其中 以规定的顺序相对于白色标准(6),黑色标准(7)和样品(8)的交换提供 - 用于测量从内部白色表面(10)反射的光的强度 )并且用于测量从每个测量表面反射的光的强度,以及设计用于记录所测量的强度值并将数学上与反射率相关联的评估电路。
    • 6. 发明授权
    • Spectrometric measuring probe and method for recalibrating the same
    • 光谱测量探头及其重新校准方法
    • US07671984B2
    • 2010-03-02
    • US11587453
    • 2005-04-26
    • Wilhelm SchebestaWerner HoymeMichael RodeNico CorrensMartin Goetz
    • Wilhelm SchebestaWerner HoymeMichael RodeNico CorrensMartin Goetz
    • G01J3/28
    • G01N21/274G01N21/474
    • An arrangement for measuring the diffuse reflection of samples and a method for internal recalibration of the measuring head. The spectrometric measuring head with a device for recalibration comprises a housing which is provided with a window and which contains an illumination source, a spectrometer arrangement and at least two standards for internal recalibration. The two standards can be swiveled into the beam path of the measuring head selectively so that the measurement light emitted by the illumination source can be used in its entirety for recalibration. A processor for acquiring and processing measured values and an interface to a bus system are arranged in the housing. Accordingly, relatively time-consuming calibration of the measuring head at the place of use is required only before putting into operation or at longer time intervals. By the internal recalibrations, it is possible to prevent changes in the measured values in long-term operation.
    • 用于测量样品的漫反射的装置和用于测量头的内部重新校准的方法。 具有用于重新校准的装置的光谱测量头包括设置有窗口的壳体,其包含照明源,光谱仪布置和用于内部重新校准的至少两个标准。 这两个标准可以选择性地旋转到测量头的光束路径中,使得由照明源发射的测量光可以被整体用于重新校准。 用于获取和处理测量值的处理器和与总线系统的接口被布置在壳体中。 因此,只有在投入使用之前或以更长的时间间隔才需要相对耗时的测量头在使用地点的校准。 通过内部重新校准,可以防止长期运行中测量值的变化。
    • 9. 发明申请
    • Spectrometric Measuring Probe and Method for Recalibrating the Same
    • 光谱测量探头及其重新校准方法
    • US20070236692A1
    • 2007-10-11
    • US11587453
    • 2006-06-01
    • Wilhelm SchebestaWerner HoymeMichael RodeNico CorrensMartin Goetz
    • Wilhelm SchebestaWerner HoymeMichael RodeNico CorrensMartin Goetz
    • G01J3/30
    • G01N21/274G01N21/474
    • The present invention is directed to an arrangement for measuring the diffuse reflection of samples and to a method for the internal recalibration of the measuring head. According to the invention, the spectrometric measuring head with means for recalibration comprises a housing which is provided with a window and which contains an illumination source, a spectrometer arrangement and at least two standards for internal recalibration. The two standards can be swiveled into the beam path of the measuring head selectively in such a way that the measurement light emitted by the illumination source can be used in its entirety for recalibration. Further, a processor for acquiring and processing the measured values and an interface to a bus system are arranged in the housing. With the solution according to the invention, the relatively time-consuming calibration of the measuring head at the place of use is required only before putting into operation or at longer time intervals. By means of the internal recalibrations, it is possible to prevent changes in the measured values in long-term operation. The proposed solution can be applied for measurements in the VIS and NIR range.
    • 本发明涉及用于测量样品的漫反射的装置和用于测量头的内部重新校准的方法。 根据本发明,具有用于重新校准的装置的光谱测量头包括设置有窗口的壳体,其包含照明源,光谱仪布置和用于内部重新校准的至少两个标准。 这两个标准可以选择性地旋转到测量头的光束路径中,使得由照明源发射的测量光可以被整体地用于重新校准。 此外,用于获取和处理测量值的处理器以及与总线系统的接口被布置在壳体中。 利用根据本发明的解决方案,仅在投入使用之前或以更长的时间间隔才需要在使用地点测量头相对耗时的校准。 通过内部重新校准,可以防止长期运行中测量值的变化。 提出的解决方案可以应用于VIS和NIR范围内的测量。