专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20180089484A1 BIOLOGICAL PATTERN INFORMATION PROCESSING DEVICE, BIOLOGICAL PATTERN INFORMATION PROCESSING METHOD, AND PROGRAM 审中-公开
公开(公告)号：US20180089484A1
公开(公告)日：2018-03-29
申请号：US15563211
申请日：2016-03-30
申请人： NEC CORPORATION , NEC Solution Innovators, Ltd.
发明人： Kan SATOU , Yoshinori SUZUKI , Masanori MIZOGUCHI , Masanori HARA
IPC分类号： G06K9/00
CPC分类号： G06K9/001 , A61B5/117 , G06K9/0008 , G06T7/00
摘要： A biological pattern information processing device includes: a biological pattern information acquisition unit that acquires biological pattern information indicating a biological pattern; and a singular region detection unit that detects a singular region including damage, from the biological pattern indicated by the acquired biological pattern information.

2. 发明申请

US20210303821A1 TENRPRINT CARD INPUT DEVICE, TENRPRINT CARD INPUT METHOD AND STORAGE MEDIUM 有权
公开(公告)号：US20210303821A1
公开(公告)日：2021-09-30
申请号：US17345758
申请日：2021-06-11
申请人： NEC CORPORATION
发明人： Masanori HARA , Tatsuya SHIMAHARA
IPC分类号： G06K9/00 , G06K9/34 , G06T7/73
摘要： A fingerprint image processing device includes a memory, and a processor coupled to the memory. The processor performs operations. The operations include reading a tenprint card image which includes a plurality of fingerprint patterns and at least one ruled line to separate one fingerprint imprint area from another fingerprint imprint area, and extracting from the tenprint card image a fingerprint image which includes at least one of the fingerprint patterns, apart of a fingerprint imprint area, and a part of a next fingerprint imprint area.

3. 发明申请

US20210326552A1 BIOLOGICAL PATTERN INFORMATION PROCESSING DEVICE, BIOLOGICAL PATTERN INFORMATION PROCESSING METHOD, AND PROGRAM 有权
公开(公告)号：US20210326552A1
公开(公告)日：2021-10-21
申请号：US17364164
申请日：2021-06-30
申请人： NEC CORPORATION
发明人： Kan SATOU , Yoshinori SUZUKI , Masanori MIZOGUCHI , Masanori HARA
IPC分类号： G06K9/00 , A61B5/117 , G06T7/00
摘要： A biological pattern information processing device includes: a biological pattern information acquisition unit that acquires biological pattern information indicating a biological pattern; and a singular region detection unit that detects a singular region including damage, from the biological pattern indicated by the acquired biological pattern information.

4. 发明申请

US20200218879A1 MINUTIA FEATURES GENERATION APPARATUS, SYSTEM, MINUTIA FEATURES GENERATION METHOD, AND PROGRAM 审中-公开
公开(公告)号：US20200218879A1
公开(公告)日：2020-07-09
申请号：US16628537
申请日：2018-07-05
申请人： NEC CORPORATION
发明人： Masanori HARA
IPC分类号： G06K9/00
摘要： Provided is a minutia features generation apparatus that calculates minutia features which contribute to improve matching accuracy. A minutia features generation apparatus comprises: an input part to input an image formed as a curved stripe pattern by a ridge line(s); a generation part to generate a skeleton image formed by extracting a skeleton(s) from the image; an extraction part to extract a plurality of minutiae from the skeleton image; and a calculation part configured to calculate a relation minutia feature(s) representing relationship between a first minutia and a second minutia among the plurality of minutiae, wherein the calculation part calculates as one of the relation minutia features defined by a crossing count of the skeleton(s) and a straight line connecting from the second minutia to a nearest neighbor point which is a point on a trace line traced by tracing starting from the first minutia, which point is located at a shortest line distance from the second minutia.

5. 发明申请

US20220130171A1 MINUTIA FEATURES GENERATION APPARATUS, SYSTEM, MINUTIA FEATURES GENERATION METHOD, AND PROGRAM 有权
公开(公告)号：US20220130171A1
公开(公告)日：2022-04-28
申请号：US17572811
申请日：2022-01-11
申请人： NEC Corporation
发明人： Masanori HARA
IPC分类号： G06V40/12
摘要： A minutia features generation apparatus comprises: an input part to input an image formed as a curved stripe pattern by a ridge line(s); a generation part to generate a skeleton image formed by extracting a skeleton(s) from the image; an extraction part to extract a plurality of minutiae from the skeleton image; and a calculation part configured to calculate a relation minutia feature(s) representing relationship between a first minutia and a second minutia among the plurality of minutiae, wherein the calculation part calculates as one of the relation minutia features defined by a crossing count of the skeleton(s) and a straight line connecting from the second minutia to a nearest neighbor point which is a point on a trace line traced by tracing starting from the first minutia, which point is located at a shortest line distance from the second minutia.

6. 发明申请

US20210271846A1 STRIPED PATTERN IMAGE EXAMINATION SUPPORT APPARATUS, STRIPED PATTERN IMAGE EXAMINATION SUPPORT METHOD, AND PROGRAM 有权
公开(公告)号：US20210271846A1
公开(公告)日：2021-09-02
申请号：US17323315
申请日：2021-05-18
申请人： NEC Corporation
发明人： Masanori HARA
IPC分类号： G06K9/00 , G06K9/46
摘要： A striped pattern image examination support apparatus includes a feature extraction part, a central line collation part, and a display part. The feature extraction part extracts, from each of a first striped pattern image and a second striped pattern image, at least central lines and feature points, as a feature of each of the first striped pattern image and the second striped pattern image. The central line collation part performs collation of the respective central lines of the first striped pattern image and the second striped pattern image, and computes corresponding central lines between the first striped pattern image and the second striped pattern image. The display part determines a display form of each of the central lines based on the computed corresponding central lines and superimposes and displays the central lines on each of the first striped pattern image and the second striped pattern image, according to the determined display form.

7. 发明申请

US20200065546A1 STRIPED PATTERN IMAGE EXAMINATION SUPPORT APPARATUS, STRIPED PATTERN IMAGE EXAMINATION SUPPORT METHOD, AND PROGRAM 审中-公开
公开(公告)号：US20200065546A1
公开(公告)日：2020-02-27
申请号：US16344123
申请日：2017-10-25
申请人： NEC Corporation
发明人： Masanori HARA
IPC分类号： G06K9/00 , G06K9/46
摘要： A striped pattern image examination support apparatus includes a feature extraction part, a central line collation part, and a display part. The feature extraction part extracts, from each of a first striped pattern image and a second striped pattern image, at least central lines and feature points, as a feature of each of the first striped pattern image and the second striped pattern image. The central line collation part performs collation of the respective central lines of the first striped pattern image and the second striped pattern image, and computes corresponding central lines between the first striped pattern image and the second striped pattern image. The display part determines a display form of each of the central lines based on the computed corresponding central lines and superimposes and displays the central lines on each of the first striped pattern image and the second striped pattern image, according to the determined display form.

8. 发明申请

US20160055367A1 FEATURE POINT INPUT ASSISTING DEVICE, FEATURE POINT INPUT ASSISTING METHOD, AND STORAGE MEDIUM STORED WITH PROGRAM 有权
标题翻译：特征点输入辅助设备，特征点输入辅助方法和存储程序的存储介质
公开(公告)号：US20160055367A1
公开(公告)日：2016-02-25
申请号：US14827437
申请日：2015-08-17
申请人： NEC Corporation
发明人： Masanori HARA
IPC分类号： G06K9/00 , G06T7/00
CPC分类号： G06K9/00073 , G06K9/033 , G06K9/036
摘要： To provide a feature point input assisting device that can carry out the input assistance of the feature point.A feature point input assisting device includes a processor circuitry. The processor circuitry configured to set a first feature point in an input image including a stripe pattern formed by ridge lines. The processor circuitry configured to extract a second feature point from the input image by using the first feature point. The processor circuitry configured to extract a feature point, which is the second feature point having no corresponding first feature point, as an input omission feature point candidate. The processor circuitry configured to output the input omission feature point candidate to a display device.
摘要翻译：提供能够执行特征点的输入辅助的特征点输入辅助装置。特征点输入辅助装置包括处理器电路。所述处理器电路被配置为在包括由脊线形成的条纹图案的输入图像中设置第一特征点。所述处理器电路被配置为通过使用所述第一特征点从所述输入图像提取第二特征点。处理器电路被配置为提取作为不具有对应的第一特征点的第二特征点的特征点作为输入省略特征点候选。处理器电路被配置为将输入省略特征点候选输出到显示设备。

9. 发明申请

US20210158013A1 MINUTIA FEATURES GENERATION APPARATUS, SYSTEM, MINUTIA FEATURES GENERATION METHOD, AND PROGRAM 有权
公开(公告)号：US20210158013A1
公开(公告)日：2021-05-27
申请号：US17167661
申请日：2021-02-04
申请人： NEC CORPORATION
发明人： Masanori HARA
IPC分类号： G06K9/00
摘要： A minutia features generation apparatus comprises: an input part to input an image formed as a curved stripe pattern by a ridge line(s); a generation part to generate a skeleton image formed by extracting a skeleton(s) from the image; an extraction part to extract a plurality of minutiae from the skeleton image; and a calculation part configured to calculate a relation minutia feature(s) representing relationship between a first minutia and a second minutia among the plurality of minutiae, wherein the calculation part calculates as one of the relation minutia features defined by a crossing count of the skeleton(s) and a straight line connecting from the second minutia to a nearest neighbor point which is a point on a trace line traced by tracing starting from the first minutia, which point is located at a shortest line distance from the second minutia.

10. 发明申请

US20150220769A1 STRIPED PATTERN IMAGE EXAMINATION SUPPORT DEVICE, STRIPED PATTERN IMAGE EXAMINATION SUPPORT METHOD AND PROGRAM 有权
标题翻译：条纹图像检查支持设备，条带图案检查支持方法和程序
公开(公告)号：US20150220769A1
公开(公告)日：2015-08-06
申请号：US14686027
申请日：2015-04-14
申请人： NEC Corporation , NEC Soft, Ltd.
发明人： Masanori HARA , Hiroaki TOYAMA
IPC分类号： G06K9/00 , G06T7/00 , G06K9/50
CPC分类号： G06K9/00067 , G06K9/00087 , G06K9/50 , G06T7/30 , G06T7/33 , G06T2207/10004
摘要： Provided are a striped pattern image examination support device, method, and program. The device includes: image transformation element for transforming at least one of two striped pattern images so as to cause coordinates of charting points, which are points that correspond across the two striped pattern images, to match in a plurality of pairs of the charting points which are included in the two striped pattern images; intersecting point extraction element for calculating coordinates of intersecting points of stripes in the striped pattern images and line segments each of which connects two of the charting points in the striped pattern images; charting diagram display element for displaying the two striped pattern images after transformation by the image transformation element, and displaying figures representing charting points at positions corresponding to coordinates after the transformations of each of the charting points on the two striped pattern images.
摘要翻译：提供条纹图案检查支持装置，方法和程序。该装置包括：图像变换元件，用于变换两个条纹图案图像中的至少一个，以便引起作为两条条纹图案图像之间对应的点的图表点的坐标，以在多对图表中匹配，被包含在两个条纹图案中; 交叉点提取元件，用于计算条纹图案图像中的交叉点的坐标和每个连接条纹图案图像中的两个图表点的线段; 图形图显示元件，用于在通过图像变换元件变换之后显示两个条纹图案图像，并且在两个条纹图案图像上的每个图表点的变换之后显示与图形点对应的位置处的图形。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式