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1. 发明申请

US20100017669A1 METHOD FOR CORRECTING HIGH-FREQUENCY CHARACTERISTIC ERROR OF ELECTRONIC COMPONENT 有权
标题翻译：校正电子元件高频特性误差的方法
公开(公告)号：US20100017669A1
公开(公告)日：2010-01-21
申请号：US12474389
申请日：2009-05-29
申请人： NAOKI FUJII , Gaku Kamitani , Taichi Mori
发明人： NAOKI FUJII , Gaku Kamitani , Taichi Mori
IPC分类号： H03M13/00 , G06F11/07
CPC分类号： G01R35/005 , G01R27/28
摘要： An electronic-component high-frequency characteristic error correcting method for allowing a calibration work to be performed on a two-terminal impedance component using the same correction-target measuring system as that used in actual measurement. At least three correction data acquisition samples having different high-frequency characteristics are measured by a reference measuring system and an actual measuring system. An equation for associating the value measured by the actual measuring system with the value measured by the reference measuring system using an error correction coefficient of a transmission line is determined. A given electronic component is measured by the actual measuring system. An estimated high-frequency characteristic value of the electronic component obtained when the electronic component is measured by the reference measuring system is calculated using the determined equation.
摘要翻译：一种电子部件高频特性误差校正方法，用于使用与实际测量中使用的相同的校正目标测量系统，对两端子阻抗分量进行校准工作。通过参考测量系统和实际测量系统来测量具有不同高频特性的至少三个校正数据采集样本。确定将由实际测量系统测量的值与由参考测量系统测量的值相关联的方程式，使用传输线的误差校正系数。给定的电子元件由实际测量系统测量。使用所确定的方程来计算通过基准测量系统测量电子部件时获得的电子部件的估计高频特性值。

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