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1. 发明授权

US07142707B2 Automated inspection of packaging materials for package integrity 有权
标题翻译：自动检查包装材料的包装完整性
公开(公告)号：US07142707B2
公开(公告)日：2006-11-28
申请号：US10734358
申请日：2003-12-12
申请人： Mohsen Abdollahi , Kevin H. Giles , Charles L. Guffey , Jun Liu , Bernard Roche , Peter W. Sites , Robert P. Whalen
发明人： Mohsen Abdollahi , Kevin H. Giles , Charles L. Guffey , Jun Liu , Bernard Roche , Peter W. Sites , Robert P. Whalen
IPC分类号： G06K9/00
CPC分类号： G01N21/95
摘要： An apparatus in one example comprises a computer component that receives one or more images of one or more packaging materials from one or more imaging components. The computer component employs an analysis of the one or more images to make a determination of a package integrity of the one or more packaging materials.
摘要翻译：一个示例中的装置包括从一个或多个成像部件接收一个或多个包装材料的一个或多个图像的计算机部件。计算机组件采用对一个或多个图像的分析来确定一个或多个包装材料的包装完整性。

2. 发明申请

US20050050451A1 Automated inspection of packaging materials for package integrity 有权
标题翻译：自动检查包装材料的包装完整性
公开(公告)号：US20050050451A1
公开(公告)日：2005-03-03
申请号：US10734358
申请日：2003-12-12
申请人： Mohsen Abdollahi , Kevin Giles , Charles Guffey , Jun Liu , Bernard Roche , Peter Sites , Robert Whalen
发明人： Mohsen Abdollahi , Kevin Giles , Charles Guffey , Jun Liu , Bernard Roche , Peter Sites , Robert Whalen
IPC分类号： G01N21/95 , G06F17/00
CPC分类号： G01N21/95
摘要： An apparatus in one example comprises a computer component that receives one or more images of one or more packaging materials from one or more imaging components. The computer component employs an analysis of the one or more images to make a determination of a package integrity of the one or more packaging materials.
摘要翻译：一个示例中的装置包括从一个或多个成像部件接收一个或多个包装材料的一个或多个图像的计算机部件。计算机组件采用对一个或多个图像的分析来确定一个或多个包装材料的包装完整性。

3. 发明授权

US07180606B2 Machine vision system for measuring heights of items 失效
标题翻译：用于测量物品高度的机器视觉系统
公开(公告)号：US07180606B2
公开(公告)日：2007-02-20
申请号：US10885315
申请日：2004-07-07
申请人： James Mahon , Padraig Butler , John Milroy , Kevin Godden , Mohsen Abdollahi , Peter Conlon
发明人： James Mahon , Padraig Butler , John Milroy , Kevin Godden , Mohsen Abdollahi , Peter Conlon
IPC分类号： G01B11/24
CPC分类号： G06T7/0004 , G01B11/24 , G01N21/95684 , G06T5/006 , G06T7/521 , G06T2207/30152
摘要： A machine vision system (1) has two laser sources (2, 3) to illuminate a solder deposit from both sides for comprehensive coverage without occlusion. The camera (4) has an FGPA (32) programmed to define a subset of the sensor array (20) as a region of interest to be processed for each laser source (2, 3). This reduces the amount of data transfer and processing required. The image line (31) is dynamically maintained in the region of interest by adjustement of camara Z position according to warp of the substrate (S).
摘要翻译：机器视觉系统（1）具有两个激光源（2,3），用于照亮来自两侧的焊料沉积物以进行全面覆盖而不堵塞。相机（4）具有被编程为将传感器阵列（20）的子集定义为要为每个激光源（2,3）处理的感兴趣区域的FGPA（32）。这减少了所需的数据传输和处理量。通过根据基板（S）的翘曲调节卡马拉Z位置，将图像线（31）动态地保持在感兴趣的区域中。

4. 发明授权

US07525669B1 High-speed, scanning phase-shifting profilometry using 2D CMOS sensor 失效
标题翻译：使用2D CMOS传感器的高速，扫描相移轮廓测量
公开(公告)号：US07525669B1
公开(公告)日：2009-04-28
申请号：US10887673
申请日：2004-07-09
申请人： Mohsen Abdollahi
发明人： Mohsen Abdollahi
IPC分类号： G01B11/24
CPC分类号： G01B11/2522
摘要： A high speed, phase shifting scanning profilometry system is disclosed. A high speed CMOS sensor having more than 3 rows of pixels, in one embodiment having 1024, each row of which being randomly accessible, is positioned above a workpiece movable below the camera. The workpiece is illuminated in a non-uniform manner by an illumination source configured to project a predetermined pattern or gradient of light. As the workpiece is moved under the sensor, selected rows of pixels register the non-uniform light reflected from the workpiece and provide the data to a computer for calculating a surface profile for that row.
摘要翻译：公开了一种高速，相移扫描轮廓测量系统。具有超过3行像素的高速CMOS传感器，在一个实施例中具有1024，每行可随机访问，位于可移动到相机下方的工件上方。通过配置成投影预定图案或渐变光的照明源以不均匀的方式照射工件。当工件在传感器下方移动时，所选行的像素对准从工件反射的不均匀光，并将数据提供给计算机以计算该行的表面轮廓。

5. 发明授权

US07315383B1 Scanning 3D measurement technique using structured lighting and high-speed CMOS imager 失效
标题翻译：使用结构照明和高速CMOS成像仪扫描3D测量技术
公开(公告)号：US07315383B1
公开(公告)日：2008-01-01
申请号：US10887568
申请日：2004-07-09
申请人： Mohsen Abdollahi
发明人： Mohsen Abdollahi
IPC分类号： G01B11/24
CPC分类号： G01B11/25 , G01B11/0608 , G06T7/521
摘要： A method for 3 dimensional scanning using a light source for projecting a source of illumination configured to be non-uniform or having a predetermined pattern is disclosed. A CMOS sensor having randomly accessible rows of pixels, and an associated lens system, is mounted above a workpiece, with the workpiece and sensor movable with respect to each other in a scanning relation. Rows of pixels of the sensor are selected for registering reflected light, with data from the selected rows provided to a computer for calculating height information of features of the workpiece. Significantly, both 2 dimensional and 3 dimensional images may be generated during a single scanning pass because of the non-uniform source of light and random access capabilities of the sensor.
摘要翻译：公开了一种使用用于投影配置为不均匀或具有预定图案的照明源的光源进行三维扫描的方法。具有随机访问的像素行的CMOS传感器和相关联的透镜系统安装在工件上方，工件和传感器可以以扫描关系相对于彼此移动。选择传感器的像素行用于记录反射光，来自提供给计算机的所选行的数据用于计算工件的特征的高度信息。重要的是，由于传感器的光的不均匀的光源和随机存取能力，在一次扫描过程中可能会产生二维和三维图像。

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