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1. 发明授权

US09354041B2 Coordinate measuring apparatus 有权
标题翻译：坐标测量仪
公开(公告)号：US09354041B2
公开(公告)日：2016-05-31
申请号：US14483723
申请日：2014-09-11
申请人： MITUTOYO CORPORATION
发明人： Masaoki Yamagata
IPC分类号： G01B11/24 , G01B11/00 , G01B11/25
CPC分类号： G01B11/005 , G01B11/24 , G01B11/25
摘要： Coordinate measuring apparatus includes a probe having an optical system emitting light along a plane at a workpiece, an image capture apparatus having image capture elements arranged on an image capture plane and capturing an image of the workpiece from a position different from that of the predetermined plane, and a controller controlling the emitting optical system. The controller determines whether the image capture elements arranged in an image capture region on the image capture plane detect light incident on the workpiece due to the light from the emitting optical system, turns on the light emitted from the emitting optical system when the image capture elements arranged within the image capture region detect the incident light, and blinks the light emitted from the emitting optical system at a predetermined periodicity when the image capture elements arranged within the image capture region do not detect the incident light.
摘要翻译：坐标测量装置包括具有沿着工件的平面发光的光学系统的探针，具有布置在图像捕获平面上的图像捕获元件并从与预定平面不同的位置捕获工件的图像的图像捕获装置，以及控制发光光学系统的控制器。控制器确定布置在图像捕获平面上的图像捕获区域中的图像捕获元件是否由于来自发射光学系统的光而检测入射在工件上的光，当图像捕获元件布置在图像拍摄区域内的图像捕获区域检测入射光，并且当布置在图像捕获区域内的图像捕获元件不检测入射光时，以预定的周期闪烁从发射光学系统发射的光。

2. 发明授权

US10684109B2 Indicator inspection machine, inspection method, and inspection program 有权
公开(公告)号：US10684109B2
公开(公告)日：2020-06-16
申请号：US16008160
申请日：2018-06-14
申请人： MITUTOYO CORPORATION
发明人： Masaoki Yamagata , Shiro Igasaki
IPC分类号： G01B3/22 , G01B21/04
摘要： An indicator inspection machine inspects the accuracy of an indicator based on a value displayed by the indicator when a spindle changes position. The indicator inspection machine includes a measurement spindle provided so as to be freely raised and lowered in order to displace the spindle of the indicator; a contact point provided to a distalmost end of the measurement spindle, the contact point making contact with an indicator contact point provided to a distalmost end of the spindle of the indicator; a drive mechanism driving the measurement spindle; and a controller controlling the drive mechanism so as to bring the contact point into contact with the indicator contact point while changing a speed of the measurement spindle at a predetermined periodicity.

3. 发明授权

US09989356B2 Shape measuring apparatus 有权
公开(公告)号：US09989356B2
公开(公告)日：2018-06-05
申请号：US14197715
申请日：2014-03-05
申请人： MITUTOYO CORPORATION
发明人： Masaoki Yamagata , Kentaro Nemoto , Eisuke Moriuchi , Tadashi Iwamoto
IPC分类号： G01B11/30 , H04N7/18 , G01B11/24 , G01B11/00 , G01B11/25
CPC分类号： G01B11/24 , G01B11/005 , G01B11/25
摘要： A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce laser light; a first optical member configured to linearly spread the laser light from the light source and generate the line laser; and a second optical member, provided between the light source and the first optical member, configured to adjust an area of irradiation with a line laser on the work; a first sensor configured to receive a line laser reflected by the work and capture an image of the work; a lens configured to form an image of a line laser reflected by the work on an imaging surface of the first sensor; and a control part configured to control adjustment of the area of irradiation with the line laser on the work by the second optical member.

4. 发明授权

US10852128B2 Shape measuring apparatus 有权
公开(公告)号：US10852128B2
公开(公告)日：2020-12-01
申请号：US14184132
申请日：2014-02-19
申请人： MITUTOYO CORPORATION
发明人： Masaoki Yamagata , Kentaro Nemoto , Eisuke Moriuchi , Tadashi Iwamoto
IPC分类号： G01B11/24 , G01B11/25 , G01B11/00
摘要： A shape measuring apparatus includes a first light source, a second light source, an optical system, an image capturer, and a controller. The first light source emits visible light. The second light source emits measurement light used in a measurement. The optical system emits the visible light and the measurement light at the same position on a work piece. The image capturer captures an image of the measurement light reflected by the work piece. The controller is configured to cause the emission of the visible light onto the work piece with the first light source when determining a measurement position, and to control the emission of the measurement light onto the work piece with the second light source when making the measurement.

5. 发明申请

US20180259319A1 OPTICAL DISPLACEMENT MEASURING INSTRUMENT, ADJUSTMENT METHOD AND MEASURING METHOD OF OPTICAL DISPLACEMENT MEASURING INSTRUMENT 审中-公开
公开(公告)号：US20180259319A1
公开(公告)日：2018-09-13
申请号：US15902405
申请日：2018-02-22
申请人： Mitutoyo Corporation
发明人： Kentaro Tamura , Masaoki Yamagata
IPC分类号： G01B11/02
CPC分类号： G01B11/02 , G01B11/026 , G01B11/24 , G01C3/00
摘要： Provided is an optical displacement meter capable of enlarging an output signal region with respect to a region in which a light-receiving amount needs to be measured, a method for adjusting an optical displacement meter, and an optical displacement measuring method. The optical displacement meter includes a light-receiving element in which a maximum value of an output signal is set with respect to a boundary value, which is a maximum value of a region in which the light-receiving amount needs to be measured. The entire region of the output signal of the light-receiving element can be assigned to the valid region, in which the light-receiving amount needs to be measured with an optical displacement meter, and the optical displacement meter can have an enlarged output signal region with respect to the region in which the light-receiving amount needs to be measured.

6. 发明授权

US10895449B2 Shape measuring device 有权
公开(公告)号：US10895449B2
公开(公告)日：2021-01-19
申请号：US16601802
申请日：2019-10-15
申请人： Mitutoyo Corporation
发明人： Kentaro Nemoto , Masaoki Yamagata , Ryohei Kanno , Hiroaki Kawata
IPC分类号： G01B11/24 , G01B11/00
摘要： A shape measuring device includes a holding unit which holds a measuring target of which a shape is to be measured, a first measurement unit which measures relative coordinates of a plurality of measurement points on a first surface of the measurement target with respect to a defined point, a second measurement unit which operates independently from the first measurement unit and measures relative coordinates of a plurality of measurement points on a second surface of the measurement target, which is a reverse surface of the first surface, with respect to the defined point, and a calculation unit which calculates a shape of the measurement target on the basis of results measured by the first measurement unit and the second measurement unit.

7. 发明授权

US10119848B2 Inspection machine and attachment jig therefor 有权
公开(公告)号：US10119848B2
公开(公告)日：2018-11-06
申请号：US15298639
申请日：2016-10-20
申请人： MITUTOYO CORPORATION
发明人： Yuki Kurahashi , Masaoki Yamagata
IPC分类号： G01B1/00 , G01D18/00 , G01D13/02 , G01D13/22 , G01D11/30
摘要： A jig includes three columnar members, a stylus head receiving member, and a jig fixation portion. The second columnar member extends in a Z direction. The first columnar member extends in an X direction and is configured as a cantilever beam protruding in the X direction by having a first end of the first columnar member joined to a first end of the second columnar member. The third columnar member extends in the X direction and is configured as a cantilever beam protruding in the same direction as the first columnar member by having a first end of the third columnar member joined to a second end of the second columnar member. The stylus head receiving member is joined to the third columnar member such that a surface where a stylus head at a forefront end of a spindle of a gauge makes contact faces the first columnar member. The jig fixation portion is provided to the first columnar member so as to be attachable to a measurement spindle of the gauge inspection machine.

8. 发明授权

US09500474B2 Illumination apparatus, illumination method, measuring apparatus, and measuring method 有权
标题翻译：照明装置，照明方法，测量装置和测量方法
公开(公告)号：US09500474B2
公开(公告)日：2016-11-22
申请号：US14601280
申请日：2015-01-21
申请人： MITUTOYO CORPORATION
发明人： Masaoki Yamagata , Kentaro Nemoto , Toshihisa Takai , Tadashi Iwamoto
IPC分类号： G01B11/24 , G01B11/25
CPC分类号： G01B11/24 , G01B11/25
摘要： An illumination apparatus according to the present invention includes a light source, a reflecting mirror, an optical system, and a calculator. The reflecting mirror includes a first reflector and a second reflector, and is capable, while changing a reflection angle, of reflecting and directing at an object a first divided light, the first divided light being a portion of light from the light source emitted at the first reflector. The optical system divides the light from the light source into the first divided light and a second divided light, and guides the second divided light to the second reflector. The calculator is capable of calculating the reflection angle of the reflecting mirror by receiving the second divided light reflected by the second reflector.
摘要翻译：根据本发明的照明装置包括光源，反射镜，光学系统和计算器。反射镜包括第一反射器和第二反射器，并且能够在改变反射角的同时将物体反射并引导到第一分开的光，所述第一分割光是来自所述光源的光的一部分第一反射器光学系统将来自光源的光分成第一分割光和第二分光，并将第二分光引导到第二反射器。计算器能够通过接收由第二反射器反射的第二分割光来计算反射镜的反射角。

9. 发明授权

US10480930B2 Optical displacement measuring instrument, adjustment method and measuring method of optical displacement measuring instrument 有权
公开(公告)号：US10480930B2
公开(公告)日：2019-11-19
申请号：US15902405
申请日：2018-02-22
申请人： Mitutoyo Corporation
发明人： Kentaro Tamura , Masaoki Yamagata
IPC分类号： G01B11/02 , G01C3/00
摘要： Provided is an optical displacement meter capable of enlarging an output signal region with respect to a region in which a light-receiving amount needs to be measured, a method for adjusting an optical displacement meter, and an optical displacement measuring method. The optical displacement meter includes a light-receiving element in which a maximum value of an output signal is set with respect to a boundary value, which is a maximum value of a region in which the light-receiving amount needs to be measured. The entire region of the output signal of the light-receiving element can be assigned to the valid region, in which the light-receiving amount needs to be measured with an optical displacement meter, and the optical displacement meter can have an enlarged output signal region with respect to the region in which the light-receiving amount needs to be measured.

10. 发明授权

US09255792B2 Optical probe, attachable cover, and shape measuring apparatus 有权
标题翻译：光学探针，可附接盖和形状测量装置
公开(公告)号：US09255792B2
公开(公告)日：2016-02-09
申请号：US14612467
申请日：2015-02-03
申请人： MITUTOYO CORPORATION
发明人： Kentaro Nemoto , Masaoki Yamagata , Eisuke Moriuchi , Tadashi Iwamoto
IPC分类号： G01B11/24 , G01B11/30 , G02B1/11 , G01B11/02
CPC分类号： G01B11/30 , G01B11/026 , G01B11/24 , G02B1/11 , G02B5/003 , G02B27/0018
摘要： An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. The bottom surface forms a surface where, of the light reflected from the work piece, light following a direct reflection direction is reflected in a direction moving away from the incidence region, from a position where light emitted from the emitting region is emitted at the work piece. Accordingly, an amount of second order reflected light striking the incidence region can be suppressed and, therefore, an occurrence of an erroneous value in received light distribution can be suppressed.
摘要翻译：光探头包括探针盖，在其中安装有具有照明光学系统和接收光学系统的光学系统。发光区域和光通过的入射区域被提供到探针盖的底表面，底面形成与工件相对的相对区域。底表面形成一个表面，其中从工件反射的光，沿着直接反射方向的光沿着从入射区域移开的方向从在发光区域发射的光在工作中发射的位置被反射片。因此，可以抑制入射入射区域的二次反射光的量，因此能够抑制接收光分布中的错误值的发生。

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