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    • 6. 发明申请
    • SEMICONDUCTOR STORAGE DEVICE, AND DATA READING METHOD
    • 半导体存储器件和数据读取方法
    • US20090168577A1
    • 2009-07-02
    • US12398816
    • 2009-03-05
    • Keizo MoritaShoichiro Kawashima
    • Keizo MoritaShoichiro Kawashima
    • G11C7/02
    • G11C11/22
    • A semiconductor storage device comprises of a memory cell connected to a plate line and a bit line, a potential shift circuit which is connected to a bit line, temporarily changes in output voltage corresponding to the voltage change of the bit line when a voltage is applied to the plate line, and then outputs a voltage before the application of the voltage to the plate line, a charge transfer circuit for transferring charge stored on the potential shift circuit corresponding to the temporary output voltage change of the potential shift circuit, and a charge accumulation circuit for generating a read voltage from a memory cell after accumulating the transferred charge.
    • 半导体存储装置包括连接到板线和位线的存储单元,连接到位线的电位移动电路在施加电压时临时改变与位线的电压变化相对应的输出电压 然后在对板线施加电压之前输出电压;电荷转移电路,用于转移与电位移动电路的临时输出电压变化对应的电位移位电路上存储的电荷,以及电荷 累积电路,用于在累积传送的电荷之后从存储单元产生读取电压。
    • 7. 发明授权
    • Semiconductor memory
    • 半导体存储器
    • US07483287B2
    • 2009-01-27
    • US11790529
    • 2007-04-26
    • Isao FukushiKeizo MoritaShoichiro Kawashima
    • Isao FukushiKeizo MoritaShoichiro Kawashima
    • G11C11/22
    • G11C11/22G11C29/02G11C29/026G11C29/028G11C2029/1204
    • A bit line is connected to a charge storing circuit through a charge transferring circuit. A control circuit controls charge transferability of the charge transferring circuit according to a change in the voltage of the bit line resulting from a charge read out from a memory cell. A leakage controlling circuit lowers the charge transferability of the charge transferring circuit in a read operation temporarily before the charge is read out to the bit line. The leakage controlling circuit makes it possible to avoid charge transfer between the charge storing circuit and the bit line before data is read from the memory cell. The charge storing circuit can thus generate a read voltage sufficient for a read circuit to operate with, in accordance with the logical value of the data stored in the memory cell.
    • 位线通过电荷转移电路连接到电荷存储电路。 控制电路根据从存储单元读出的电荷产生的位线的电压变化来控制电荷转移电路的电荷转移能力。 泄漏控制电路在电荷被读出到位线之前暂时在读取操作中降低电荷转移电路的电荷转移能力。 泄漏控制电路使得可以避免在从存储单元读取数据之前电荷存储电路和位线之间的电荷转移。 因此,电荷存储电路可以根据存储在存储单元中的数据的逻辑值产生足以使读取电路工作的读取电压。
    • 8. 发明申请
    • Semiconductor storage device, and data reading method
    • 半导体存储器件和数据读取方法
    • US20080055960A1
    • 2008-03-06
    • US11653909
    • 2007-01-17
    • Keizo MoritaShoichiro Kawashima
    • Keizo MoritaShoichiro Kawashima
    • G11C11/22
    • G11C11/22
    • A semiconductor storage device comprises of a memory cell connected to a plate line and a bit line, a potential shift circuit which is connected to a bit line, temporarily changes in output voltage corresponding to the voltage change of the bit line when a voltage is applied to the plate line, and then outputs a voltage before the application of the voltage to the plate line, a charge transfer circuit for transferring charge stored on the potential shift circuit corresponding to the temporary output voltage change of the potential shift circuit, and a charge accumulation circuit for generating a read voltage from a memory cell after accumulating the transferred charge.
    • 半导体存储装置包括连接到板线和位线的存储单元,连接到位线的电位移动电路在施加电压时临时改变与位线的电压变化相对应的输出电压 然后在对板线施加电压之前输出电压;电荷转移电路,用于转移与电位移动电路的临时输出电压变化对应的电位移位电路上存储的电荷,以及电荷 累积电路,用于在累积传送的电荷之后从存储单元产生读取电压。
    • 10. 发明授权
    • Semiconductor memory
    • 半导体存储器
    • US07227769B2
    • 2007-06-05
    • US11073036
    • 2005-03-07
    • Isao FukushiKeizo MoritaShoichiro Kawashima
    • Isao FukushiKeizo MoritaShoichiro Kawashima
    • G11C11/22
    • G11C11/22G11C29/02G11C29/026G11C29/028G11C2029/1204
    • A bit line is connected to a charge storing circuit through a charge transferring circuit. A control circuit controls charge transferability of the charge transferring circuit according to a change in the voltage of the bit line resulting from a charge read out from a memory cell. A leakage controlling circuit lowers the charge transferability of the charge transferring circuit in a read operation temporarily before the charge is read out to the bit line. The leakage controlling circuit makes it possible to avoid charge transfer between the charge storing circuit and the bit line before data is read from the memory cell. The charge storing circuit can thus generate a read voltage sufficient for a read circuit to operate with, in accordance with the logical value of the data stored in the memory cell.
    • 位线通过电荷转移电路连接到电荷存储电路。 控制电路根据从存储单元读出的电荷产生的位线的电压变化来控制电荷转移电路的电荷转移能力。 泄漏控制电路在电荷被读出到位线之前暂时在读取操作中降低电荷转移电路的电荷转移能力。 泄漏控制电路使得可以避免在从存储单元读取数据之前电荷存储电路和位线之间的电荷转移。 因此,电荷存储电路可以根据存储在存储单元中的数据的逻辑值产生足以使读取电路工作的读取电压。