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1. 发明公开

US20230342371A1 TIME-SERIES DATA ANALYSIS DEVICE, TIME-SERIES DATA ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING TIME-SERIES DATA ANALYSIS PROGRAM 审中-公开
公开(公告)号：US20230342371A1
公开(公告)日：2023-10-26
申请号：US18216107
申请日：2023-06-29
申请人： Mitsubishi Electric Corporation
发明人： Takaaki NAKAMURA
IPC分类号： G06F16/2458
CPC分类号： G06F16/2477
摘要： A time-series data analysis device, includes: a time-series data input unit to receive time-series data; a parameter setting unit to set a range of a window length of a time series subsequence in the time-series data; a feature calculating unit to calculate a feature of the time-series data for each of a plurality of window lengths within the range; a probability density distribution calculating unit to calculate a probability density distribution of the calculated feature for each of the plurality of window lengths; and a parameter selecting unit to calculate a statistical feature of the probability density distribution calculated for each of the plurality of window lengths and select a window length to be used from among the plurality of window lengths on the basis of the calculated statistical feature.

2. 发明申请

US20190179296A1 TIME-SERIES DATA PROCESSING DEVICE 审中-公开
公开(公告)号：US20190179296A1
公开(公告)日：2019-06-13
申请号：US16323405
申请日：2016-10-06
申请人： MITSUBISHI ELECTRIC CORPORATION
发明人： Makoto IMAMURA , Takaaki NAKAMURA , Norio HIRAI
IPC分类号： G05B23/02 , G05B19/418
摘要： A time-series data processing device (10) includes: a protruding data extracting unit (2) for extracting, from time-series data (1) which is a sequence of values obtained from sequential observation with the elapse of time, protruding data including an ascending leg a value of which continuously rises with respect to time and a descending leg a value of which continuously drops with respect to time; an occurrence pattern defining unit (3) for defining an occurrence pattern of protruding data in the time-series data (1); and an occurrence pattern detecting unit (4) for detecting, as a segment (5), one or more pieces of protruding data matching the occurrence pattern defined by the occurrence pattern defining unit (3), from among a set of pieces of protruding data extracted by the protruding data extracting unit (2).

3. 发明申请

US20200151199A1 TIME-SERIES DATA PROCESSING DEVICE, TIME-SERIES DATA PROCESSING SYSTEM, AND TIME-SERIES DATA PROCESSING METHOD 审中-公开
公开(公告)号：US20200151199A1
公开(公告)日：2020-05-14
申请号：US16496201
申请日：2017-05-12
申请人： MITSUBISHI ELECTRIC CORPORATION
发明人： Takaaki NAKAMURA
IPC分类号： G06F16/28 , G05B19/418
摘要： An event waveform extracting unit (3) extracts an event waveform from time-series data. A co-occurrence rate calculating unit (4) calculates co-occurrence rates of event waveforms among the time-series data. A grouping unit (5) classifies the time-series data into groups depending the co-occurrence rates of the event waveforms. An event information generating unit (6) determines the time at which the periods during which event waveforms occur overlap with each other among the time-series data included in each group, and generates event information identifying an event related to the event waveforms on the basis of the determined time.

4. 发明申请

US20180284739A1 QUALITY CONTROL APPARATUS, QUALITY CONTROL METHOD, AND QUALITY CONTROL PROGRAM 审中-公开
公开(公告)号：US20180284739A1
公开(公告)日：2018-10-04
申请号：US15759156
申请日：2016-03-28
申请人： MITSUBISHI ELECTRIC CORPORATION
发明人： Takafumi UEDA , Makoto IMAMURA , Takaaki NAKAMURA , Norio HIRAI
IPC分类号： G05B19/418 , G06T7/00 , G06F17/18
摘要： A quality control apparatus (20) includes: a regression analyzer (33) for calculating a regression formula on the basis of measurement values acquired from an upstream step and comparative measurement values acquired from a downstream step; a margin determination unit (34) for calculating a prediction value by substituting a determination reference value defining a determination reference range in the upstream step for an explanatory variable of the regression formula, comparing the prediction value with a comparative determination reference range in a downstream step, and determining whether the measurement values are accepted; and a reference value calculator (35) for calculating a new determination reference value to replace the determination reference value in accordance with the determination result.

5. 发明申请

US20210231535A1 ABNORMALITY DETECTION DEVICE AND ABNORMALITY DETECTION METHOD 有权
公开(公告)号：US20210231535A1
公开(公告)日：2021-07-29
申请号：US17232565
申请日：2021-04-16
申请人： Mitsubishi Electric Corporation
发明人： Takaaki NAKAMURA
IPC分类号： G01M99/00 , G06F16/23 , G06N20/00
摘要： An abnormality detection device is configured so as to include: an outlier score calculating unit for calculating, from abnormality detection time-series data indicating states of equipment which is an abnormality detection target at a plurality of times in time series, a degree of abnormality of the equipment at each of the plurality of times as an abnormality detection outlier score; an outlier data extracting unit for extracting, from among pieces of the abnormality detection time-series data, a piece of abnormality detection time-series data in a time period in which an abnormality may have occurred in the equipment as abnormality detection outlier data on the basis of the abnormality detection outlier score at each of the plurality of times calculated by the outlier score calculating unit; and an abnormality determining unit for collating a waveform of the abnormality detection outlier data extracted by the outlier data extracting unit with a waveform condition for determining that a waveform indicating a change in the abnormality detection outlier data is a waveform obtained when the equipment is operating normally, and determining whether or not the equipment is operating abnormally on the basis of a collation result between the waveform condition and the waveform of the abnormality detection outlier data.

6. 发明申请

US20180217812A1 TIME-SERIES DATA SEARCH DEVICE AND COMPUTER READABLE MEDIUM 审中-公开
公开(公告)号：US20180217812A1
公开(公告)日：2018-08-02
申请号：US15503365
申请日：2015-01-22
申请人： MITSUBISHI ELECTRIC CORPORATION
发明人： Takaaki NAKAMURA , Makoto IMAMURA
IPC分类号： G06F7/08 , G05B23/02 , G06F17/18 , G06F17/30
CPC分类号： G06F7/08 , G05B23/02 , G05B23/0264 , G06F17/18 , G06F17/30 , G06F17/30964
摘要： An initial segment set generation unit (120) generates an initial segment set (F) from training time-series data (S). An initial segment set sorting unit (130) sorts initial segments included in the initial segment set by the order of feature quantities. A sample segment set generation unit (140) generates a sample segment set (E) from the initial segment set. A sample segment set sorting unit (150) sorts sample segments included in the sample segment set by the order of the feature quantities. A search result distance calculation unit (160) calculates a search result distance (Z) for each of test segments by using the sample segment set.

7. 发明申请

US20170139400A1 TIME-SERIES DATA PROCESSING DEVICE AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM WHICH RECORDS TIME-SERIES DATA PROCESSING PROGRAM 审中-公开
公开(公告)号：US20170139400A1
公开(公告)日：2017-05-18
申请号：US15310374
申请日：2014-05-12
申请人： MITSUBISHI ELECTRIC CORPORATION
发明人： Makoto IMAMURA , Takaaki NAKAMURA
IPC分类号： G05B19/4063 , G05B19/408
CPC分类号： G05B19/4063 , G05B19/408 , G05B23/0221 , G05B2219/40357 , G06K9/0055
摘要： A time-series data processing device (10) takes as input time-series data being a sequence of values sequentially obtained over time. The time-series data processing device (10) extracts, as an extension leg, subsequence data which is segmented from the time-series data and whose value increases or decreases over time. The time-series data processing device (10) identifies, from the extracted extension leg, an appearance pattern including an extension rising leg whose value increases over time and an extension falling leg whose value decreases over time.

8. 发明公开

US20240269793A1 MACHINING DIMENSION PREDICTION APPARATUS, MACHINING DIMENSION PREDICTION SYSTEM, MACHINING DIMENSION PREDICTION METHOD, AND RECORDING MEDIUM 审中-公开
公开(公告)号：US20240269793A1
公开(公告)日：2024-08-15
申请号：US18574332
申请日：2021-08-30
申请人： Mitsubishi Electric Corporation
发明人： Tetsushi ISHIDA , Takaaki NAKAMURA
IPC分类号： B23Q17/20 , B23Q17/09 , G05B19/418
CPC分类号： B23Q17/20 , B23Q17/0904 , G05B19/41885
摘要： A machining dimension prediction apparatus includes a trend acquirer that acquires, for each workpiece, trend information indicating a trend of a state of a machining tool during a machining period of machining performed by the machining tool, a feature calculator that calculates, based on the trend information, a feature using the trend of the state in each of sections included in the machining period, a measurement value acquirer that acquires a measurement value of a dimension of each workpiece after being machined, a section specifier that specifies, as a specific section of the sections, a section including a calculated feature having a greatest degree of relevance to the measurement value, and a predictor that predicts, when a new-target workpiece is machined, a dimension of the new-target workpiece after being machined based on the feature calculated using the trend of the state in the specific section.

9. 发明申请

US20210096556A1 DATA PROCESSING DEVICE AND DATA PROCESSING METHOD 有权
公开(公告)号：US20210096556A1
公开(公告)日：2021-04-01
申请号：US17119222
申请日：2020-12-11
申请人： Mitsubishi Electric Corporation
发明人： Takaaki NAKAMURA
IPC分类号： G05B23/02 , G06F17/18
摘要： The data processing device includes: an extraction condition input unit that receives inputting of waveform data including a change point of a state of a device, parameter information about the waveform data, and transition information of the device; a similarity calculation unit that calculates similarity between time-series data of the device and the waveform data; an operating mode determination unit that sets the state of the device on the basis of the transition information of the device; a change point detection unit that detects the change point from the time-series data of the device on the basis of the calculated similarity and the determined state of the device, and sets a start time of a segment which is a subsequence of the time-series data and an end time of the segment; and an information output unit that outputs, as segment information, the state of the device, the start time of the segment, and the end time of the segment.

10. 发明申请

US20180314914A1 OPERATION STATE CLASSIFICATION APPARATUS 审中-公开
公开(公告)号：US20180314914A1
公开(公告)日：2018-11-01
申请号：US15772262
申请日：2016-01-13
申请人： Mitsubishi Electric Corporation
发明人： Toshiyuki KURIYAMA , Norio HIRAI , Makoto IMAMURA , Takahisa HIRATA , Takaaki NAKAMURA
IPC分类号： G06K9/62 , G05B23/02
CPC分类号： G05B23/0221
摘要： A principal component calculating unit (13) for calculating a principal component of a plurality of sensor data collected from a device, and a physical quantity for failure determination calculating unit (11) for calculating a physical quantity to be used for failure determination on the basis of the plurality of sensor data are provided. Further, an operation state classification unit (14) for generating classification, for each operation state, of the sensor data collected from the device, using the principal component calculated by the principal component calculating unit (13) and the physical quantity calculated by the physical quantity for failure determination calculating unit (11) is provided.

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