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    • 1. 发明授权
    • Circuit board testing
    • 电路板测试
    • US5812563A
    • 1998-09-22
    • US883904
    • 1997-06-27
    • Mikael HedlundHans Hogberg
    • Mikael HedlundHans Hogberg
    • G01R31/28G06F11/00
    • G01R31/2803
    • A method and arrangement for testing circuit boards (60) by creating one or several reference patterns to be compared with a test pattern. The arrangement is provided with at least one measuring probe (50), which cooperates with the circuit board (60), for measuring at least one reference signal or test signal on a reference circuit board and a test circuit board (60) respectively. Further, the arrangement is provided with an analyzer (10,30), which cooperates with the measuring probe (50), to pass on the reference signal or the test signal, whereby the analyzer (10,30) first analyzes the reference signal or the test signal at one frequency and then transforms the reference signal or the test signal to a reference pattern and test pattern respectively. Furthermore, the arrangement is provided with at least one memory (20) which cooperates with said analyzer (10,30) to register said reference pattern or test pattern. The memory (20) is provided with two or several reference patterns when testing a circuit board (60).
    • 一种用于通过创建要与测试图案进行比较的一个或多个参考图案来测试电路板(60)的方法和装置。 该装置设置有与电路板(60)配合的至少一个测量探针(50),用于分别测量参考电路板和测试电路板(60)上的至少一个参考信号或测试信号。 此外,该装置设置有与测量探针(50)协作的分析器(10,30),以通过参考信号或测试信号,由此分析器(10,30)首先分析参考信号或 测试信号,然后将参考信号或测试信号分别转换为参考模式和测试模式。 此外,该装置设置有与所述分析器(10,30)配合以记录所述参考图案或测试图案的至少一个存储器(20)。 当测试电路板(60)时,存储器(20)具有两个或几个参考图案。