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    • 6. 发明授权
    • Content addressable memory
    • 内容可寻址内存
    • US09548120B2
    • 2017-01-17
    • US14486276
    • 2014-09-15
    • MICRON TECHNOLOGY, INC.
    • Frankie F. Roohparvar
    • G11C15/00G11C15/04G11C16/04G11C16/08
    • G11C15/046G11C16/0483G11C16/08
    • Content addressable memory (CAM) devices provide for high density, low cost CAM devices. CAM devices include a non-volatile memory array having a plurality of NAND memory cell strings, wherein a NAND memory cell string of the non-volatile memory array comprises a plurality of CAM memory cells, and wherein the CAM memory cells comprise non-volatile memory cells of a same NAND memory cell string. The CAM devices further include a control circuit, wherein the control circuit is adapted to search data words stored in the plurality of NAND memory cell strings for a match to at least a portion of an input data word.
    • 内容可寻址存储器(CAM)器件提供高密度,低成本的CAM器件。 CAM设备包括具有多个NAND存储器单元串的非易失性存储器阵列,其中非易失性存储器阵列的NAND存储器单元串包括多个CAM存储器单元,并且其中CAM存储器单元包括非易失性存储器 相同的NAND存储器单元串的单元。 CAM设备还包括控制电路,其中控制电路适于搜索存储在多个NAND存储器单元串中的数据字,以匹配输入数据字的至少一部分。
    • 8. 发明授权
    • Memory devices configured to apply different weights to different strings of memory cells coupled to a data line and methods
    • 配置为将不同的权重应用于耦合到数据线和方法的不同存储器单元串的存储器件
    • US09105330B1
    • 2015-08-11
    • US13864659
    • 2013-04-17
    • Micron Technology, Inc.
    • Kenneth J. EldredgeFrankie F. RoohparvarLuca de SantisTommaso Vali
    • G11C15/00
    • G11C16/28G11C15/00G11C15/046G11C16/0483
    • Memory devices and methods are disclosed. One such method compares input data to stored data in a memory device and includes applying a first weight factor to a first string of memory cells coupled to a data line, where a first bit of the stored data is stored in the first string of memory cells; applying a second weight factor to a second string of memory cells coupled to the data line, where a second bit of the stored data is stored in the second string of memory cells; comparing a first bit of input data to the first bit of the stored data while the first weight factor is applied to the first string of memory cells; and comparing a second bit of the input data to the second bit of the stored data while the second weight factor is applied to the second string of memory cells.
    • 公开了存储器件和方法。 一种这样的方法将输入数据与存储器件中的存储数据进行比较,并且包括将第一加权因子应用于耦合到数据线的存储器单元的第一串,其中存储的数据的第一位被存储在第一存储单元串中 ; 将第二加权因子应用于耦合到所述数据线的第二存储单元串,其中所述存储数据的第二位存储在所述第二存储单元串中; 将第一加权因子应用于第一串存储器单元时,将第一比特的输入数据与存储数据的第一比较; 以及将所述输入数据的第二位与存储的数据的第二位进行比较,同时将所述第二权重因子应用于所述第二存储单元串。
    • 9. 发明授权
    • Programming error correction code into a solid state memory device with varying bits per cell
    • 将错误纠正码编程成固态存储器件,每个单元具有不同位数
    • US08719665B2
    • 2014-05-06
    • US14056031
    • 2013-10-17
    • Micron Technology, Inc.
    • Frankie F. RoohparvarVishal SarinJung S. Hoei
    • G11C29/00H03M13/00G06F11/00G11C5/14
    • G06F11/1076G06F11/1072G11C29/12005
    • Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels.
    • 在特定实施例中,存储设备接收和发送表示两个或多个位的位模式的模拟数据信号,以便于相对于传送指示各个位的数据信号的设备的数据传输速率的增加。 编程错误校正码(ECC)和元数据到这种存储器设备中包括基于单元的实际错误率将ECC和元数据存储在每个小区的不同比特级。 ECC和元数据可以与数据块存储在与数据块不同的位级别。 如果其中存储数据块的存储器区域不支持在特定位级别的ECC和元数据的期望的可靠性,则ECC和元数据可以以不同的位电平存储在存储器阵列的其他区域中。
    • 10. 发明授权
    • Memory controller self-calibration for removing systemic influence
    • 内存控制器自校准,用于消除系统影响
    • US08693246B2
    • 2014-04-08
    • US13749850
    • 2013-01-25
    • Micron Technology, Inc.
    • Frankie F. RoohparvarVishal SarinJung-Sheng Hoei
    • G11C11/34G11C16/04
    • G11C16/10G11C16/04G11C16/20G11C29/028G11C29/12005G11C29/50G11C29/50004G11C2029/5004
    • Self-calibration for a memory controller is performed by writing a voltage to a selected cell. Adjacent cells around the selected cell are programmed. After each of the adjacent programming operations, the voltage on the selected cell is read to determine any change in voltage caused by systemic offsets such as, for example, floating gate-to-floating gate coupling. These changes are averaged and stored in a table as an offset for use in adjusting a programming voltage or a read voltage in a particular area of memory represented by the offset. Self calibration method for temperature is determined by writing cells at different temperatures and reading at different temperatures to generate temperature offset tables for the write path and read path. These offset tables are used to adjust for systematic temperature related offsets during programming and during read.
    • 通过向所选择的单元写入电压来执行存储器控制器的自校准。 对所选单元格周围的相邻单元进行编程。 在每个相邻的编程操作之后,读取所选择的单元上的电压,以确定由例如浮动栅极到浮置栅极耦合的系统偏移引起的任何电压变化。 这些变化被平均并存储在表中作为用于调整由偏移表示的存储器的特定区域中的编程电压或读取电压的偏移。 通过在不同温度下写入单元格并在不同温度读取来确定温度的自校准方法,以生成写入路径和读取路径的温度偏移表。 这些偏移表用于在编程期间和读取期间调整与系统温度相关的偏移。