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    • 4. 发明授权
    • Nonvolatile memory with blocks and circuitry for selectively protecting
the blocks for memory operations
    • 具有用于选择性地保护块以用于存储器操作的块和电路的非易失性存储器
    • US5513136A
    • 1996-04-30
    • US358978
    • 1994-12-19
    • Mickey L. FandrichVirgil N. KynettSalim B. FedelThomas C. Price
    • Mickey L. FandrichVirgil N. KynettSalim B. FedelThomas C. Price
    • G11C7/24G11C16/22G11C16/06
    • G11C7/24G11C16/22
    • A nonvolatile memory comprises a memory array and a control circuit coupled to the memory array for performing memory operations with respect to the memory array. A storage circuit associated with the memory array is provided for storing a data. When the data is stored in the storage circuit, the memory array is locked from being accessed for the memory operations. A logic circuit is coupled to the control circuit and the storage circuit for preventing the control circuit from accessing the memory array with respect to the memory operations in accordance with the data. The logic circuit prevents the control circuit from accessing the memory array when the storage circuit stores the data. A control input is provided for receiving a control signal. The control signal is applied to the logic circuit and can be in a first voltage state and a second voltage state. When the control signal is in the first voltage state, the logic circuit is enabled to lock the memory array with respect to the memory operations in accordance with the data stored in the storage circuit. When the control signal is in the second voltage state, the logic circuit is disabled to lock the memory array and the memory array is allowed for the memory operations regardless of the data stored in the storage circuit.
    • 非易失性存储器包括存储器阵列和耦合到存储器阵列的控制电路,用于执行存储器阵列的存储器操作。 提供与存储器阵列相关联的存储电路用于存储数据。 当数据存储在存储电路中时,存储器阵列被锁定以进行存储器操作。 逻辑电路耦合到控制电路和存储电路,用于根据数据防止控制电路相对于存储器操作访问存储器阵列。 当存储电路存储数据时,逻辑电路防止控制电路访问存储器阵列。 提供控制输入用于接收控制信号。 控制信号被施加到逻辑电路并且可以处于第一电压状态和第二电压状态。 当控制信号处于第一电压状态时,逻辑电路能够根据存储在存储电路中的数据相对于存储器操作锁定存储器阵列。 当控制信号处于第二电压状态时,无论存储在存储电路中的数据如何,逻辑电路被禁用以锁定存储器阵列,并且存储器阵列被允许用于存储器操作。
    • 5. 发明授权
    • Circuitry and method for programming and erasing a non-volatile
semiconductor memory
    • 用于编程和擦除非易失性半导体存储器的电路和方法
    • US5448712A
    • 1995-09-05
    • US201044
    • 1994-02-24
    • Virgil N. KynettMickey L. Fandrich
    • Virgil N. KynettMickey L. Fandrich
    • G11C17/00G06F12/00G11C16/02G11C16/10G11C16/34G11C7/00
    • G11C16/3445G11C16/102G11C16/3436G11C16/3459
    • Erase control circuitry for erasing a flash memory array. The erase control circuitry resides on the same substrate as the flash memory array, along with a command state machine. The command state machine recognizes and externally generated erase command applied to the terminals and generates an active erase control signal, to which the erase control circuitry responds. The erase control circuitry includes precondition pulse application circuitry, erase pulse application circuitry and erase verification circuitry. The precondition pulse application circuitry preconditions the array by programming each bit in the flash memory to a threshold voltage level representative of a programmed state. The erase pulse application circuitry applies a single erase pulse at a time to the flash memory array to erase the flash array by bringing the threshold voltage level of each cell in the array to a level representative of an erased state. The erase verification circuitry verifies the erasure of the flash memory array on a byte by byte basis. If the byte currently being verified has been erased; the erase verification circuitry brings a match signal to an active level. The erase control circuitry determines whether additional erase pulses should be applied to the flash array based upon the match signal and the number of erase pulses previously applied to the flash array described is program control circuitry and methods of programming and erasing a flash memory array in response to two step command sequences.
    • 擦除控制电路以擦除闪存阵列。 擦除控制电路与命令状态机一起位于与闪存阵列相同的衬底上。 命令状态机识别并向外部产生的擦除命令,并产生一个有效的擦除控制信号,擦除控制电路对其进行响应。 擦除控制电路包括预处理脉冲应用电路,擦除脉冲应用电路和擦除验证电路。 预处理脉冲应用电路通过将闪速存储器中的每个位编程为表示编程状态的阈值电压电平来预先调整阵列。 擦除脉冲施加电路通过将阵列中的每个单元的阈值电压电平提升到表示擦除状态的电平,将一次擦除脉冲一次施加到闪存阵列以擦除闪存阵列。 擦除验证电路以逐个字节为基础来验证闪速存储器阵列的擦除。 如果当前正在验证的字节已被擦除; 擦除验证电路将匹配信号带到活动电平。 擦除控制电路基于匹配信号确定是否应该向闪存阵列施加额外的擦除脉冲,并且先前施加到所述闪存阵列的擦除脉冲的数量是程序控制电路以及响应于编程和擦除闪存阵列的方法 到两步命令序列。
    • 8. 发明授权
    • Architecture of circuitry for generating test mode signals
    • 用于产生测试模式信号的电路结构
    • US5339320A
    • 1994-08-16
    • US791772
    • 1991-11-12
    • Mickey L. FandrichJerry A. KreifelsVirgil N. Kynett
    • Mickey L. FandrichJerry A. KreifelsVirgil N. Kynett
    • G01R31/317G01R31/28
    • G01R31/31701
    • An arrangement for generating signals for generating a particular set of test conditions within a digital circuit including a plurality of latches for storing individual bits of data representing individual operations to be accomplished within the digital circuitry, the latches each having input and output terminals; the output terminals of each of the latches being connected to individual portions of the digital circuitry to effect an individual operation thereby; apparatus connected to the input terminals of the latches for setting individual selected ones of the latches to provide selected test conditions; and apparatus for transferring the condition of a selected number of the latches simultaneously to effect a selected test condition.
    • 一种用于产生信号的装置,用于在数字电路内生成特定的一组测试条件,包括多个锁存器,用于存储表示在数字电路内完成的各个操作的各个数据位,每个具有输入和输出端子的锁存器; 每个锁存器的输出端子连接到数字电路的各个部分,从而实现单独的操作; 连接到所述锁存器的输入端子的装置,用于设置所述锁存器中的所选择的一个,以提供所选择的测试条件; 以及用于同时转移选定数量的锁存器的状态以实现所选择的测试条件的装置。