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    • 1. 发明授权
    • Method and apparatus for testing a logic device
    • 用于测试逻辑器件的方法和装置
    • US06615379B1
    • 2003-09-02
    • US09457255
    • 1999-12-08
    • Michael J. TrippJames W. Alexander
    • Michael J. TrippJames W. Alexander
    • G01R3128
    • G01R31/318544G01R31/318502G01R31/318547
    • Method and apparatus provides for testing a device or system with a pattern generator. A series of predetermined test vectors are stored, and, for at least some of the test vectors, an associated predetermined MISR signature. A test vector is applied to a device or system under test and a gold unit in response to a gating signal, the test vector having an associated MISR determined by simulating the expected result vector. In response thereto, the gold unit and the device or system under test each produce a result vector which are compared to detect errors in the performance of the system or device under test. A MISR signature is generated for the result vector from the gold unit. The MISR signature for the result vector is then compared to the MISR associated with the input test vector. If the signatures do not match, further test vectors are prevented from being applied to the device or system under test. If the signatures match, a gating signal is provided so that additional test vectors are applied to the device or system under test.
    • 方法和装置提供了用模式发生器测试装置或系统。 存储一系列预定测试向量,并且对于至少一些测试向量,存在相关联的预定MISR签名。 将测试矢量应用于被测试的设备或系统,并且响应于门控信号应用金单元,测试向量具有通过模拟预期结果向量确定的相关联的MISR。 作为响应,金单元和被测设备或系统都产生与被检测的系统或设备的性能中的错误进行比较的结果向量。 对于金单元的结果向量生成MISR签名。 然后将结果向量的MISR签名与与输入测试向量相关联的MISR进行比较。 如果签名不匹配,则会阻止进一步的测试向量应用于被测设备或系统。 如果签名匹配,则提供门控信号,以便将附加的测试向量应用于被测设备或系统。