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    • 2. 发明授权
    • Analysis system and method for analyzing a sample on an analytical test element
    • 用于分析分析测试元素上的样本的分析系统和方法
    • US07951331B2
    • 2011-05-31
    • US11776379
    • 2007-07-11
    • Bernd RoesickeStefan KalveramFrederic WehowskiMichael Goetz
    • Bernd RoesickeStefan KalveramFrederic WehowskiMichael Goetz
    • G01N21/00G01N15/06G01J1/48G01N35/00G01N27/26
    • G01N21/4738G01N21/01G01N21/8483Y10T436/110833
    • The invention relates to embodiments of an analysis system and to a method for analyzing a sample on an analytical test element, with the analysis system comprising a test element receptacle for receiving and positioning a test element in an analysis position. In an exemplary embodiment, the test element receptacle contains a guide part and a lock part, the guide part having means for guiding a test element into and out of the analysis position, the lock part comprising a frame and a bolt element, which frame and bolt element are connected to one another by a hinge. The bolt element can be pivoted about the hinge between a first position and a second position with respect to the frame. The bolt element comprises a latching lug for engaging in a recess in test element when the bolt element is in the first position and when the test element is positioned in the analysis position.
    • 本发明涉及分析系统的实施例和用于分析分析测试元件上的样本的方法,其中分析系统包括用于在分析位置接收和定位测试元件的测试元件容器。 在示例性实施例中,测试元件插座包括引导部分和锁定部分,引导部分具有用于将测试元件引导到分析位置和从分析位置引出的装置,该锁定部分包括框架和螺栓元件,该框架和 螺栓元件通过铰链彼此连接。 螺栓元件可相对于框架在第一位置和第二位置之间围绕铰链枢转。 螺栓元件包括当螺栓元件处于第一位置时并且当测试元件位于分析位置时用于接合在测试元件中的凹部中的闩锁凸耳。
    • 6. 发明申请
    • ANALYSIS SYSTEM AND METHOD FOR ANALYZING A SAMPLE ON AN ANALYTICAL TEST ELEMENT
    • 分析系统和分析方法对分析测试元素进行分析
    • US20080053201A1
    • 2008-03-06
    • US11776379
    • 2007-07-11
    • Bernd RoesickeStefan KalveramFrederic WehowskiMichael Goetz
    • Bernd RoesickeStefan KalveramFrederic WehowskiMichael Goetz
    • G01N33/48B01J19/00G01N33/00
    • G01N21/4738G01N21/01G01N21/8483Y10T436/110833
    • The invention relates to embodiments of an analysis system and to a method for analyzing a sample on an analytical test element, with the analysis system comprising a test element receptacle for receiving and positioning a test element in an analysis position. In an exemplary embodiment, the test element receptacle contains a guide part and a lock part, the guide part having means for guiding a test element into and out of the analysis position, the lock part comprising a frame and a bolt element, which frame and bolt element are connected to one another by a hinge. The bolt element can be pivoted about the hinge between a first position and a second position with respect to the frame. The bolt element comprises a latching lug for engaging in a recess in test element when the bolt element is in the first position and when the test element is positioned in the analysis position.
    • 本发明涉及分析系统的实施例和用于分析分析测试元件上的样本的方法,其中分析系统包括用于在分析位置接收和定位测试元件的测试元件容器。 在示例性实施例中,测试元件插座包括引导部分和锁定部分,引导部分具有用于将测试元件引导到分析位置和从分析位置引出的装置,该锁定部分包括框架和螺栓元件,该框架和 螺栓元件通过铰链彼此连接。 螺栓元件可相对于框架在第一位置和第二位置之间围绕铰链枢转。 螺栓元件包括当螺栓元件处于第一位置时并且当测试元件位于分析位置时用于接合在测试元件中的凹部中的闩锁凸耳。